• BS IEC 60747-14.3 : 2009

    Current The latest, up-to-date edition.

    SEMICONDUCTOR DEVICES - PART 14-3: SEMICONDUCTOR SENSORS - PRESSURE SENSORS

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date:  01-01-2009

    Publisher:  British Standards Institution

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    INTRODUCTION
    1 Scope
    2 Normative references
    3 Terminology and letter symbols
      3.1 General terms
      3.2 Definitions
      3.3 Letter symbols
    4 Essential ratings and characteristics
      4.1 General
      4.2 Ratings (limiting values)
      4.3 Characteristics
    5 Measuring methods
      5.1 General
      5.2 Output voltage measurements
      5.3 Sensitivity (S)
      5.4 Temperature coefficient of sensitivity (alpha[S])
      5.5 Temperature coefficient of full-scale span (alphaV[FSS])
          and maximum temperature deviation of full-scale span
          (deltaV[FSS])
      5.6 Temperature coefficient of offset voltage (alphaV[OS])
          and (deltaV[OS])
      5.7 Pressure hysteresis of output voltage (H[ohp])
      5.8 Temperature hysteresis of output voltage (H[ohT])
    Figure 1 - Basic circuit for measurement of output voltage

    Abstract - (Show below) - (Hide below)

    Provides requirements for semiconductor pressure sensors measuring absolute, gauge, or differential pressures.

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    Committee EPL/47
    Development Note Supersedes 99/204500 DC. (10/2001) Supersedes 08/30181404 DC. (07/2009)
    Document Type Standard
    Publisher British Standards Institution
    Status Current
    Supersedes

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60747-14-1:2010 Semiconductor devices - Part 14-1: Semiconductor sensors - Generic specification for sensors
    IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General
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