• BS IEC 60747-5.2 : 97 AMD 13433

    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

    DISCRETE SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS - OPTOELECTRONIC DEVICES - ESSENTIAL RATINGS AND CHARACTERISTICS

    Available format(s): 

    Superseded date:  08-01-2002

    Language(s): 

    Published date:  23-11-2012

    Publisher:  British Standards Institution

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    1 Scope
    2 Normative references
    3 Light-emitting diodes (excluding devices for fibre
        optic systems or subsystems)
        3.1 Type
        3.2 Semiconductor material
        3.3 Colour
        3.4 Details of outline and encapsulation
        3.5 Limiting values (absolute maximum system)
        3.6 Electrical characteristics
        3.7 Supplementary information
    4 Infrared-emitting diodes (excluding devices for fibre
        optic systems or subsystems)
        4.1 Type
        4.2 Semiconductor material
        4.3 Details of outline and encapsulation
        4.4 Limiting values (absolute maximum system)
        4.5 Electrical characteristics
        4.6 Supplementary information
    5 Photodiodes (excluding devices for fibre optic systems or
        subsystems)
        5.1 Type
        5.2 Semiconductor material
        5.3 Details of outline and encapsulation
        5.4 Limiting values (absolute maximum system)
        5.5 Electrical characteristics
        5.6 Supplementary information
    6 Phototransistors (excluding devices for fibre optic
        systems or subsystems)
        6.1 Type
        6.2 Semiconductor material
        6.3 Polarity
        6.4 Details of outline and encapsulation
        6.5 Limiting values (absolute maximum system)
        6.6 Electrical characteristics
        6.7 Supplementary information
    7 Photocouplers, optocouplers (with output transistor)
        7.1 Type
        7.2 Semiconductor material
        7.3 Polarity of the output resistor
        7.4 Details of outline and encapsulation
        7.5 Limiting values (absolute maximum system)
        7.6 Electrical characteristics
        7.7 Supplementary information
    8 Photocouplers (optocouplers) providing protection
        against electrical shock
        8.1 Type
        8.2 Semiconductor material
        8.3 Details of outline and encapsulation
        8.4 Ratings
        8.5 Electrical characteristics
        8.6 Electrical, environmental and/or endurance
              information (supplementary information)
    9 Laser diodes
        9.1 Type
        9.2 Semiconductor
        9.3 Details of outline and encapsulation
        9.4 Limiting values (absolute maximum system)
        9.5 Electrical and optical characteristics
        9.6 Supplementary information
    Annexes
    A (informative) Cross references index
    B (normative) Input/output safety test

    Abstract - (Show below) - (Hide below)

    Provides the essential ratings and characteristics of several categories or subcategories of optoelectronic devices not intended for use in the area of fibre optic systems or subsystems.

    General Product Information - (Show below) - (Hide below)

    Committee EPL/47/3
    Development Note Renumbered and superseded by BS EN 60747-5-2 (01/2002)
    Document Type Standard
    Publisher British Standards Institution
    Status Superseded
    Superseded By

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60068-2-27:2008 Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock
    IEC 60747-5-3:1997+AMD1:2002 CSV Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods
    IEC 60306-1:1969 Measurement of photosensitive devices - Part 1: Basic recommendations
    IEC 60068-2-3:1969 Basic environmental testing procedures - Part 2-3: Tests - Test Ca: Damp heat, steady state
    IEC 60068-2-17:1994 Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing
    IEC 60068-2-2:2007 Environmental testing - Part 2-2: Tests - Test B: Dry heat
    IEC 60747-5-1:1997+AMD1:2001+AMD2:2002 CSV Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General
    IEC 60068-2-1:2007 Environmental testing - Part 2-1: Tests - Test A: Cold
    IEC 60068-2-30:2005 Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle)
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