BS EN 62433-3:2017
Current
The latest, up-to-date edition.
EMC IC modelling Models of integrated Circuits for EMI behavioural simulation. Radiated emissions modelling (ICEM-RE)
Hardcopy , PDF
English
13-12-2017
Committee |
EPL/47
|
DocumentType |
Standard
|
Pages |
94
|
PublisherName |
British Standards Institution
|
Status |
Current
|
IEC62433-3:2017 provides a method for deriving a macro-model to allow the simulation of the radiated emission levels of an Integrated Circuit (IC). This model is commonly called Integrated Circuit Emission Model - Radiated Emission, ICEM-RE. The model is intended to be used for modelling a complete IC, with or without its associated package, a functional block and an Intellectual Property (IP) block of both analogue and digital ICs (input/output pins, digital core and supply), when measured or simulated data cannot be directly imported into simulation tools.
Standards | Relationship |
EN 62433-3:2017 | Identical |
IEC 62433-3:2017 | Identical |
IEC 61967-1:2002 | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions |
IEC TS 61967-3:2014 | Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method |
IEC 62433-2:2017 | EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE) |
EN 61967-1:2002 | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions |
ISO 8879:1986 | Information processing Text and office systems Standard Generalized Markup Language (SGML) |
IEC TS 62433-1:2011 | EMC IC modelling - Part 1: General modelling framework |
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