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BS QC 001002:1991

Withdrawn

Withdrawn

A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

Rules of procedure of the IEC quality assessment system for electronic components (IECQ)

Available format(s)

Hardcopy , PDF

Withdrawn date

04-11-2009

Language(s)

English

Published date

29-11-1991

€322.53
Excluding VAT

1 Participation
1.1 Types of participation
1.2 Entry to the System
1.3 Entry as a certifying country
1.4 Entry as a full member of the Inspectorate
      Co-ordination Committee
1.5 Register of participating countries
2 Certification Management Committee (CMC)
2.1 General
2.2 The Chairman
2.3 The Vice-Chairman
2.4 The Treasurer
2.5 The Secretary
2.6 Meetings
2.7 Voting
2.8 Duties
2.9 Guidance Documents
3 Inspectorate Co-ordination Committee (ICC)
3.1 General
3.2 Composition
3.3 The Chairman
3.4 The Vice-Chairman
3.5 The Secretary
3.6 Meetings
3.7 Voting
3.8 Duties
4 Working Groups
4.1 Setting up of a Working Group
4.2 Procedures
5 Secretariat
5.1 Function
5.2 Duties
6 Financial administration
6.1 Preparation and approval of the budget and dues
6.2 Expenditures
6.3 Bank account
6.4 Auditing and circulation of accounts
7 Amendments to the Rules of Procedure of the System
8 Standards and specifications
8.1 General principles
8.2 Preparation and implementation of IEC standards
8.3 Acceptance of provisional specifications
8.4 Preparation and adoption of detail specifications
8.5 Generic and sectional specifications
9 Approval of a National Supervising Inspectorate
9.1 Description and general requirements
9.2 National Statement of Surveillance Arrangements
9.3 Examination of National Statements
9.4 Nomination of the Examination Team
9.5 Examination procedure
9.6 Reporting and decision
9.7 Changes in the National Statement
9.8 Maintenance, suspension, and withdrawal of
      approval of a National Supervising Inspectorate
10 Approval of Manufacturers, independent
      distributors and independent test laboratories
10.1 Non-discriminatory access to the System
10.2 Approval of manufacturers
10.3 Extension of manufacturer's approval
10.4 Approval of independent distributors
10.5 Approval of an independent distributor acting in
      another role
10.6 Approval of independent test laboratories
10.7 Suspension or withdrawal of approval
11 Qualification approval of components and
      capability approval
11.1 Eligibility for qualification approval
11.2 Application for qualification approval
11.3 Granting of qualification approval
11.4 Modifications likely to affect qualification
      approval
11.5 Maintenance of qualification approval
11.6 Suspension or withdrawal of qualification approval
11.7 Capability approval
12 Quality conformance inspection of components
12.1 General principles
12.2 Formation of inspection lots
12.3 Quality conformance tests
12.4 Defectives
12.5 Release or rejection of lots
12.6 Procedure in the event of failure in a periodic
      test
12.7 Use of the Mark of Conformity or Certificate of
      Conformity
12.8 Delayed delivery
13 Mark of Conformity and Certificate of Conformity
13.1 Mark of Conformity
13.2 The Certificate of Conformity for use by
      manufacturers
13.3 The Certificate of Conformity for use by
      independent distributors
13.4 Additional requirements for both forms of
      certificate
13.5 General conditions of use of the certificate
14 Certified Records of Released Lots
14.1 Introduction
14.2 General
14.3 Contents of a Certified Record of Released Lots
15 Access to the System by manufacturers,
      distributors and independent test laboratories in
      non-participating countries
15.1 Countries which are members of the IEC
15.2 Countries which are not members of the IEC
15.3 Acceptance of provisional specifications from
      countries not having a National Authorized
      Institution or National Management Institution
15.4 Body acting as a National Authorized Institution
15.5 Appeal
15.6 Finance
16 Arbitration and appeals
16.1 Arbitration and appeals procedure
16.2 Arbitration procedure
16.3 Appeals procedure
16.4 Costs
16.5 Record
Appendices
A Certificate of Conformity for use by manufacturers
B Certificate of Conformity for use by independent
      distributors

Describes the rules of procedure of the IEC Quality Assessment System for Electronic Components. Covers committees, structures, procedures, financial administration, auditing, rules and other administrative matters.

Committee
W/-
DocumentType
Standard
Pages
50
PublisherName
British Standards Institution
Status
Withdrawn

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BS QC 300601:1993 Harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification. Fixed capacitors of ceramic dielectric, class 1. Assessment level E
BS QC 790131:1992 Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Complementary MOS digital integrated circuits (series 4000 B and 4000 UB)
BS QC 790132:1992 Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Bipolar monolithic digital integrated circuit gates (excluding uncommitted logic arrays)
BS QC 300900:1991 Harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Sectional specification: fixed polystyrene film dielectric metal foil d.c. capacitors
BS QC 790130:1992 Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. HCMOS digital integrated circuits (series 54/74 HC, 54/74 HCT, 54/74 HCU)
BS 9000-3:1996 General requirements for a system for electronic components of assessed quality Specification for the national implementation of the IECQ system
BS QC 001002-2:1997 Documentation, including a new clause on regulations for technology approval schedulesRules of procedure of the IEC quality assessment system for electronic components (IECQ)
BS QC 790303:1994 Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Linear digital-to-analogue converters (DAC)
BS QC 790110:1992 Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits.Blank detail specification. Microprocessor integrated circuits
BS QC 420000:1992 Harmonized system of quality assessment for electronic components. Varistors for use in electronic equipment: generic specification
BS QC 301701:1992 Harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification. Fixed polycarbonate film dielectric metal foil d.c. capacitors. Assessment level E
BS QC 790111:1993 Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification: integrated circuit static read/write memories
BS QC 300800:1991 Harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Sectional specification for fixed tantalum chip capacitors
BS QC 390000:1992 Harmonized system of quality assessment for electronic components. Fixed film resistor networks for use in electronic equipment. Generic specification
BS QC 300101:1993 Harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification. Fixed polyethylene-terephthalate film dielectric metal foil d.c. capacitors. Assessment level E
BS QC 400202:1992 Specification for harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification. Fixed power resistors. Assessment level F
BS QC 030000:1993 Harmonized system of quality assessment for electronic components. Rectangular connectors for frequencies below 3 MHz. Generic specification. General requirements and guide for the preparation of detail specifications for connectors with assessed quality
BS QC 300301:1993 Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Fixed capacitors for use in electronic equipment. Aluminium electrolytic capacitors with non-solid electrolyte. Assessment level E
BS QC 400102:1992 Specification for harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification. Fixed low-power non-wirewound resistors. Assessment level F
BS QC 301900:1992 Harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Sectional specification for fixed multilayer ceramic chip capacitors
BS QC 720100:1991 Harmonized system of quality assessment for electronic components. Semiconductor devices. Sectional specification for optoelectronic devices
BS QC 300801:1993 Harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification. Fixed tantalum chip capacitors. Assessment level E
BS QC420100(1992) : 1992 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRIC COMPONENTS - VARISTORS FOR USE IN ELECTRONIC EQUIPMENT - SECTIONAL SPECIFICATION FOR SURGE SUPPRESSION VARISTORS
BS QC 300901:1992 Harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification. Fixed polystyrene film dielectric metal foil d.c. capacitors. Assessment level E
BS QC 790304:1994 Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Linear analogue-to-digital converters (ADC)
BS QC 390100:1992 Harmonized system of quality assessment for electronic components. Fixed film resistor networks for use in electronic equipment. Sectional specification for film resistor networks of assessed quality on the basis of the capability approval procedure
BS QC 790104:1992 Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Family specification. Complementary MOS digital integrated circuits, series 4000 B and 4000 UB
BS QC 301901:1992 Specification for harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification. Fixed multilayer ceramic chip capacitors. Assessment level E
BS QC 300701:1993 Harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification. Fixed capacitors of ceramic dielectric, class 2. Assessment level E
BS QC 960000:1992 Harmonized system of quality assessment for electronic components. Electromechanical switches for use in electronic equipment. Generic specification
BS QC 301700:1992 Harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Sectional specification for fixed polycarbonate film dielectric metal foil d.c. capacitors
BS QC 300600:1991 Harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Sectional specification for fixed capacitors of ceramic dielectric, class 1
BS QC 301801:1993 Harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification. Fixed polypropylene film dielectric metal foil d.c. capacitors. Assessment level E
BS QC 300700:1992 Harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Sectional specification for fixed capacitors of ceramic dielectric, class 2
BS QC 410200:1992 Harmonized system of quality assessment for electronic components. Potentiometers for use in electronic equipment. Sectional specification for single-turn rotary power potentiometers
BS QC 790105:1993 Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Integrated circuit fusible-link programmable bipolar read-only memories
BS QC 400302:1992 Specification for harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification. Fixed precision resistors. Assessment level F
BS QC 301800:1991 Harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Sectional specification for fixed polypropylene film dielectric metal foil d.c. capacitors

BS 5750-2:1987 Quality systems Specification for production and installation
ISO/IEC Guide 25:1990 General requirements for the competence of calibration and testing laboratories
BS 2488:1966 Schedule of preferred numbers for the resistance of resistors and the capacitance of capacitors for telecommunication equipment
BS 5750-0.1(1987) : 1987 QUALITY SYSTEMS - PRINCIPAL CONCEPTS AND APPLICATIONS - GUIDE TO SELECTION AND USE
IEC 60410:1973 Sampling plans and procedures for inspection by attributes
IEC GUIDE 102:1996 Electronic components - Specification structures for quality assessment (Qualification approval and capability approval)
IEC 60419:1973 Guide for the inclusion of lot-by-lot and periodic inspection procedures in specifications for electronic components (or parts)
BS 5750-1:1987 Quality systems Specification for design/development, production, installation and servicing
ISO 8:1977 Documentation Presentation of periodicals
BS 2011(1967) : LATEST

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