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BS EN 62429:2008

Current

Current

The latest, up-to-date edition.

Reliability growth. Stress testing for early failures in unique complex systems

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

31-10-2009

€271.12
Excluding VAT

FOREWORD
1 Scope
2 Normative references
3 Terms and definitions, abbreviations and symbols
4 General
5 Planning and performing a reliability growth test
Annex A (informative) - Practical example of method
                        3 - Success ratio test
Annex B (informative) - Practical example of method
                        5 - Comparison with acceptable
                        instantaneous failure intensity
Annex C (informative) - Practical example of method
                        6 - Estimation of remaining latent
                        faults
Bibliography
Annex ZA (normative) - Normative references to international
                       publications with their corresponding
                       European publications

Provides guidance for reliability growth during final testing or acceptance testing of unique complex systems.

Committee
DS/1
DevelopmentNote
Supersedes 06/30148603 DC. (07/2008)
DocumentType
Standard
Pages
40
PublisherName
British Standards Institution
Status
Current
Supersedes

This International Standard gives guidance for reliability growth during final testing or acceptance testing of unique complex systems. It gives guidance on accelerated test conditions and criteria for stopping these tests. “Unique?? means that no information exists on similar systems, and the small number of produced systems means that information deducted from the test has limited use for future production.

This standard concerns reliability growth of repairable complex systems consisting of hardware with embedded software. It can be used for describing the procedure for acceptance testing, \'running-in\', and to ensure that reliability of a delivered system is not compromised by coding errors, workmanship errors or manufacturing errors. It only covers the early failure period of the system life cycle and neither the constant failure period, nor the wear out failure period. It can also be used when a company wants to optimize the duration of internal production testing during manufacturing of prototypes, single systems or small series.

It is applicable mainly to large hardware/software systems, but does not cover large networks, for example telecommunications and power networks, since new parts of such systems cannot usually be isolated during the testing.

It does not cover software tested alone, but the methods can be used during testing of large embedded software programs in operational hardware, when simulated operating loads are used.

It addresses growth testing before or at delivery of a finished system. The testing can therefore take place at the manufacturer\'s or at the end user\'s premises.

If the user of a system performs reliability growth by a policy of updating hardware and software with improved versions, this standard can be used to guide the growth process.

This standard covers a wide field of applications, but is not applicable to health or safety aspects of systems.

This standard does not apply to systems that are covered by IEC 62279[39].

Standards Relationship
IEC 62429:2007 Identical
EN 62429:2008 Identical

IEC 61025:2006 Fault tree analysis (FTA)
IEC 62279:2015 Railway applications - Communication, signalling and processing systems - Software for railway control and protection systems
IEC 60605-4:2001 Equipment reliability testing - Part 4: Statistical procedures for exponential distribution - Point estimates, confidence intervals, prediction intervals and tolerance intervals
IEC 60812:2006 Analysis techniques for system reliability - Procedure for failure mode and effects analysis (FMEA)
IEC 61014:2003 Programmes for reliability growth
IEC 61160:2005 Design review
IEC 61078:2016 Reliability block diagrams
MIL-HDBK-2164 Revision A:1996 ENVIRONMENTAL STRESS SCREENING PROCESS FOR ELECTRONIC EQUIPMENT
EN 61163-1 : 2006 RELIABILITY STRESS SCREENING - PART 1: REPAIRABLE ASSEMBLIES MANUFACTURED IN LOTS
MIL-HDBK-344 Revision A:1993 ENVIRONMENTAL STRESS SCREENING (ESS) OF ELECTRONIC EQUIPMENT
IEC 61163-1:2006 Reliability stress screening - Part 1: Repairable assemblies manufactured in lots
AIAA R 013 : 1992 RECOMMENDED PRACTICE FOR SOFTWARE RELIABILITY
IEC 61163-2:1998 Reliability stress screening - Part 2: Electronic components
BS 5760-8:1998 Reliability of systems, equipment and components Guide to assessment of reliability of systems containing software
IEC 60300-3-1:2003 Dependability management - Part 3-1: Application guide - Analysis techniques for dependability - Guide on methodology
IEC 61164:2004 Reliability growth - Statistical test and estimation methods
IEC 60300-1:2014 Dependability management - Part 1: Guidance for management and application
IEC 60605-2:1994 Equipment reliability testing - Part 2: Design of test cycles
IEC 60300-2:2004 Dependability management - Part 2: Guidelines for dependability management
ISO 9000:2015 Quality management systems — Fundamentals and vocabulary
IEC 60706-5:2007 Maintainability of equipment - Part 5: Testability and diagnostic testing
IEC 60300-3-15:2009 Dependability management - Part 3-15: Application guide - Engineering of system dependability
EN 61164:2004 Reliability growth - Statistical test and estimation methods
IEC 61710:2013 Power law model - Goodness-of-fit tests and estimation methods
IEC 60300-3-5:2001 Dependability management - Part 3-5: Application guide - Reliability test conditions and statistical test principles

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