BS EN ISO 12179:2001
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
Geometrical product specifications (GPS). Surface texture. Profile method. Calibration of contact (stylus) instruments
Hardcopy , PDF
18-05-2022
English
30-06-2009
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Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Conditions of use
5 Measurement standards
6 Contact (stylus) instrument metrological characteristics
7 Calibration
8 Uncertainty of measurement
9 Contact (stylus) instrument calibration certificate
Annex A (normative) - Calibration of instruments measuring
the motifs method parameters
Annex B (normative) - Calibration of simplified operator
instruments for the measurements of surface
texture
Annex C (informative) - Example: roughness measurement
standard parameter Ra
Annex D (informative) - Relation to the GPS matrix model
Bibliography
Annex ZA (normative) - Normative references to international
publications with their relevant European
publications
Pertains to the calibration of the metrological characteristics of contact (stylus) instruments for the measurement of surface texture by the profile method as defined in ISO 3274.
| Committee |
TPR/1
|
| DevelopmentNote |
Supersedes 96/712059 DC (09/2001)
|
| DocumentType |
Standard
|
| Pages |
30
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| ISO 12179:2000/Cor 1:2003 | Identical |
| ONORM EN ISO 12179 : 2009 | Identical |
| UNI EN ISO 12179 : 2001 | Identical |
| NF EN ISO 12179 : 2000 | Identical |
| I.S. EN ISO 12179:2000 | Identical |
| UNE-EN ISO 12179:2001 | Identical |
| NEN EN ISO 12179 : 2000 C1 2008 | Identical |
| NBN EN ISO 12179 : 2000 COR 2008 | Identical |
| ISO 12179:2000 | Identical |
| NS EN ISO 12179 : 2000 AC 2008 | Identical |
| SN EN ISO 12179 : 2000 CORR 2009 | Identical |
| EN ISO 12179:2000/AC:2008 | Identical |
| DIN EN ISO 12179 : 2009-09 | Identical |
| DIN EN ISO 12179:2000-11 | Identical |
| 10/30213632 DC : 0 | BS 1134 - ASSESSMENT OF SURFACE TEXTURE - GUIDANCE AND GENERAL INFORMATION |
| BS 1134:2010 | Assessment of surface texture. Guidance and general information |
| ISO/TR 14638:1995 | Geometrical product specification (GPS) Masterplan |
| ISO 4287:1997 | Geometrical Product Specifications (GPS) — Surface texture: Profile method — Terms, definitions and surface texture parameters |
| ISO/TS 14253-2:1999 | Geometrical Product Specifications (GPS) Inspection by measurement of workpieces and measuring equipment Part 2: Guide to the estimation of uncertainty in GPS measurement, in calibration of measuring equipment and in product verification |
| ISO/IEC Guide 98:1993 | Guide to the expression of uncertainty in measurement (GUM) |
| ISO 14253-1:2017 | Geometrical product specifications (GPS) — Inspection by measurement of workpieces and measuring equipment — Part 1: Decision rules for verifying conformity or nonconformity with specifications |
| EN 30012-1 : 1993 | QUALITY ASSURANCE REQUIREMENTS FOR MEASURING EQUIPMENT - METROLOGICAL CONFIRMATION SYSTEM FOR MEASURING EQUIPMENT |
| ISO Guide 35:2017 | Reference materials — Guidance for characterization and assessment of homogeneity and stability |
| ISO/IEC Guide 99:2007 | International vocabulary of metrology Basic and general concepts and associated terms (VIM) |
| ISO 3274:1996 | Geometrical Product Specifications (GPS) — Surface texture: Profile method — Nominal characteristics of contact (stylus) instruments |
| ISO 5436-1:2000 | Geometrical Product Specifications (GPS) — Surface texture: Profile method; Measurement standards — Part 1: Material measures |
| ISO 10012-1:1992 | Quality assurance requirements for measuring equipment Part 1: Metrological confirmation system for measuring equipment |
| EN ISO 3274:1997 | Geometrical product specifications (GPS) - Surface texture: Profile method - Nominal characteristics of contact (stylus) instruments (ISO 3274:1996) |
| EN ISO 5436-1:2000 | Geometrical Product Specifications (GPS) - Surface texture: Profile method; Measurement standards - Part 1: Material measures (ISO 5436-1:2000) |
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