BS QC750100(1986) : 1986

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HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - DISCRETE SEMICONDUCTOR DEVICES - SECTIONAL SPECIFICATION

Available format(s): Hardcopy, PDF

Language(s): English

Published date: 01-01-1986

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1 Scope
2 General
3 Quality assessment procedures
4 Test and measurement procedures
Publications referred to

Pertains to discrete semiconductor devices, excluding opto-electronic devices.

Committee	EPL/47
Development Note	Also numbered as IEC 60747-11 Supersedes 80/28890 DC AMD 7208 renumbers and supersedes BS QC 750000(1986) (08/2005) 1986 Edition Re-Issued in January 2010 & incorporates AMD 2 1996. Issue Date: 31/01/2010. (01/2010)
Document Type	Standard
ISBN
Pages
Published
Publisher	British Standards Institution
Status	Current
Supersedes	94/201366 DC : FEB 94 93/202808 DC : DRAFT MAR 1993 BS QC 750000(1986) : 1986

IEC 60749:1996+AMD1:2000+AMD2:2001 CSV	Semiconductor devices - Mechanical and climatic test methods

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1 Scope
2 General
3 Quality assessment procedures
4 Test and measurement procedures
Publications referred to

Pertains to discrete semiconductor devices, excluding opto-electronic devices.

Committee	EPL/47
Development Note	Also numbered as IEC 60747-11 Supersedes 80/28890 DC AMD 7208 renumbers and supersedes BS QC 750000(1986) (08/2005) 1986 Edition Re-Issued in January 2010 & incorporates AMD 2 1996. Issue Date: 31/01/2010. (01/2010)
Document Type	Standard
ISBN
Pages
Published
Publisher	British Standards Institution
Status	Current
Supersedes	94/201366 DC : FEB 94 93/202808 DC : DRAFT MAR 1993 BS QC 750000(1986) : 1986

IEC 60749:1996+AMD1:2000+AMD2:2001 CSV	Semiconductor devices - Mechanical and climatic test methods