• IEC 60747-14-3:2009

    Current The latest, up-to-date edition.

    Semiconductor devices - Part 14-3: Semiconductor sensors - Pressure sensors

    Available format(s):  Hardcopy, PDF, PDF 3 Users, PDF 5 Users, PDF 9 Users

    Language(s):  English - French

    Published date:  29-04-2009

    Publisher:  International Electrotechnical Committee

    Add To Cart

    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    INTRODUCTION
    1 Scope
    2 Normative references
    3 Terminology and letter symbols
      3.1 General terms
          3.1.1 Semiconductor pressure sensors
          3.1.2 Sensing methods
      3.2 Definitions
      3.3 Letter symbols
          3.3.1 General
          3.3.2 List of letter symbols
    4 Essential ratings and characteristics
      4.1 General
          4.1.1 Sensor materials - for piezoelectrical sensors
          4.1.2 Handling precautions
          4.1.3 Types
      4.2 Ratings (limiting values)
          4.2.1 Pressures
          4.2.2 Temperatures
          4.2.3 Voltage
      4.3 Characteristics
          4.3.1 Full-scale span (V[FSS])
          4.3.2 Full-scale output (V[FSO])
          4.3.3 Sensitivity (S)
          4.3.4 Temperature coefficient of full-scale sensitivity
           (alpha[s])
          4.3.5 Offset voltage (V[os])
          4.3.6 Temperature coefficient of offset voltage
                (alpha[vos])
          4.3.7 Pressure hysteresis of output voltage (H[ohp])
          4.3.8 Temperature hysteresis of output voltage (H[ohT])
          4.3.9 Response time
          4.3.10 Warm-up
          4.3.11 Dimensions
          4.3.12 Mechanical characteristics
    5 Measuring methods
      5.1 General
          5.1.1 General precautions
          5.1.2 Measuring conditions
      5.2 Output voltage measurements
          5.2.1 Purpose
          5.2.2 Principles of measurement
      5.3 Sensitivity (S)
          5.3.1 Purpose
          5.3.2 Measuring procedure
          5.3.3 Specified conditions
      5.4 Temperature coefficient of sensitivity (alpha[s])
          5.4.1 Purpose
          5.4.2 Specified conditions
      5.5 Temperature coefficient of full-scale span
          (alpha V[FSS]) and maximum temperature deviation
          of full-scale span (delta V[FSS])
          5.5.1 Purpose
          5.5.2 Specified conditions
      5.6 Temperature coefficient of offset voltage
          (alpha V[os]) and (alpha V[os])
          5.6.1 Purpose
          5.6.2 Specified conditions
      5.7 Pressure hysteresis of output voltage (H[ohp])
          5.7.1 Purpose
          5.7.2 Circuit diagram and circuit description
          5.7.3 Specified conditions
      5.8 Temperature hysteresis of output voltage (H[ohT])
          5.8.1 Purpose
          5.8.2 Measuring procedure
          5.8.3 Specified conditions
      5.9 Linearity
          5.9.1 Purpose
          5.9.2 Specified conditions
          5.9.3 Measuring procedure

    Abstract - (Show below) - (Hide below)

    IEC 60747-14-3:2009 specifies requirements for semiconductor pressure sensors measuring absolute, gauge or differential pressures. The major technical change with regard to the previous edition is the addition of a new subclause 5.9 (measuring method of linearity).

    This publication should be read in conjunction with IEC 60747-1:2006.

    General Product Information - (Show below) - (Hide below)

    Committee TC 47/SC 47E
    Development Note To be read in conjunction with IEC 60747-1. (04/2009) Stability Date: 2017. (09/2017)
    Document Type Standard
    Publisher International Electrotechnical Committee
    Status Current
    Supersedes

    Standards Referenced By This Book - (Show below) - (Hide below)

    17/30355772 DC : 0 BS EN 62047-33 ED.1.0 - SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 33: MEMS PIEZORESISTIVE PRESSURE-SENSITIVE DEVICE
    17/30355776 DC : 0 BS EN 62047-34 ED.1.0 - SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 34: TEST METHOD FOR MEMS PIEZORESISTIVE PRESSURE-SENSITIVE DEVICE ON WAFER
    BS ISO 19614:2017 Traditional Chinese medicine. Pulse graph force transducer
    16/30301330 DC : 0 BS ISO 19614 - TRADITIONAL CHINESE MEDICINE - PULSE GRAPH FORCE TRANSDUCER
    ISO 19614:2017 Traditional Chinese medicine — Pulse graph force transducer

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60747-14-1:2010 Semiconductor devices - Part 14-1: Semiconductor sensors - Generic specification for sensors
    IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General
    • Access your standards online with a subscription

      Features

      • Simple online access to standards, technical information and regulations
      • Critical updates of standards and customisable alerts and notifications
      • Multi - user online standards collection: secure, flexibile and cost effective