Skip to content
Please enter a keyword to search

  • EN 61967-1:2002

    View superseded by
    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
    View superseded by

    Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions

    Available format(s): 

    Superseded date:  09-02-2022

    Language(s): 

    Published date:  05-06-2002

    Publisher:  European Committee for Standards - Electrical

    Pure ENs are not available for sale, please purchase a suitable national adoption

    Sorry this product is not available in your region.

    Add To Cart

    Table of Contents - (Show below) - (Hide below)

    1 Scope
    2 Normative references
    3 Definitions
    4 Test conditions
      4.1 General
      4.2 Ambient conditions
          4.2.1 Ambient temperature
          4.2.2 Ambient RF field strength
          4.2.3 Other ambient conditions
          4.2.4 IC stability over time
    5 Test equipment
      5.1 General
      5.2 Shielding
      5.3 RF measuring instrument
          5.3.1 Measuring receiver
          5.3.2 Spectrum analyser
          5.3.3 Other RBW for narrowband disturbances
          5.3.4 Disturbance type, detector type and sweep speed
          5.3.5 Video bandwidth
          5.3.6 Verification of calibration for the RF measuring
                instrument
      5.4 Frequency range
      5.5 Pre-amplifier or attenuator
      5.6 System gain
      5.7 Other components
    6 Test set-up
      6.1 General
      6.2 Test circuit board
      6.3 IC pin loading
      6.4 Power supply requirements - Test board power supply
      6.5 IC specific considerations
          6.5.1 IC supply voltage
          6.5.2 IC decoupling
          6.5.3 Activity of IC
          6.5.4 Guidelines regarding IC operation
    7 Test procedure
      7.1 Ambient check
      7.2 Operational check
      7.3 Specific procedures
    8 Test report
      8.1 General
      8.2 Ambient
      8.3 Description of device
      8.4 Description of set-up
      8.5 Description of software
      8.6 Data presentation
          8.6.1 Graphical presentation
          8.6.2 Software for data capture
          8.6.3 Data processing
      8.7 RF emission limits
      8.8 Interpretation of results
          8.8.1 Comparison between IC(s) using the same test
                method
          8.8.2 Comparison between different test methods
          8.8.3 Correlation to module test methods
    9 General basic test board specification
      9.1 Board description - mechanical
      9.2 Board description - electrical characteristics
      9.3 Ground planes
      9.4 Pins
          9.4.1 DIL packages
          9.4.2 SOP, PLCC, QFP packages
          9.4.3 PGA, BGA packages
      9.5 Via type
      9.6 Via distance
      9.7 Additional components
          9.7.1 Supply decoupling
          9.7.2 I/O load
    Annex A (informative) Test method comparison
    Annex B (informative) Flow chart of an example counter
                           test code
    Annex C (informative) Prescription of a worst-case application
                           software description
    Annex ZA (normative) Normative references to international
                           publications with their corresponding
                           European publications
    Bibliography
    Figures
    Tables

    Abstract - (Show below) - (Hide below)

    Provides general information and definitions on measurement of conducted and radiated electromagnetic disturbances from integrated circuits. Also provides a description of measurement conditions, test equipment and set-up as well as the test procedures and content of the test reports. A test method comparison table is included to assist in selecting the appropriate measurement method(s). Measurement of the voltage and current of conducted RF emissions or radiated RF disturbances, coming from an integrated circuit under controlled conditions, yields information about the potential for RF disturbances in an application of the integrated circuit.

    General Product Information - (Show below) - (Hide below)

    Committee CLC/SR 47A
    Document Type Standard
    Publisher European Committee for Standards - Electrical
    Status Superseded
    Superseded By

    Standards Referenced By This Book - (Show below) - (Hide below)

    I.S. EN 61967-4:2002 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 4: MEASUREMENT OF CONDUCTED EMISSIONS - 1 OHM/150 OHM DIRECT COUPLING METHOD
    BS EN 62228-2:2017 (published 2017-02) Integrated circuits. EMC evaluation of transceivers LIN transceivers
    EN 61967-2:2005 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method
    EN 62433-3:2017 EMC IC modelling - Part 3: Models of Integrated Circuits for EMI behavioural simulation - Radiated emissions modelling (ICEM-RE)
    BS EN 61967-8:2011 Integrated circuits. Measurement of electromagnetic emissions Measurement of radiated emissions. IC stripline method
    BS EN 61967-4 : 2002 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 4: MEASUREMENT OF CONDUCTED EMISSIONS - 1 OHM/150 OHM DIRECT COUPLING METHOD
    CEI EN 62228-2 : 1ED 2017 INTEGRATED CIRCUITS - EMC EVALUATION OF TRANSCEIVERS - PART 2: LIN TRANSCEIVERS
    CEI EN 62433-3 : 1ED 2017 EMC IC MODELLING - PART 3: MODELS OF INTEGRATED CIRCUITS FOR EMI BEHAVIOURAL SIMULATION - RADIATED EMISSIONS MODELLING (ICEMRE)
    BS EN 61967-6 : 2002 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 6: MEASUREMENT OF CONDUCTED EMISSIONS - MAGNETIC PROBE METHOD
    I.S. EN 61967-8:2011 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS - PART 8: MEASUREMENT OF RADIATED EMISSIONS - IC STRIPLINE METHOD (IEC 61967-8:2011 (EQV))
    I.S. EN 62228-2:2017 INTEGRATED CIRCUITS - EMC EVALUATION OF TRANSCEIVERS - PART 2: LIN TRANSCEIVERS
    CEI EN 61967-4 : 2009 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 4: MEASUREMENT OF CONDUCTED EMISSIONS - 1 OHM/150 OHM DIRECT COUPLING METHOD
    CEI EN 61967-8 : 2012 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS - PART 8: MEASUREMENT OF RADIATED EMISSIONS - IC STRIPLINE METHOD
    BS EN 61967-2:2005 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 2: MEASUREMENT OF RADIATED EMISSIONS - TEM CELL AND WIDEBAND TEM CELL METHOD
    BS EN 62132-1:2016 (published 2016-03) Integrated circuits. Measurement of electromagnetic immunity General conditions and definitions
    I.S. EN 61967-5:2003 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 5: MEASUREMENT OF CONDUCTED EMISSIONS - WORKBENCH FARADAY CAGE METHOD
    I.S. EN 62433-3:2017 EMC IC MODELLING - PART 3: MODELS OF INTEGRATED CIRCUITS FOR EMI BEHAVIOURAL SIMULATION - RADIATED EMISSIONS MODELLING (ICEM-RE)
    BS EN 62433-3:2017 EMC IC modelling Models of integrated Circuits for EMI behavioural simulation. Radiated emissions modelling (ICEM-RE)
    EN 61967-6:2002/A1:2008 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 6: MEASUREMENT OF CONDUCTED EMISSIONS - MAGNETIC PROBE METHOD
    EN 61967-8 : 2011 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS - PART 8: MEASUREMENT OF RADIATED EMISSIONS - IC STRIPLINE METHOD
    I.S. EN 61967-6:2003 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 6: MEASUREMENT OF CONDUCTED EMISSIONS - MAGNETIC PROBE METHOD
    I.S. EN 61967-2:2005 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 2: MEASUREMENT OF RADIATED EMISSIONS - TEM CELL AND WIDEBAND TEM CELL METHOD
    EN 61967-4 : 2002 COR 2017 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 4: MEASUREMENT OF CONDUCTED EMISSIONS - 1 OHM/150 OHM DIRECT COUPLING METHOD (IEC 61967-4:2002/COR1:2017)
    EN 62132-1:2016 Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
    EN 62228-2:2017 Integrated circuits - EMC evaluation of transceivers - Part 2: LIN transceivers

    Standards Referencing This Book - (Show below) - (Hide below)

    CISPR 25:2016 Vehicles, boats and internal combustion engines - Radio disturbance characteristics - Limits and methods of measurement for the protection of on-board receivers
    IEEE C63.2-2009 SPECIFICATIONS OF ELECTROMAGNETIC INTERFERENCE AND FIELD STRENGTH MEASURING INSTRUMENTATION IN THE FREQUENCY RANGE 9 KHZ TO 40 GHZ
    CISPR 16-1:1999+AMD1:2002 CSV Specification for radio disturbance and immunity measuring apparatus and methods - Part 1: Radio disturbance and immunity measuring apparatus
    View more information

    • Access your standards online with a subscription

      Features

      • Simple online access to standards, technical information and regulations
      • Critical updates of standards and customisable alerts and notifications
      • Multi - user online standards collection: secure, flexibile and cost effective