BS IEC 60747-5.2 : 97 AMD 13433
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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DISCRETE SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS - OPTOELECTRONIC DEVICES - ESSENTIAL RATINGS AND CHARACTERISTICS
08-01-2002
23-11-2012
FOREWORD
1 Scope
2 Normative references
3 Light-emitting diodes (excluding devices for fibre
optic systems or subsystems)
3.1 Type
3.2 Semiconductor material
3.3 Colour
3.4 Details of outline and encapsulation
3.5 Limiting values (absolute maximum system)
3.6 Electrical characteristics
3.7 Supplementary information
4 Infrared-emitting diodes (excluding devices for fibre
optic systems or subsystems)
4.1 Type
4.2 Semiconductor material
4.3 Details of outline and encapsulation
4.4 Limiting values (absolute maximum system)
4.5 Electrical characteristics
4.6 Supplementary information
5 Photodiodes (excluding devices for fibre optic systems or
subsystems)
5.1 Type
5.2 Semiconductor material
5.3 Details of outline and encapsulation
5.4 Limiting values (absolute maximum system)
5.5 Electrical characteristics
5.6 Supplementary information
6 Phototransistors (excluding devices for fibre optic
systems or subsystems)
6.1 Type
6.2 Semiconductor material
6.3 Polarity
6.4 Details of outline and encapsulation
6.5 Limiting values (absolute maximum system)
6.6 Electrical characteristics
6.7 Supplementary information
7 Photocouplers, optocouplers (with output transistor)
7.1 Type
7.2 Semiconductor material
7.3 Polarity of the output resistor
7.4 Details of outline and encapsulation
7.5 Limiting values (absolute maximum system)
7.6 Electrical characteristics
7.7 Supplementary information
8 Photocouplers (optocouplers) providing protection
against electrical shock
8.1 Type
8.2 Semiconductor material
8.3 Details of outline and encapsulation
8.4 Ratings
8.5 Electrical characteristics
8.6 Electrical, environmental and/or endurance
information (supplementary information)
9 Laser diodes
9.1 Type
9.2 Semiconductor
9.3 Details of outline and encapsulation
9.4 Limiting values (absolute maximum system)
9.5 Electrical and optical characteristics
9.6 Supplementary information
Annexes
A (informative) Cross references index
B (normative) Input/output safety test
Provides the essential ratings and characteristics of several categories or subcategories of optoelectronic devices not intended for use in the area of fibre optic systems or subsystems.
| Committee |
EPL/47/3
|
| DevelopmentNote |
Renumbered and superseded by BS EN 60747-5-2 (01/2002)
|
| DocumentType |
Standard
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| IEC 60747-5-2:1997+AMD1:2002 CSV | Identical |
| IEC 60068-2-27:2008 | Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock |
| IEC 60747-5-3:1997+AMD1:2002 CSV | Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods |
| IEC 60306-1:1969 | Measurement of photosensitive devices - Part 1: Basic recommendations |
| IEC 60068-2-3:1969 | Basic environmental testing procedures - Part 2-3: Tests - Test Ca: Damp heat, steady state |
| IEC 60068-2-17:1994 | Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing |
| IEC 60068-2-2:2007 | Environmental testing - Part 2-2: Tests - Test B: Dry heat |
| IEC 60747-5-1:1997+AMD1:2001+AMD2:2002 CSV | Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General |
| IEC 60068-2-1:2007 | Environmental testing - Part 2-1: Tests - Test A: Cold |
| IEC 60068-2-30:2005 | Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle) |
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