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  • IEC 60068-2-17:1994

    View superseded by
    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
    View superseded by

    Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing

    Available format(s):  Hardcopy, PDF, PDF 3 Users, PDF 5 Users, PDF 9 Users

    Superseded date:  28-06-2023

    Language(s):  English - French, Russian, Spanish, Castilian

    Published date:  07-07-1994

    Publisher:  International Electrotechnical Committee

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    Table of Contents - (Show below) - (Hide below)

    Contents
    Committees responsible
    National foreword
    Foreword
    Survey of sealing tests
    1. Definitions
    2. Test Qa: Sealing of bushes, spindles and gaskets
    2.1 Object
    2.2 Scope
    2.3 General description of the test
    2.4 Initial measurements
    2.5 Conditions
    2.6 Final measurements
    2.7 Information to be given
    3. Test Qc: Container sealing, gas leakage
    3.1 Object
    3.2 Scope
    3.3 General description of the test
    3.4 Test Method 1
    3.5 Test Method 2
    3.6 Test Method 3
    3.7 Information to be given in the relevant specification
    4. Test Qd: Container sealing, seepage of filling liquid
    4.1 Object
    4.2 Scope
    4.3 General description of the test
    4.4 Severities
    4.5 Preconditioning
    4.6 Initial measurements
    4.7 Conditioning
    4.8 Final measurements
    4.9 Information to be given in the relevant specification
    5. Test Qf: Immersion
    5.1 Object
    5.2 General description of the test
    5.3 Initial measurements
    5.4 Preconditioning
    5.5 Conditioning
    5.6 Recovery
    5.7 Final measurements
    5.8 Information to be given in the relevant specification
    6. Test Qk: Sealing tracer gas method with mass
         spectrometer
    6.1 Object
    6.2 Scope
    6.3 General description of the test
    6.4 Test Method 1 (for specimens not filled with helium
         during manufacturing)
    6.5 Test Method 2 (for specimens filled with helium during
         manufacturing or for the requirements of this test)
    6.6 Test Method 3 (applicable to specimens to be mounted
         on bulkheads or panels)
    6.7 Information to be given in the relevant specification
    7. Test Ql: Bomb pressure test
    7.1 Object
    7.2 Scope
    7.3 General description of the test
    7.4 Initial measurements
    7.5 Conditioning
    7.6 Recovery
    7.7 Final measurements
    7.8 Information to be given in the relevant specification
    8. Test Qm: Tracer gas sealing test with internal
         pressurization
    8.1 Object
    8.2 Scope
    8.3 General description of the test
    8.4 Pre-conditioning
    8.5 Conditioning
    8.6 Information to be given in the relevant specification
    9. Test Qy: Pressure rise sealing test
    9.1 Object
    9.2 Scope
    9.3 General description of the test
    9.4 Calibration of the test equipment
    9.5 Information to be given in the relevant specification
    Annexes
    A. Example of a test chamber for Test Qa
    B. Guidance for Test Qc
    C. Guidance for Test Qd
    D. Interrelation of test parameters for Test Qk
    E. Guidance for Test Qk
    F. Guidance for Test Ql
    G. Guidance for Test Qm
    H. Guidance for Test Qy

    Abstract - (Show below) - (Hide below)

    Includes a number of tests which use different conditioning procedures appropriate for different application.

    General Product Information - (Show below) - (Hide below)

    Committee TC 104
    Development Note Also numbered as BS EN 60068-2.17. (09/2005) Stability Date: 2019. (10/2012)
    Document Type Standard
    Publisher International Electrotechnical Committee
    Status Superseded
    Superseded By
    Supersedes

    Standards Referenced By This Book - (Show below) - (Hide below)

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    BS EN 60689:2009 Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values
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    NF EN 60137 : 2017 INSULATED BUSHINGS FOR ALTERNATING VOLTAGES ABOVE 1000 V
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    BS EN 60749:1999 SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS
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    BS QC 750111:1991 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - SEMICONDUCTOR DISCRETE DEVICES - BLANK DETAIL SPECIFICATION - BIDIRECTIONAL TRIODE THYRISTORS (TRIACS), AMBIENT OR CASE-RATED, UP TO 100 A
    05/30132097 DC : DRAFT JUNE 2005 IEC 60679-1 ED 3 - QUARTZ CRYSTAL CONTROLLED OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
    02/211632 DC : DRAFT DEC 2002 IEC 69747-5-4 ED.1 - SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 5-4: OPTOELECTRONIC DEVICES - SEMICONDUCTOR LASERS
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    OIML R 143 : 2009 INSTRUMENTS FOR THE CONTINUOUS MEASUREMENT OF SO[2] IN STATIONARY SOURCE EMISSIONS
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    BS EN 60749-8:2003 Semiconductor devices. Mechanical and climatic test methods Sealing
    BS EN 165000-1:1996 FILM AND HYBRID INTEGRATED CIRCUITS - GENERIC SPECIFICATION - PART 1: CAPABILITY APPROVAL PROCEDURE
    BS CECC68000(1990) : AMD 9184 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: GENERIC SPECIFICATION: QUARTZ CRYSTAL UNITS
    CSA E60384.14 : 2014 FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT - PART 14: SECTIONAL SPECIFICATION - FIXED CAPACITORS FOR ELECTROMAGNETIC INTERFERENCE SUPPRESSION AND CONNECTION TO THE SUPPLY MAINS
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    I.S. CLC TS 50466:2006 LONG DURATION STORAGE OF ELECTRONIC COMPONENTS - SPECIFICATION FOR IMPLEMENTATION
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    I.S. EN 168000:1994 QUARTZ CRYSTAL UNITS (GENERIC SPECIFICATION)
    I.S. EN 60689:2009 MEASUREMENT AND TEST METHODS FOR TUNING FORK QUARTZ CRYSTAL UNITS IN THE RANGE FROM 10 KHZ TO 200 KHZ AND STANDARD VALUES
    CEI EN 50526-1 : 2013 RAILWAY APPLICATIONS - FIXED INSTALLATIONS - D.C. SURGE ARRESTERS AND VOLTAGE LIMITING DEVICES - PART 1: SURGE ARRESTERS
    CEI EN 60689 : 2009 MEASUREMENT AND TEST METHODS FOR TUNING FORK QUARTZ CRYSTAL UNITS IN THE RANGE FROM 10 KHZ TO 200 KHZ AND STANDARD VALUES
    I.S. EN 60694:1999 COMMON SPECIFICATIONS FOR HIGH-VOLTAGE SWITCHGEAR AND CONTROLGEAR STANDARDS
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    EN 62271-1:2017 High-voltage switchgear and controlgear - Part 1: Common specifications for alternating current switchgear and controlgear
    IEC TS 61462:1998 Composite insulators - Hollow insulators for use in outdoor and indoor electrical equipment - Definitions, test methods, acceptance criteria and design recommendations
    I.S. EN 60137:2017 INSULATED BUSHINGS FOR ALTERNATING VOLTAGES ABOVE 1000 V
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    UNE-EN 60099-4:2016 Surge arresters - Part 4: Metal-oxide surge arresters without gaps for a.c. systems
    I.S. EN 61248-1:1998 TRANSFORMERS AND INDUCTORS FOR USE IN ELECTRONIC AND TELECOMMUNICATION EQUIPMENT - PART 1: GENERIC SPECIFICATION
    I.S. EN 62246-1-1:2013 REED SWITCHES - PART 1-1: GENERIC SPECIFICATION - QUALITY ASSESSMENT (IEC 62246-1-1:2013 (EQV))
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    EN 60099-4:2014 Surge arresters - Part 4: Metal-oxide surge arresters without gaps for a.c. systems
    IEC 60384-1:2016 RLV Fixed capacitors for use in electronic equipment - Part 1: Generic specification
    EN 60749-8:2003 Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing
    EN 61811-51:2002 Electromechanical all-or-nothing relays - Part 51: Blank detail specification - Electromechanical all-or-nothing telecom relays of assessed quality - Non-standardized types and construction
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    EN 153000:1998 Generic specification: Discrete pressure contact power semiconductor devices (Qualification approval)
    EN 61019-1 : 2005 Surface acoustic wave (SAW) resonators - Part 1: Generic specification
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    EN 60694:1996/A2:2001 COMMON SPECIFICATIONS FOR HIGH-VOLTAGE SWITCHGEAR AND CONTROLGEAR STANDARDS
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    EN 60939-1:2010 PASSIVE FILTER UNITS FOR ELECTROMAGNETIC INTERFERENCE SUPPRESSION - PART 1: GENERIC SPECIFICATION
    EN 60689:2009 Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values
    CLC/TS 50466:2006 Long duration storage of electronic components - Specification for implementation
    EN 129000:1993/A1:1995 GENERIC SPECIFICATION - FIXED RF WOUND INDUCTORS
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    EN 181000:1994 Generic Specification: Fibre optic branching devices
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    EN 168000 : 1993 AMD 2 1998 GENERIC SPECIFICATION - QUARTZ CRYSTAL UNITS
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