1 Scope
2 Normative references
3 Terminology
3.1 Physical concepts
3.2 General terms
3.3 Terms related to ratings and characteristics
4 Technical aspects
4.1 Order of precedence
4.2 Terminology, units and symbols
4.3 Preferred values of temperature, humidity and
pressure
4.4 Marking
4.4.1 Device identification
4.4.2 Device traceability
4.4.3 Packing
4.5 Categories of assessed quality
4.6 Screening
4.7 Handling
5 Quality assessment procedures
5.1 Eligibility for qualification approval
5.1.1 Primary stage of manufacture
5.2 Commercially confidential information
5.3 Formation of inspection lots
5.4 Structurally similar devices
5.5 Granting of qualification approval
5.6 Quality conformance inspection
5.6.1 Division into groups and subgroups
5.6.2 Inspection requirements
5.6.3 Supplementary procedure for reduced inspection
5.6.4 Sampling requirements for small lots
5.6.5 Certified records of released lots (CRRL)
5.6.6 Delivery of devices subjected to destructive
or non-destructive tests
5.6.7 Delayed deliveries
5.6.8 Supplementary procedure for deliveries
5.7 Statistical sampling procedures
5.7.1 AQL sampling plans
5.7.2 LTPD sampling plans
5.8 Endurance tests
5.9 Endurance tests where the failure rate is specified
5.9.1 General
5.9.2 Selection of samples
5.9.3 Failure
5.9.4 Endurance test time and sample size
5.9.5 Procedure to be used if the number of
observed failures exceeds the acceptance
number
5.10 Accelerated test procedures
5.11 Capability approval
6 Test and measurement procedures
6.1 Standard atmospheric conditions for electrical and
optical measurements
6.2 Physical examination
6.2.1 Visual examination
6.2.2 Dimensions
6.2.3 Permanence of marking
6.3 Electrical and optical measurements
6.3.1 General conditions and precautions
6.4 Environmental tests
Annexes
A (informative) Cross references index
B (informative) Examples of outline drawings of liquid crystal
display cells
C (normative) Orientation of LCD modules
D (normative) Lot tolerance percentage defective (LTPD)
sampling plans