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  • IEC 60068-2-17:1994

    Current The latest, up-to-date edition.

    Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing

    Available format(s):  Hardcopy, PDF, PDF 3 Users, PDF 5 Users, PDF 9 Users

    Language(s):  English - French, Russian, Spanish, Castilian

    Published date:  07-07-1994

    Publisher:  International Electrotechnical Committee

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    Table of Contents - (Show below) - (Hide below)

    Contents
    Committees responsible
    National foreword
    Foreword
    Survey of sealing tests
    1. Definitions
    2. Test Qa: Sealing of bushes, spindles and gaskets
    2.1 Object
    2.2 Scope
    2.3 General description of the test
    2.4 Initial measurements
    2.5 Conditions
    2.6 Final measurements
    2.7 Information to be given
    3. Test Qc: Container sealing, gas leakage
    3.1 Object
    3.2 Scope
    3.3 General description of the test
    3.4 Test Method 1
    3.5 Test Method 2
    3.6 Test Method 3
    3.7 Information to be given in the relevant specification
    4. Test Qd: Container sealing, seepage of filling liquid
    4.1 Object
    4.2 Scope
    4.3 General description of the test
    4.4 Severities
    4.5 Preconditioning
    4.6 Initial measurements
    4.7 Conditioning
    4.8 Final measurements
    4.9 Information to be given in the relevant specification
    5. Test Qf: Immersion
    5.1 Object
    5.2 General description of the test
    5.3 Initial measurements
    5.4 Preconditioning
    5.5 Conditioning
    5.6 Recovery
    5.7 Final measurements
    5.8 Information to be given in the relevant specification
    6. Test Qk: Sealing tracer gas method with mass
         spectrometer
    6.1 Object
    6.2 Scope
    6.3 General description of the test
    6.4 Test Method 1 (for specimens not filled with helium
         during manufacturing)
    6.5 Test Method 2 (for specimens filled with helium during
         manufacturing or for the requirements of this test)
    6.6 Test Method 3 (applicable to specimens to be mounted
         on bulkheads or panels)
    6.7 Information to be given in the relevant specification
    7. Test Ql: Bomb pressure test
    7.1 Object
    7.2 Scope
    7.3 General description of the test
    7.4 Initial measurements
    7.5 Conditioning
    7.6 Recovery
    7.7 Final measurements
    7.8 Information to be given in the relevant specification
    8. Test Qm: Tracer gas sealing test with internal
         pressurization
    8.1 Object
    8.2 Scope
    8.3 General description of the test
    8.4 Pre-conditioning
    8.5 Conditioning
    8.6 Information to be given in the relevant specification
    9. Test Qy: Pressure rise sealing test
    9.1 Object
    9.2 Scope
    9.3 General description of the test
    9.4 Calibration of the test equipment
    9.5 Information to be given in the relevant specification
    Annexes
    A. Example of a test chamber for Test Qa
    B. Guidance for Test Qc
    C. Guidance for Test Qd
    D. Interrelation of test parameters for Test Qk
    E. Guidance for Test Qk
    F. Guidance for Test Ql
    G. Guidance for Test Qm
    H. Guidance for Test Qy

    Abstract - (Show below) - (Hide below)

    Includes a number of tests which use different conditioning procedures appropriate for different application.

    General Product Information - (Show below) - (Hide below)

    Development Note Also numbered as BS EN 60068-2.17. (09/2005) Stability Date: 2019. (10/2012)
    Document Type Standard
    Publisher International Electrotechnical Committee
    Status Current
    Supersedes

    Standards Referenced By This Book - (Show below) - (Hide below)

    UNI EN 1300 : 2014 SECURE STORAGE UNITS - CLASSIFICATION FOR HIGH SECURITY LOCKS ACCORDING TO THEIR RESISTANCE TO UNAUTHORIZED OPENING
    CEI EN 61462 : 2008 COMPOSITE HOLLOW INSULATORS - PRESSURIZED AND UNPRESSURIZED INSULATORS FOR USE IN ELECTRICAL EQUIPMENT WITH RATED VOLTAGE GREATER THAN 1000 V - DEFINITIONS, TEST METHODS, ACCEPTANCE CRITERIA AND DESIGN RECOMMENDATIONS
    BS EN 60689:2009 Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values
    BS EN 153000:1998 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - GENERIC SPECIFICATION: DISCRETE PRESSURE CONTACT POWER SEMICONDUCTOR DEVICES (QUALIFICATION APPROVAL)
    12/30258507 DC : 0 BS EN 62575-1 - RADIO FREQUENCY (RF) BUK ACOUSTIC WAVE (BAW) FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
    S.R. CEN ISO/TS 14907-1:2015 ELECTRONIC FEE COLLECTION - TEST PROCEDURES FOR USER AND FIXED EQUIPMENT - PART 1: DESCRIPTION OF TEST PROCEDURES (ISO/TS 14907-1:2015)
    10/30235845 DC : 0 BS EN 61881-3 - RAILWAY APPLICATIONS - ROLLING STOCK EQUIPMENT - CAPACITOR FOR POWER ELECTRONICS - PART 3: ELECTRIC DOUBLE-LAYER CAPACITORS
    BS EN 60939-1:2010 Passive filter units for electromagnetic interference suppression Generic specification
    10/30211766 DC : 0 BS EN 61881-3 - RAILWAY APPLICATIONS - ROLLING STOCK EQUIPMENT CAPACITORS FOR POWER ELECTRONICS - PART 3: ELECTRIC DOUBLE-LAYER CAPACITOR
    BS EN 62575-1:2016 Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality Generic specification
    I.S. EN 61810-1:2015 ELECTROMECHANICAL ELEMENTARY RELAYS - PART 1: GENERAL AND SAFETY REQUIREMENTS
    13/30279642 DC : 0 BS EN 61811-1 - ELECTROMECHANICAL ALL-OR-NOTHING TELECOM RELAYS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION AND BLANK DETAIL SPECIFICATION
    14/30295044 DC : 0 BS ISO 19095-3 - ADHESIVES - EVALUATION OF THE ADHESION INTERFACE PERFORMANCE IN PLASTIC-METAL ASSEMBLIES - PART 3: TEST METHODS
    NF EN 61462 : 2008 COMPOSITE HOLLOW INSULATORS - PRESSURIZED AND UNPRESSURIZED INSULATORS FOR USE IN ELECTRICAL EQUIPMENT WITH RATED VOLTAGE GREATER THAN 1000 V - DEFINITIONS, TEST METHODS, ACCEPTANCE CRITERIA AND DESIGN RECOMMENDATIONS
    NF EN 60137 : 2017 INSULATED BUSHINGS FOR ALTERNATING VOLTAGES ABOVE 1000 V
    BS EN 1300:2013 SECURE STORAGE UNITS - CLASSIFICATION FOR HIGH SECURITY LOCKS ACCORDING TO THEIR RESISTANCE TO UNAUTHORIZED OPENING
    13/30286163 DC : 0 BS EN 62435-2 - ELECTRONIC COMPONENTS - LONG-TERM STORAGE OF ELECTRONIC SEMICONDUCTOR DEVICES - PART 2 - DETERIORATION MECHANISMS
    11/30258040 DC : 0 BS EN 61810-1 - ELECTROMECHANICAL ELEMENTARY RELAYS - PART 1: GENERAL REQUIREMENTS
    PD CEN ISO/TS 14907-1:2015 Electronic fee collection. Test procedures for user and fixed equipment Description of test procedures
    13/30264600 DC : 0 BS EN 60747-14-8 ED 1.0 - SEMICONDUCTOR DEVICES - PART 14-8: SEMICONDUCTOR SENSORS - CAPACITIVE DEGRADATION SENSOR OF LIQUID
    BS 6201-3:1982 FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT - SPECIFICATION FOR FIXED CAPACITORS FOR RADIO INTERFERENCE SUPPRESSION - SELECTION OF METHODS OF TEST AND GENERAL REQUIREMENTS
    BS EN 61300-2-23:1997 FIBRE OPTIC INTERCONNECTING DEVICES AND PASSIVE COMPONENTS - BASIC TEST AND MEASUREMENT PROCEDURES - PART 2-23: TESTS - SEALING FOR NON-PRESSURIZED CLOSURES OF FIBRE OPTIC DEVICES
    15/30325282 DC : 0 BS EN 62884-1 - MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELETIRIC AND ELECTROSTATIC OSCILLATORS - PART 1: BASIC METHODS FOR THE MEASUREMENT
    BS QC750116(2000) : 2000 SEMICONDUCTOR DEVICES - DISCRETE DEVICES - MICROWAVE DIODES AND TRANSISTORS - INTEGRATED-CIRCUIT MICROWAVE AMPLIFIERS - BLANK DETAIL SPECIFICATION
    BS EN 60749:1999 SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS
    13/30286159 DC : 0 BS EN 62435-1 - ELECTRONIC COMPONENTS - LONG-TERM STORAGE OF ELECTRONIC SEMICONDUCTOR DEVICES - PART 1: GENERAL
    BS EN 196103:2000 BLANK DETAIL SPECIFICATION: ROTARY SWITCHES - ASSESSMENT LEVEL Y
    04/30112662 DC : DRAFT APR 2004 IEC 61810-7 ED.2 - ELECTROMECHANICAL ELEMENTARY RELAYS - PART 7: TEST AND MEASUREMENT PROCEDURES
    UNE-EN 1300:2014 Secure storage units - Classification for high security locks according to their resistance to unauthorized opening
    BS EN 60539-1:2016 Directly heated negative temperature coefficient thermistors Generic specification
    BS IEC/IEEE 62271-37-013:2015 High-voltage switchgear and controlgear Alternating-current generator circuit-breakers
    BS EN 62884-1:2017 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Basic methods for the measurement
    DIN EN 138000 : 1997 GENERIC SPECIFICATION; FIXED INDUCTORS FOR ELECTROMAGNETIC INTERFERENCE SUPPRESSION (INDUCTORS FOR WHICH SAFETY TESTS ARE REQUIRED)
    DD CEN ISO/TS 14907-1:2010 Electronic fee collection. Test procedures for user and fixed equipment Description of test procedures
    13/30286167 DC : 0 BS EN 62435-5 - ELECTRONIC COMPONENTS - LONG-TERM STORAGE OF ELECTRONIC SEMICONDUCTOR DEVICES - PART 5 - DIE & WAFER DEVICES
    I.S. EN 60749-8:2003 SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 8: SEALING
    14/30257408 DC : 0 BS IEC/IEEE 62271-37-013 ED 1.0 - HIGH-VOLTAGE SWITCHGEAR AND CONTROLGEAR - PART 37-013: ALTERNATING-CURRENT GENERATOR CIRCUIT-BREAKERS
    11/30251478 DC : 0 BS EN 1300 - SECURE STORAGE UNITS - CLASSIFICATION FOR HIGH SECURITY LOCKS ACCORDING TO THEIR RESISTANCE TO UNAUTHORIZED OPENING
    NF EN 60384-1 : 2016 FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT - PART 1: GENERIC SPECIFICATION
    BS EN 60384-1:2016 FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT - PART 1: GENERIC SPECIFICATION
    BS EN 60938-1:2000 FIXED INDUCTORS FOR ELECTROMAGNETIC INTERFERENCE SUPPRESSION - PART 1: GENERIC SPECIFICATION
    BS QC 750111:1991 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - SEMICONDUCTOR DISCRETE DEVICES - BLANK DETAIL SPECIFICATION - BIDIRECTIONAL TRIODE THYRISTORS (TRIACS), AMBIENT OR CASE-RATED, UP TO 100 A
    05/30132097 DC : DRAFT JUNE 2005 IEC 60679-1 ED 3 - QUARTZ CRYSTAL CONTROLLED OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
    02/211632 DC : DRAFT DEC 2002 IEC 69747-5-4 ED.1 - SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 5-4: OPTOELECTRONIC DEVICES - SEMICONDUCTOR LASERS
    CEI EN 60749-8 : 2004 SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 8: SEALING
    OIML R 143 : 2009 INSTRUMENTS FOR THE CONTINUOUS MEASUREMENT OF SO[2] IN STATIONARY SOURCE EMISSIONS
    BS EN 61881-3 : 2012 RAILWAY APPLICATIONS - ROLLING STOCK EQUIPMENT - CAPACITORS FOR POWER ELECTRONICS - PART 3: ELECTRIC DOUBLE-LAYER CAPACITORS
    BS EN 60749-8:2003 Semiconductor devices. Mechanical and climatic test methods Sealing
    BS EN 165000-1:1996 FILM AND HYBRID INTEGRATED CIRCUITS - GENERIC SPECIFICATION - PART 1: CAPABILITY APPROVAL PROCEDURE
    BS CECC68000(1990) : AMD 9184 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: GENERIC SPECIFICATION: QUARTZ CRYSTAL UNITS
    CSA E60384.14 : 2014 FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT - PART 14: SECTIONAL SPECIFICATION - FIXED CAPACITORS FOR ELECTROMAGNETIC INTERFERENCE SUPPRESSION AND CONNECTION TO THE SUPPLY MAINS
    C22.2 NO. 31-18 Switchgear assemblies
    I.S. EN 60044-8:2002 INSTRUMENT TRANSFORMERS - PART 8: ELECTRONIC CURRENT TRANSFORMERS
    BS EN 60044-8:2002 Instrument transformers Electronic current transformers
    IEC PAS 62435:2005 Electronic components - Long-duration storage of electronic components - Guidance for implementation
    CSA C60044-8 : 2007 : R2016 INSTRUMENT TRANSFORMERS - PART 8: ELECTRONIC CURRENT TRANSFORMERS
    I.S. CLC TS 50466:2006 LONG DURATION STORAGE OF ELECTRONIC COMPONENTS - SPECIFICATION FOR IMPLEMENTATION
    I.S. EN 61811-51:2002 ELECTROMECHANICAL ALL-OR-NOTHING RELAYS - PART 51: BLANK DETAIL SPECIFICATION - ELECTROMECHANICAL ALL-OR-NOTHING TELECOM RELAYS OF ASSESSED QUALITY - NON-STANDARDIZED TYPES AND CONSTRUCTION
    I.S. EN 168000:1994 QUARTZ CRYSTAL UNITS (GENERIC SPECIFICATION)
    I.S. EN 60689:2009 MEASUREMENT AND TEST METHODS FOR TUNING FORK QUARTZ CRYSTAL UNITS IN THE RANGE FROM 10 KHZ TO 200 KHZ AND STANDARD VALUES
    CEI EN 50526-1 : 2013 RAILWAY APPLICATIONS - FIXED INSTALLATIONS - D.C. SURGE ARRESTERS AND VOLTAGE LIMITING DEVICES - PART 1: SURGE ARRESTERS
    CEI EN 60689 : 2009 MEASUREMENT AND TEST METHODS FOR TUNING FORK QUARTZ CRYSTAL UNITS IN THE RANGE FROM 10 KHZ TO 200 KHZ AND STANDARD VALUES
    I.S. EN 60694:1999 COMMON SPECIFICATIONS FOR HIGH-VOLTAGE SWITCHGEAR AND CONTROLGEAR STANDARDS
    I.S. EN 61810-7:2006 ELECTROMECHANICAL ELEMENTARY RELAYS - PART 7: TEST AND MEASUREMENT PROCEDURES
    EN 62271-1:2017 High-voltage switchgear and controlgear - Part 1: Common specifications for alternating current switchgear and controlgear
    IEC TS 61462:1998 Composite insulators - Hollow insulators for use in outdoor and indoor electrical equipment - Definitions, test methods, acceptance criteria and design recommendations
    I.S. EN 60137:2017 INSULATED BUSHINGS FOR ALTERNATING VOLTAGES ABOVE 1000 V
    I.S. EN 60679-1:2017 PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
    I.S. EN 62575-1:2016 RADIO FREQUENCY (RF) BULK ACOUSTIC WAVE (BAW) FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
    UNE-EN 60099-4:2016 Surge arresters - Part 4: Metal-oxide surge arresters without gaps for a.c. systems
    I.S. EN 61248-1:1998 TRANSFORMERS AND INDUCTORS FOR USE IN ELECTRONIC AND TELECOMMUNICATION EQUIPMENT - PART 1: GENERIC SPECIFICATION
    I.S. EN 62246-1-1:2013 REED SWITCHES - PART 1-1: GENERIC SPECIFICATION - QUALITY ASSESSMENT (IEC 62246-1-1:2013 (EQV))
    IEC 61253-1:1993 Piezoelectric ceramic resonators - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 1: Generic specification - Qualification approval
    EN 60137:2017 Insulated bushings for alternating voltages above 1 000 V
    I.S. EN 60939-1:2010 PASSIVE FILTER UNITS FOR ELECTROMAGNETIC INTERFERENCE SUPPRESSION - PART 1: GENERIC SPECIFICATION
    NF EN 60122-1 : 2003 QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
    IEC 62246-1:2015 Reed switches - Part 1: Generic specification
    IEC 60694:1996+AMD1:2000+AMD2:2001 CSV Common specifications for high-voltage switchgear and controlgear standards
    EN 60099-4:2014 Surge arresters - Part 4: Metal-oxide surge arresters without gaps for a.c. systems
    IEC 60384-1:2016 RLV Fixed capacitors for use in electronic equipment - Part 1: Generic specification
    EN 60749-8:2003 Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing
    EN 61811-51:2002 Electromechanical all-or-nothing relays - Part 51: Blank detail specification - Electromechanical all-or-nothing telecom relays of assessed quality - Non-standardized types and construction
    EN 60747-5-2:2001/A1:2002 DISCRETE SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS - PART 5-2: OPTOELECTRONIC DEVICES - ESSENTIAL RATINGS AND CHARACTERISTICS
    EN 153000:1998 Generic specification: Discrete pressure contact power semiconductor devices (Qualification approval)
    EN 61019-1 : 2005 Surface acoustic wave (SAW) resonators - Part 1: Generic specification
    EN 62246-1:2015 Reed switches - Part 1: Generic specification
    EN 60694:1996/A2:2001 COMMON SPECIFICATIONS FOR HIGH-VOLTAGE SWITCHGEAR AND CONTROLGEAR STANDARDS
    EN 196000 : 92 AMD 1 2001 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - GENERIC SPECIFICATION: ELECTROMECHANICAL SWITCHES
    EN 62435-5:2017 Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices
    EN 60939-1:2010 PASSIVE FILTER UNITS FOR ELECTROMAGNETIC INTERFERENCE SUPPRESSION - PART 1: GENERIC SPECIFICATION
    EN 60689:2009 Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values
    CLC/TS 50466:2006 Long duration storage of electronic components - Specification for implementation
    EN 129000:1993/A1:1995 GENERIC SPECIFICATION - FIXED RF WOUND INDUCTORS
    EN 61811-54:2002 Electromechanical all-or-nothing relays - Part 54: Blank detail specification - Electromechanical all-or-nothing telecom relays of assessed quality - Two change-over contacts, 15 mm x 7,5 mm base
    EN 62435-1:2017 Electronic components - Long-term storage of electronic semiconductor devices - Part 1: General
    EN 62604-1:2015 Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification
    EN 60068-3-4:2002 Environmental testing - Part 3-4: Supporting documentation and guidance - Damp heat tests
    EN 61881-2 : 2012 RAILWAY APPLICATIONS - ROLLING STOCK EQUIPMENT - CAPACITORS FOR POWER ELECTRONICS - PART 2: ALUMINIUM ELECTROLYTIC CAPACITORS WITH NON SOLID ELECTROLYTE (IEC 61881-2:2012)
    12/30268003 DC : 0 BS EN 60939-3 - PASSIVE FILTER UNITS FOR ELECTROMAGNETIC INTERFERENCE SUPPRESSION - PART 3: HARMONIZED STANDARD FOR PASSIVE FILTER UNITS FOR WHICH SAFETY TESTS ARE APPROPRIATE
    09/30200407 DC : 0 BS EN 50526-1 - RAILWAY APPLICATIONS - FIXED INSTALLATIONS - D.C. SURGE ARRESTERS AND VOLTAGE LIMITING DEVICES - PART 1: SURGE ARRESTERS
    13/30278343 DC : 0 BS EN 62246-1 - REED SWITCHES - PART 1: GENERIC SPECIFICATION
    BS EN 60358-1:2012 Coupling capacitors and capacitor dividers General rules
    06/30157868 DC : 0 BS EN 60393-1 - POTENTIOMETERS FOR USE IN ELECTRONIC EQUIPMENT - PART 1: GENERIC SPECIFICATION
    BS IEC 61275:2013 RADIATION PROTECTION INSTRUMENTATION - MEASUREMENT OF DISCRETE RADIONUCLIDES IN THE ENVIRONMENT - IN SITU PHOTON SPECTROMETRY SYSTEM USING A GERMANIUM DETECTOR
    03/101947 DC : DRAFT FEB 2003 IEC 60939-1 ED.2.0 - PASSIVE FILTER UNITS FOR ELECTROMAGNETIC INTERFERENCE SUPPRESSION - PART 1: GENERIC SPECIFICATION
    NF EN 61869-1 : 2009 INSTRUMENT TRANSFORMERS - PART 1: GENERAL REQUIREMENTS
    11/30243761 DC : 0 BS ISO 14708-7 - IMPLANTS FOR SURGERY - ACTIVE IMPLANTABLE MEDICAL DEVICES - PART 7: PARTICULAR REQUIREMENTS FOR COCHLEAR IMPLANT SYSTEMS
    BS EN 196403:2000 HARMONIZED SYSTEMS OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION: PUSH BUTTON SWITCHES - ASSESSMENT LEVEL Y
    BS EN 61462:2007 Composite hollow insulators. Pressurized and unpressurized insulators for use in electrical equipment with rated voltage greater than 1000 V. Definitions, test methods, acceptance criteria and design recommendations
    BS IEC 60747-4.2 : 2000 SEMICONDUCTOR DEVICES - DISCRETE DEVICES - MICROWAVE DIODES AND TRANSISTORS - INTEGRATED-CIRCUIT MICROWAVE AMPLIFIERS - BLANK DETAIL SPECIFICATION
    02/203604 DC : DRAFT MAR 2002 IEC 61810-1. ED.2 - ELEMENTARY RELAYS - PART 1: SAFETY-RELATED AND GENERAL REQUIREMENTS
    I.S. EN 62435-1:2017 ELECTRONIC COMPONENTS - LONG-TERM STORAGE OF ELECTRONIC SEMICONDUCTOR DEVICES - PART 1: GENERAL
    BS EN 61811-51:2002 ELECTROMECHANICAL ALL-OR-NOTHING RELAYS - PART 51: BLANK DETAIL SPECIFICATION - ELECTROMECHANICAL ALL-OR-NOTHING TELECOM RELAYS OF ASSESSED QUALITY - NON-STANDARDIZED TYPES AND CONSTRUCTION
    CEI EN 60939-2 : 2005 PASSIVE FILTER UNITS FOR ELECTROMAGNETIC INTERFERENCE SUPPRESSION - PART 2: SECTIONAL SPECIFICATION: PASSIVE FILTER UNITS FOR WHICH SAFETY TESTS ARE APPROPRIATE - TEST METHODS AND GENERAL REQUIREMENTS
    I.S. EN 61462:2007 COMPOSITE HOLLOW INSULATORS - PRESSURIZED AND UNPRESSURIZED INSULATORS FOR USE IN ELECTRICAL EQUIPMENT WITH RATED VOLTAGE GREATER THAN 1 000 V - DEFINITIONS, TEST METHODS, ACCEPTANCE CRITERIA AND DESIGN RECOMMENDATIONS
    03/103741 DC : DRAFT FEB 2003 IEC 61338-1 ED.1 - WAVEGUIDE TYPE DIELECTRIC RESONATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
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    13/30257235 DC : 0 BS EN 62772 - COMPOSITE HOLLOW CORE STATION POST INSULATORS FOR SUBSTATIONS WITH A.C. AND D.C. VOLTAGES GREATER THAN 1000 V - DEFINITIONS, TEST METHODS AND ACCEPTANCE CRITERIA
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    NF EN 60068 2-14 : 2009 ENVIRONMENTAL TESTING - PART 2-14: TESTS - TEST N: CHANGE OF TEMPERATURE
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    BS EN 60068-3-4:2002 ENVIRONMENTAL TESTING - PART 3-4: SUPPORTING DOCUMENTATION AND GUIDANCE - DAMP HEAT TESTS
    BS EN 45502-2-3:2010 ACTIVE IMPLANTABLE MEDICAL DEVICES - PART 2-3: PARTICULAR REQUIREMENTS FOR COCHLEAR AND AUDITORY BRAINSTEM IMPLANT SYSTEMS
    04/30111589 DC : 0
    BS EN 196000:1993 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - GENERIC SPECIFICATION - ELECTROMECHANICAL SWITCHES
    BS EN 181000:1995 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - GENERIC SPECIFICATION: FIBRE OPTIC BRANCHING DEVICES
    CEI EN 60393-1 : 2010 POTENTIOMETERS FOR USE IN ELECTRONIC EQUIPMENT - PART 1: GENERIC SPECIFICATION
    PREN 2349 : 200P1 AEROSPACE SERIES - REQUIREMENTS AND TEST PROCEDURES FOR SWITCHING DEVICES
    CSA C60044-2 : 2007 : R2011 INSTRUMENT TRANSFORMERS - PART 2: INDUCTIVE VOLTAGE TRANSFORMERS
    CSA C60044-8 : 2007 : R2011 INSTRUMENT TRANSFORMERS - PART 8: ELECTRONIC CURRENT TRANSFORMERS
    CEI EN 61810-1 : 2016 ELECTROMECHANICAL ELEMENTARY RELAYS - PART 1: GENERAL AND SAFETY REQUIREMENTS
    IEEE C37.100.1 : 2007 COMMON REQUIREMENTS FOR HIGH VOLTAGE POWER SWITCHGEAR RATED ABOVE 1000 V
    NF EN 62246-1 : 2015 REED SWITCHES - PART 1: GENERIC SPECIFICATION
    I.S. EN 62146-1:2014 GRADING CAPACITORS FOR HIGH-VOLTAGE ALTERNATING CURRENT CIRCUIT-BREAKERS - PART 1: GENERAL
    BS EN 138000:1997 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - GENERIC SPECIFICATION: FIXED INDUCTORS FOR ELECTROMAGNETIC INTERFERENCE SUPPRESSION (INDUCTORS FOR WHICH SAFETY TESTS ARE REQUIRED)
    IEC 60137:2017 Insulated bushings for alternating voltages above 1000 V
    I.S. EN 62271-1:2017 HIGH-VOLTAGE SWITCHGEAR AND CONTROLGEAR - PART 1: COMMON SPECIFICATIONS FOR ALTERNATING CURRENT SWITCHGEAR AND CONTROLGEAR
    BS EN 60137:2017 INSULATED BUSHINGS FOR ALTERNATING VOLTAGES ABOVE 1000 V
    I.S. EN 62435-5:2017 ELECTRONIC COMPONENTS - LONG-TERM STORAGE OF ELECTRONIC SEMICONDUCTOR DEVICES - PART 5: DIE AND WAFER DEVICES
    I.S. EN 61019-1:2005 SURFACE ACOUSTIC WAVE (SAW) RESONATORS - PART 1: GENERIC SPECIFICATION
    EN 62884-1:2017 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement
    I.S. EN 60384-1:2016 FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT - PART 1: GENERIC SPECIFICATION
    I.S. EN 61007:1998 TRANSFORMERS AND INDUCTORS FOR USE IN ELECTRONIC AND TELECOMMUNICATION EQUIPMENT - MEASURING METHODS AND TEST PROCEDURES
    I.S. EN 60358-1:2012 COUPLING CAPACITORS AND CAPACITOR DIVIDERS - PART 1: GENERAL RULES (IEC 60358-1:2012 (EQV))
    I.S. EN 61881-3:2012 RAILWAY APPLICATIONS - ROLLING STOCK EQUIPMENT - CAPACITORS FOR POWER ELECTRONICS - PART 3: ELECTRIC DOUBLE-LAYER CAPACITORS (IEC 61881-3:2012 (EQV))
    I.S. EN 153000:1998 DISCRETE PRESSURE CONTACT POWER SEMICONDUCTOR DEVICES (QUALIFICATION APPROVAL) (GENERIC SPECIFICATION)
    CEI EN 60068-3-4 : 2002 ENVIRONMENTAL TESTING - PART 3-4: SUPPORTING DOCUMENTATION AND GUIDANCE DAMP HEAT TESTS
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