BS ISO 23833:2013
Current
The latest, up-to-date edition.
Microbeam analysis. Electron probe microanalysis (EPMA). Vocabulary
Hardcopy , PDF
English
30-04-2013
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Foreword
Introduction
1 Scope
2 Abbreviated terms
3 Definitions of general terms used in electron
probe microanalysis
4 Definition of terms used to describe EPMA
instrumentation
5 Definitions of terms used in EPMA methodology
Bibliography
Describes terms used in the practices of electron probe microanalysis (EPMA).
| Committee |
CII/9
|
| DevelopmentNote |
Supersedes 03/316090 DC (01/2007)
|
| DocumentType |
Standard
|
| Pages |
38
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
This International Standard defines terms used in the practices of electron probe microanalysis (EPMA). It covers both general and specific concepts classified according to their hierarchy in a systematic order.
This International Standard is applicable to all standardization documents relevant to the practices of EPMA. In addition, some parts of this International Standard are applicable to those documents relevant to the practices of related fields (SEM, AEM, EDX, etc.) for definition of those terms common to them.
| Standards | Relationship |
| ISO 23833:2013 | Identical |
| BS PAS 134(2007) : 2007 | TERMINOLOGY FOR CARBON NANOSTRUCTURES |
| BS PAS 134(2012) : 2012 | TERMINOLOGY FOR CARBON NANOSTRUCTURES |
| BS PAS 133(2007) : 2007 | TERMINOLOGY FOR COMMON NANOSCALE MEASUREMENT AND INSTRUMENTATION |
| ISO 1087-1:2000 | Terminology work Vocabulary Part 1: Theory and application |
| ISO 18115-1:2013 | Surface chemical analysis — Vocabulary — Part 1: General terms and terms used in spectroscopy |
| ISO/IEC Guide 99:2007 | International vocabulary of metrology Basic and general concepts and associated terms (VIM) |
| ISO 18115-2:2013 | Surface chemical analysis Vocabulary Part 2: Terms used in scanning-probe microscopy |
| ISO 704:2009 | Terminology work — Principles and methods |
| ISO 15632:2012 | Microbeam analysis Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis |
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