• IEC 60068-2-17:1994

    Current The latest, up-to-date edition.

    Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing

    Available format(s):  Hardcopy, PDF, PDF 3 Users, PDF 5 Users, PDF 9 Users

    Language(s):  English - French, Russian, Spanish, Castilian

    Published date:  07-07-1994

    Publisher:  International Electrotechnical Committee

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    Table of Contents - (Show below) - (Hide below)

    Contents
    Committees responsible
    National foreword
    Foreword
    Survey of sealing tests
    1. Definitions
    2. Test Qa: Sealing of bushes, spindles and gaskets
    2.1 Object
    2.2 Scope
    2.3 General description of the test
    2.4 Initial measurements
    2.5 Conditions
    2.6 Final measurements
    2.7 Information to be given
    3. Test Qc: Container sealing, gas leakage
    3.1 Object
    3.2 Scope
    3.3 General description of the test
    3.4 Test Method 1
    3.5 Test Method 2
    3.6 Test Method 3
    3.7 Information to be given in the relevant specification
    4. Test Qd: Container sealing, seepage of filling liquid
    4.1 Object
    4.2 Scope
    4.3 General description of the test
    4.4 Severities
    4.5 Preconditioning
    4.6 Initial measurements
    4.7 Conditioning
    4.8 Final measurements
    4.9 Information to be given in the relevant specification
    5. Test Qf: Immersion
    5.1 Object
    5.2 General description of the test
    5.3 Initial measurements
    5.4 Preconditioning
    5.5 Conditioning
    5.6 Recovery
    5.7 Final measurements
    5.8 Information to be given in the relevant specification
    6. Test Qk: Sealing tracer gas method with mass
         spectrometer
    6.1 Object
    6.2 Scope
    6.3 General description of the test
    6.4 Test Method 1 (for specimens not filled with helium
         during manufacturing)
    6.5 Test Method 2 (for specimens filled with helium during
         manufacturing or for the requirements of this test)
    6.6 Test Method 3 (applicable to specimens to be mounted
         on bulkheads or panels)
    6.7 Information to be given in the relevant specification
    7. Test Ql: Bomb pressure test
    7.1 Object
    7.2 Scope
    7.3 General description of the test
    7.4 Initial measurements
    7.5 Conditioning
    7.6 Recovery
    7.7 Final measurements
    7.8 Information to be given in the relevant specification
    8. Test Qm: Tracer gas sealing test with internal
         pressurization
    8.1 Object
    8.2 Scope
    8.3 General description of the test
    8.4 Pre-conditioning
    8.5 Conditioning
    8.6 Information to be given in the relevant specification
    9. Test Qy: Pressure rise sealing test
    9.1 Object
    9.2 Scope
    9.3 General description of the test
    9.4 Calibration of the test equipment
    9.5 Information to be given in the relevant specification
    Annexes
    A. Example of a test chamber for Test Qa
    B. Guidance for Test Qc
    C. Guidance for Test Qd
    D. Interrelation of test parameters for Test Qk
    E. Guidance for Test Qk
    F. Guidance for Test Ql
    G. Guidance for Test Qm
    H. Guidance for Test Qy

    Abstract - (Show below) - (Hide below)

    Includes a number of tests which use different conditioning procedures appropriate for different application.

    General Product Information - (Show below) - (Hide below)

    Development Note Also numbered as BS EN 60068-2.17. (09/2005) Stability Date: 2019. (10/2012)
    Document Type Standard
    Publisher International Electrotechnical Committee
    Status Current
    Supersedes

    Standards Referenced By This Book - (Show below) - (Hide below)

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    BS EN 153000 : 1998 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - GENERIC SPECIFICATION: DISCRETE PRESSURE CONTACT POWER SEMICONDUCTOR DEVICES (QUALIFICATION APPROVAL)
    12/30258507 DC : 0 BS EN 62575-1 - RADIO FREQUENCY (RF) BUK ACOUSTIC WAVE (BAW) FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
    S.R. CEN ISO/TS 14907-1:2015 ELECTRONIC FEE COLLECTION - TEST PROCEDURES FOR USER AND FIXED EQUIPMENT - PART 1: DESCRIPTION OF TEST PROCEDURES (ISO/TS 14907-1:2015)
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    10/30211766 DC : 0 BS EN 61881-3 - RAILWAY APPLICATIONS - ROLLING STOCK EQUIPMENT CAPACITORS FOR POWER ELECTRONICS - PART 3: ELECTRIC DOUBLE-LAYER CAPACITOR
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    NF EN 60137 : 2017 INSULATED BUSHINGS FOR ALTERNATING VOLTAGES ABOVE 1000 V
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    BS 6201-3(1982) : 1982 FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT - SPECIFICATION FOR FIXED CAPACITORS FOR RADIO INTERFERENCE SUPPRESSION - SELECTION OF METHODS OF TEST AND GENERAL REQUIREMENTS
    BS EN 61300-2-23:1997 FIBRE OPTIC INTERCONNECTING DEVICES AND PASSIVE COMPONENTS - BASIC TEST AND MEASUREMENT PROCEDURES - PART 2-23: TESTS - SEALING FOR NON-PRESSURIZED CLOSURES OF FIBRE OPTIC DEVICES
    15/30325282 DC : 0 BS EN 62884-1 - MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELETIRIC AND ELECTROSTATIC OSCILLATORS - PART 1: BASIC METHODS FOR THE MEASUREMENT
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    BS EN 60749 : 1999 SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS
    13/30286159 DC : 0 BS EN 62435-1 - ELECTRONIC COMPONENTS - LONG-TERM STORAGE OF ELECTRONIC SEMICONDUCTOR DEVICES - PART 1: GENERAL
    BS EN 196103 : 2000 BLANK DETAIL SPECIFICATION: ROTARY SWITCHES - ASSESSMENT LEVEL Y
    04/30112662 DC : DRAFT APR 2004 IEC 61810-7 ED.2 - ELECTROMECHANICAL ELEMENTARY RELAYS - PART 7: TEST AND MEASUREMENT PROCEDURES
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    DD CEN ISO/TS 14907-1 : 2010 ELECTRONIC FEE COLLECTION - TEST PROCEDURES FOR USER AND FIXED EQUIPMENT - PART 1: DESCRIPTION OF TEST PROCEDURES (ISO/TS 14907-1:2010)
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    I.S. EN 60749-8:2003 SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 8: SEALING
    14/30257408 DC : 0 BS IEC/IEEE 62271-37-013 ED 1.0 - HIGH-VOLTAGE SWITCHGEAR AND CONTROLGEAR - PART 37-013: ALTERNATING-CURRENT GENERATOR CIRCUIT-BREAKERS
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    BS QC 750111:1991 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - SEMICONDUCTOR DISCRETE DEVICES - BLANK DETAIL SPECIFICATION - BIDIRECTIONAL TRIODE THYRISTORS (TRIACS), AMBIENT OR CASE-RATED, UP TO 100 A
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    02/211632 DC : DRAFT DEC 2002 IEC 69747-5-4 ED.1 - SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 5-4: OPTOELECTRONIC DEVICES - SEMICONDUCTOR LASERS
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    OIML R 143 : 2009 INSTRUMENTS FOR THE CONTINUOUS MEASUREMENT OF SO[2] IN STATIONARY SOURCE EMISSIONS
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    BS EN 165000-1 : 1996 FILM AND HYBRID INTEGRATED CIRCUITS - GENERIC SPECIFICATION - PART 1: CAPABILITY APPROVAL PROCEDURE
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    CSA C60044-8 : 2007 : R2016 INSTRUMENT TRANSFORMERS - PART 8: ELECTRONIC CURRENT TRANSFORMERS
    I.S. CLC TS 50466:2006 LONG DURATION STORAGE OF ELECTRONIC COMPONENTS - SPECIFICATION FOR IMPLEMENTATION
    I.S. EN 61811-51:2002 ELECTROMECHANICAL ALL-OR-NOTHING RELAYS - PART 51: BLANK DETAIL SPECIFICATION - ELECTROMECHANICAL ALL-OR-NOTHING TELECOM RELAYS OF ASSESSED QUALITY - NON-STANDARDIZED TYPES AND CONSTRUCTION
    I.S. EN 168000:1994 QUARTZ CRYSTAL UNITS (GENERIC SPECIFICATION)
    I.S. EN 60689:2009 MEASUREMENT AND TEST METHODS FOR TUNING FORK QUARTZ CRYSTAL UNITS IN THE RANGE FROM 10 KHZ TO 200 KHZ AND STANDARD VALUES
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    I.S. EN 60694:1999 COMMON SPECIFICATIONS FOR HIGH-VOLTAGE SWITCHGEAR AND CONTROLGEAR STANDARDS
    I.S. EN 61810-7:2006 ELECTROMECHANICAL ELEMENTARY RELAYS - PART 7: TEST AND MEASUREMENT PROCEDURES
    EN 62271-1:2017 HIGH-VOLTAGE SWITCHGEAR AND CONTROLGEAR - PART 1: COMMON SPECIFICATIONS FOR ALTERNATING CURRENT SWITCHGEAR AND CONTROLGEAR (IEC 62271-1:2017)
    IEC TS 61462:1998 Composite insulators - Hollow insulators for use in outdoor and indoor electrical equipment - Definitions, test methods, acceptance criteria and design recommendations
    I.S. EN 60137:2017 INSULATED BUSHINGS FOR ALTERNATING VOLTAGES ABOVE 1000 V
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    UNE-EN 60099-4:2016 Surge arresters - Part 4: Metal-oxide surge arresters without gaps for a.c. systems
    I.S. EN 61248-1:1998 TRANSFORMERS AND INDUCTORS FOR USE IN ELECTRONIC AND TELECOMMUNICATION EQUIPMENT - PART 1: GENERIC SPECIFICATION
    I.S. EN 62246-1-1:2013 REED SWITCHES - PART 1-1: GENERIC SPECIFICATION - QUALITY ASSESSMENT (IEC 62246-1-1:2013 (EQV))
    IEC 61253-1:1993 Piezoelectric ceramic resonators - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 1: Generic specification - Qualification approval
    EN 60137:2017 INSULATED BUSHINGS FOR ALTERNATING VOLTAGES ABOVE 1000 V (IEC 60137:2017)
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    NF EN 60122-1 : 2003 QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
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    IEC 60694:1996+AMD1:2000+AMD2:2001 CSV Common specifications for high-voltage switchgear and controlgear standards
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    EN 60747-5-2:2001/A1:2002 DISCRETE SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS - PART 5-2: OPTOELECTRONIC DEVICES - ESSENTIAL RATINGS AND CHARACTERISTICS
    EN 153000:1998 Generic specification: Discrete pressure contact power semiconductor devices (Qualification approval)
    EN 61019-1 : 2005 Surface acoustic wave (SAW) resonators - Part 1: Generic specification
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    EN 60694:1996/A2:2001 COMMON SPECIFICATIONS FOR HIGH-VOLTAGE SWITCHGEAR AND CONTROLGEAR STANDARDS
    EN 196000 : 92 AMD 1 2001 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - GENERIC SPECIFICATION: ELECTROMECHANICAL SWITCHES
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    EN 60939-1:2010 PASSIVE FILTER UNITS FOR ELECTROMAGNETIC INTERFERENCE SUPPRESSION - PART 1: GENERIC SPECIFICATION
    EN 60689 : 2009 MEASUREMENT AND TEST METHODS FOR TUNING FORK QUARTZ CRYSTAL UNITS IN THE RANGE FROM 10 KHZ TO 200 KHZ AND STANDARD VALUES
    CLC/TS 50466:2006 Long duration storage of electronic components - Specification for implementation
    EN 129000:1993/A1:1995 GENERIC SPECIFICATION - FIXED RF WOUND INDUCTORS
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