BS EN 62132-3:2007

1 Scope and object
2 Normative references
3 Terms and definitions
4 General
5 Test conditions
   5.1 General
   5.2 Test equipment
   5.3 Test board
6 Test procedure
   6.1 Hazardous electromagnetic fields
   6.2 Calibration of forward power limitation
   6.3 BCI test
   6.4 BCI test set-up characterization procedure
7 Test report
Annex A (informative) Examples for test levels and frequency
                      step selection
Annex B (informative) Example of BCI test board and set-up
Annex C (informative) Example of RF test board and set-up
Annex ZA (normative) Normative references to international
                      publications with their corresponding
                      European publications
Bibliography

Explains a bulk current injection (BCI) test method to measure the immunity of integrated circuits (IC) in the presence of conducted RF disturbances, e.g. resulting from radiated RF disturbances.

This part of IEC 62132 describes a bulk current injection (BCI) test method to measure the immunity of integrated circuits (IC) in the presence of conducted RF disturbances, e.g. resulting from radiated RF disturbances. This method only applies to ICs that have off-board wire connections e.g. into a cable harness. This test method is used to inject RF current on one or a combination of wires. This standard establishes a common base for the evaluation of semiconductor devices to be applied in equipment used in environments that are subject to unwanted radio frequency electromagnetic signals.