• EN 62433-4:2016

    Current The latest, up-to-date edition.

    EMC IC modelling - Part 4: Models of integrated circuits for RF immunity behavioural simulation - Conducted immunity modelling (ICIM-CI)

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    Published date:  21-10-2016

    Publisher:  European Committee for Standards - Electrical

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    1 Scope
    2 Normative references
    3 Terms, definitions, abbreviations and conventions
    4 Philosophy
    5 ICIM-CI model description
    6 CIML format
    7 Extraction
    8 Validation of ICIM-CI hypotheses
    9 Model usage
    Annex A (normative) - Preliminary definitions for
            XML representation
    Annex B (informative) - ICIM-CI example with
            disturbance load
    Annex C (informative) - Conversions between
            parameter types
    Annex D (informative) - Example of ICIM-CI
            macro-model in CIML format
    Annex E (normative) - CIML Valid keywords and usage
    Annex F (informative) - PDN impedance measurement
            methods using vector network analyzer
    Annex G (informative) - RFIP measurement method
            description
    Annex H (informative) - Immunity simulation with
            ICIM model based on pass/fail test
    Annex I (informative) - Immunity simulation with
            ICIM model based on non pass/fail test
    Bibliography
    Annex ZA (normative) - Normative references
            to international publications with their
            corresponding European publications

    Abstract - (Show below) - (Hide below)

    IEC 62433-4:2016 specifies a flow for deriving a macro-model to allow the simulation of the conducted immunity levels of an integrated circuit (IC). This model is commonly called Integrated Circuit Immunity Model - Conducted Immunity, ICIM-CI. It is intended to be used for predicting the levels of immunity to conducted RF disturbances applied on IC pins. In order to evaluate the immunity threshold of an electronic device, this macro-model will be inserted in an electrical circuit simulation tool. This macro-model can be used to model both analogue and digital ICs (input/output, digital core and supply). This macro-model does not take into account the non-linear effects of the IC. The added value of ICIM-CI is that it could also be used for immunity prediction at board and system level through simulations. This part of IEC 62433 has two main parts:- the electrical description of ICIM-CI macro-model elements;- a universal data exchange format called CIML based on XML. This format allows ICIM-CI to be encoded in a more useable and generic form for immunity simulation.

    General Product Information - (Show below) - (Hide below)

    Committee CLC/SR 47A
    Document Type Standard
    Publisher European Committee for Standards - Electrical
    Status Current

    Standards Referencing This Book - (Show below) - (Hide below)

    EN 62132-4:2006 Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method
    IEC 62132-4:2006 Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method
    EN 62132-1:2016 Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
    IEC 62433-2:2017 EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)
    EN 62433-2:2017 EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)
    IEC 62132-1:2015 Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
    ISO 8879:1986 Information processing Text and office systems Standard Generalized Markup Language (SGML)
    ISO/IEC 646:1991 Information technology ISO 7-bit coded character set for information interchange
    CISPR 17:2011 Methods of measurement of the suppression characteristics of passive EMC filtering devices
    EN 55017 : 2011 METHODS OF MEASUREMENT OF THE SUPPRESSION CHARACTERISTICS OF PASSIVE EMC FILTERING DEVICES (CISPR 17:2011)
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