BS EN 62429:2008
Current
The latest, up-to-date edition.
Reliability growth. Stress testing for early failures in unique complex systems
Hardcopy , PDF
English
31-10-2009
FOREWORD
1 Scope
2 Normative references
3 Terms and definitions, abbreviations and symbols
4 General
5 Planning and performing a reliability growth test
Annex A (informative) - Practical example of method
3 - Success ratio test
Annex B (informative) - Practical example of method
5 - Comparison with acceptable
instantaneous failure intensity
Annex C (informative) - Practical example of method
6 - Estimation of remaining latent
faults
Bibliography
Annex ZA (normative) - Normative references to international
publications with their corresponding
European publications
Provides guidance for reliability growth during final testing or acceptance testing of unique complex systems.
Committee |
DS/1
|
DevelopmentNote |
Supersedes 06/30148603 DC. (07/2008)
|
DocumentType |
Standard
|
Pages |
40
|
PublisherName |
British Standards Institution
|
Status |
Current
|
Supersedes |
This International Standard gives guidance for reliability growth during final testing or acceptance testing of unique complex systems. It gives guidance on accelerated test conditions and criteria for stopping these tests. “Unique” means that no information exists on similar systems, and the small number of produced systems means that information deducted from the test has limited use for future production.
This standard concerns reliability growth of repairable complex systems consisting of hardware with embedded software. It can be used for describing the procedure for acceptance testing, \'running-in\', and to ensure that reliability of a delivered system is not compromised by coding errors, workmanship errors or manufacturing errors. It only covers the early failure period of the system life cycle and neither the constant failure period, nor the wear out failure period. It can also be used when a company wants to optimize the duration of internal production testing during manufacturing of prototypes, single systems or small series.
It is applicable mainly to large hardware/software systems, but does not cover large networks, for example telecommunications and power networks, since new parts of such systems cannot usually be isolated during the testing.
It does not cover software tested alone, but the methods can be used during testing of large embedded software programs in operational hardware, when simulated operating loads are used.
It addresses growth testing before or at delivery of a finished system. The testing can therefore take place at the manufacturer\'s or at the end user\'s premises.
If the user of a system performs reliability growth by a policy of updating hardware and software with improved versions, this standard can be used to guide the growth process.
This standard covers a wide field of applications, but is not applicable to health or safety aspects of systems.
This standard does not apply to systems that are covered by IEC 62279[39].
Standards | Relationship |
IEC 62429:2007 | Identical |
EN 62429:2008 | Identical |
IEC 61025:2006 | Fault tree analysis (FTA) |
IEC 62279:2015 | Railway applications - Communication, signalling and processing systems - Software for railway control and protection systems |
IEC 60605-4:2001 | Equipment reliability testing - Part 4: Statistical procedures for exponential distribution - Point estimates, confidence intervals, prediction intervals and tolerance intervals |
IEC 60812:2006 | Analysis techniques for system reliability - Procedure for failure mode and effects analysis (FMEA) |
IEC 61014:2003 | Programmes for reliability growth |
IEC 61160:2005 | Design review |
IEC 61078:2016 | Reliability block diagrams |
MIL-HDBK-2164 Revision A:1996 | ENVIRONMENTAL STRESS SCREENING PROCESS FOR ELECTRONIC EQUIPMENT |
EN 61163-1 : 2006 | RELIABILITY STRESS SCREENING - PART 1: REPAIRABLE ASSEMBLIES MANUFACTURED IN LOTS |
MIL-HDBK-344 Revision A:1993 | ENVIRONMENTAL STRESS SCREENING (ESS) OF ELECTRONIC EQUIPMENT |
IEC 61163-1:2006 | Reliability stress screening - Part 1: Repairable assemblies manufactured in lots |
AIAA R 013 : 1992 | RECOMMENDED PRACTICE FOR SOFTWARE RELIABILITY |
IEC 61163-2:1998 | Reliability stress screening - Part 2: Electronic components |
BS 5760-8:1998 | Reliability of systems, equipment and components Guide to assessment of reliability of systems containing software |
IEC 60300-3-1:2003 | Dependability management - Part 3-1: Application guide - Analysis techniques for dependability - Guide on methodology |
IEC 61164:2004 | Reliability growth - Statistical test and estimation methods |
IEC 60300-1:2014 | Dependability management - Part 1: Guidance for management and application |
IEC 60605-2:1994 | Equipment reliability testing - Part 2: Design of test cycles |
IEC 60300-2:2004 | Dependability management - Part 2: Guidelines for dependability management |
ISO 9000:2015 | Quality management systems — Fundamentals and vocabulary |
IEC 60706-5:2007 | Maintainability of equipment - Part 5: Testability and diagnostic testing |
IEC 60300-3-15:2009 | Dependability management - Part 3-15: Application guide - Engineering of system dependability |
EN 61164:2004 | Reliability growth - Statistical test and estimation methods |
IEC 61710:2013 | Power law model - Goodness-of-fit tests and estimation methods |
IEC 60300-3-5:2001 | Dependability management - Part 3-5: Application guide - Reliability test conditions and statistical test principles |
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