IEC 61747-3-1:2015
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Liquid crystal display devices - Part 3-1: Liquid crystal display (LCD) cells - Blank detail specification |
IEC 60068-1:2013
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Environmental testing - Part 1: General and guidance |
IEC 60191-1:2007
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Mechanical standardization of semiconductor devices - Part 1: General rules for the preparation of outline drawings of discrete devices |
EN 61747-3-1 : 2006
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LIQUID CRYSTAL DISPLAY DEVICES - PART 3-1: LIQUID CRYSTAL DISPLAY (LCD) CELLS - BLANK DETAIL SPECIFICATION |
EN 60068-2-1:2007
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Environmental testing - Part 2-1: Tests - Test A: Cold |
ISO 2859:1974
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Sampling procedures and tables for inspection by attributes |
ISO 1101:2017
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Geometrical product specifications (GPS) — Geometrical tolerancing — Tolerances of form, orientation, location and run-out |
EN 60068-1:2014
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Environmental testing - Part 1: General and guidance |
IEC 61747-2-1:2013
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Liquid crystal display devices - Part 2-1: Passive matrix monochrome LCD modules - Blank detail specification |
EN 60749-1:2003
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Semiconductor devices - Mechanical and climatic test methods - Part 1: General |
EN 61747-4:2012
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Liquid crystal display devices - Part 4: Liquid crystal display modules and cells - Essential ratings and characteristics |
IEC 60747-10:1991
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Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits |
EN 61747-2-1:2013
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Liquid crystal display devices - Part 2-1: Passive matrix monochrome LCD modules - Blank detail specification |
IEC 60747-5:1992
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Semiconductor devices - Discrete devices and integrated circuits -Part 5: Optoelectronic devices |
IEC 60027-1:1992
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Letters symbols to be used in electrical technology - Part 1: General |
IEC 60191-2:2012 DB
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Mechanical standardization of semiconductor devices - Part 2: Dimensions |
IEC 61747-5:1998
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Liquid crystal and solid-state display devices - Part 5: Environmental, endurance and mechanical test methods |
IEC 60410:1973
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Sampling plans and procedures for inspection by attributes |
HD 323.1 : 200S2
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BASIC ENVIRONMENTAL TESTING PROCEDURES - GENERAL AND GUIDANCE |
ISO 8601:2004
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Data elements and interchange formats Information interchange Representation of dates and times |
IEC 60617-1:1985
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Graphical symbols for diagrams. Part 1: General information, general index. Cross-reference tables |
IEC 60747-1:2006+AMD1:2010 CSV
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Semiconductor devices - Part 1: General |
IEC 60749:1996+AMD1:2000+AMD2:2001 CSV
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Semiconductor devices - Mechanical and climatic test methods |
IEC 60748-1:2002
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Semiconductor devices - Integrated circuits - Part 1: General |
IEC 60068-2-1:2007
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Environmental testing - Part 2-1: Tests - Test A: Cold |
IEC 61747-4:2012
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Liquid crystal display devices - Part 4: Liquid crystal display modules and cells - Essential ratings and characteristics |
HD 245.1 : 200S3
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LETTER SYMBOLS TO BE USED IN ELECTRICAL TECHNOLOGY - GENERAL |
EN 28601 : 1992
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DATA ELEMENTS AND INTERCHANGE FORMATS - INFORMATION INTERCHANGE - REPRESENTATION OF DATES AND TIMES |
EN 61747-5:1998
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Liquid crystal and solid-state display devices - Part 5: Environmental, endurance and mechanical test methods |
IEC 60191-3:1999
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Mechanical standardization of semiconductor devices - Part 3: General rules for the preparation of outline drawings of integrated circuits |
HD 323.2.1 : 200S2
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BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST A: COLD |