• DIN EN 62132-3:2008-04

    Current The latest, up-to-date edition.

    INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC IMMUNITY, 150 KHZ TO 1 GHZ - PART 3: BULK CURRENT INJECTION (BCI) METHOD

    Available format(s):  Hardcopy, PDF

    Language(s):  German

    Published date:  01-01-2008

    Publisher:  German Institute for Standardisation (Deutsches Institut für Normung)

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    Table of Contents - (Show below) - (Hide below)

    1 Scope and object
    2 Normative references
    3 Terms and definitions
    4 General
    5 Test conditions
       5.1 General
       5.2 Test equipment
       5.3 Test board
    6 Test procedure
       6.1 Hazardous electromagnetic fields
       6.2 Calibration of forward power limitation
       6.3 BCI test
       6.4 BCI test set-up characterization procedure
    7 Test report
    Annex A (informative) Examples for test levels and frequency
                          step selection
    Annex B (informative) Example of BCI test board and set-up
    Annex C (informative) Example of RF test board and set-up
    Annex ZA (normative) Normative references to international
                          publications with their corresponding
                          European publications
    Bibliography

    Abstract - (Show below) - (Hide below)

    Explains a bulk current injection (BCI) test method to measure the immunity of integrated circuits (IC) in the presence of conducted RF disturbances, e.g. resulting from radiated RF disturbances.

    General Product Information - (Show below) - (Hide below)

    Development Note Supersedes DIN IEC 62132-3. (04/2008)
    Document Type Standard
    Publisher German Institute for Standardisation (Deutsches Institut für Normung)
    Status Current
    Supersedes
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