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BS QC 760201:1997

Current

Current

The latest, up-to-date edition.

Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

15-08-1997

€165.94
Excluding VAT

INTRODUCTION
1 Characteristics and conditions of use
2 Recommended methods of mounting
3 Marking
4 Ordering information
5 Certified records of released lots
6 Additional information
7 Additional or increased severities of requirements
    to those specified in the generic and/or
    sectional specification
8 Inspection requirements (see tables 2 and 3 or 4 and 5)
9 Supplement - Tables of method B
Tables
1 Where a range of circuits
2 Method A - Groups A and B - Lot-by-lot
3a Method A - Group C - Periodic tests
3b Method A - Group D - Periodic tests
4a Method B - Group A - Lot-by-lot
4b Method B - Group B - Lot-by-lot
5a Method B - Group C - Periodic tests
5b Method B - Group D - Periodic tests

Committee
EH/4
DevelopmentNote
Supersedes BS QC760201(1992) and 95/200683 DC. Also numbered as IEC 60748-22-1. To be read in conjunction with BS QC 760000(1990) and BS QC 760200(1997) (09/2003)
DocumentType
Standard
Pages
20
PublisherName
British Standards Institution
Status
Current
Supersedes

BS QC 760000:1990 Harmonized system of quality assessment for electronic components. Film and hybrid film integrated circuits. Generic specification
IEC 60748-22:1997 Semiconductor devices - Integrated circuits - Part 22: Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures
IEC 60748-20-1:1994 Semiconductor devices - Integrated circuits - Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits - Section 1: Requirements for internal visual examination
BS QC 760200:1992 Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Sectional specification for film integrated circuits and hybrid film integrated circuits: capability approval

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