BS ISO 15932:2013
Current
The latest, up-to-date edition.
Microbeam analysis. Analytical electron microscopy. Vocabulary
Hardcopy , PDF
English
31-12-2013
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Foreword
Introduction
0 Scope
1 Abbreviated terms
2 Definitions of terms used in the physical basis
of AEM
3 Definitions of terms used in AEM instrumentation
4 Definitions of terms used in specimen preparation
of AEM
5 Definitions of terms used in AEM image formation
and processing
6 Definitions of terms used in AEM image
interpretation and analysis
7 Definitions of terms used in the measurement and
calibration of AEM image magnification
and resolution
8 Definitions of terms used in electron diffraction
in AEM
Bibliography
Describes terms used in the practice of AEM. It includes both general and specific concepts classified according to their hierarchy in a systematic order.
| Committee |
CII/9
|
| DevelopmentNote |
Supersedes 12/30245653 DC. (01/2014)
|
| DocumentType |
Standard
|
| Pages |
32
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
This International Standard defines terms used in the practice of AEM. It covers both general and specific concepts classified according to their hierarchy in a systematic order. This International Standard is applicable to all standardization documents relevant to the practice of AEM. In addition, some parts of this International Standard are applicable to those documents relevant to the practice of related fields (e.g. TEM, STEM, SEM, EPMA, EDX) for the definition of those terms common to them. NOTE See also the ISO online browsing platform (OBP): https://www.iso.org/obp/ui/
| Standards | Relationship |
| ISO 15932:2013 | Identical |
| ISO 1087-1:2000 | Terminology work Vocabulary Part 1: Theory and application |
| ISO 22493:2014 | Microbeam analysis — Scanning electron microscopy — Vocabulary |
| ISO 23833:2013 | Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary |
| ISO 704:2009 | Terminology work — Principles and methods |
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