CECC 00200 : 2002
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REGISTER OF FIRMS, PRODUCTS AND SERVICES APPROVED UNDER CECC CERTIFICATION SYSTEM FOR ELECTRONIC COMPONENTS
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12-01-2013
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| DocumentType |
Standard
|
| PublisherName |
Cenelec Electronic Components Committee
|
| Status |
Current
|
| BS CECC 20005(1986) : 1986 AMD 8004 | SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. BLANK DETAIL SPECIFICATION. PHOTODIODES, PHOTODIODE ARRAYS (NOT INTENDED FOR FIBRE OPTIC APPLICATIONS) |
| BS CECC 31401:1988 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fixed ceramic dielectric capacitors, dielectric class 1, for electrical shock hazard protection |
| BS CECC 90203:1985 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated analogue switching circuits |
| BS CECC 265001:1998 | Harmonized system of quality assessment for electronic components. Technology approval schedule. Film and hybrid integrated circuits |
| CEI CECC 32101-804 : 2002 | SPECIFICA DI DETTAGLIO: CONDENSATORI FISSI CERAMICI MULTISTRATO A MONTAGGIO SUPERFICIALE, CLASSE 1, SOTTOCLASSE 1B, TIPO CG, CATEGORIA CLIMATICA 55/125/56, LIVELLO EZ |
| BS CECC 30702:1993 | Specification for harmonized system for quality assessment for electronic components. Blank detail specification. Fixed capacitors of ceramic dielectric, class 2. (Assessment level P. Telecom level) |
| I.S. EN 125000:1999 | CORES MADE FROM FERRITE MATERIALS (GENERIC SPECIFICATION) |
| BS CECC 30301 024:1981 | Harmonized detail specification for fixed aluminium electrolytic capacitors (long-life grade). Non-solid electrolyte. Cylindrical, polar insulated metallic case, clamp or stud mounting screw terminations. Full plus additional assessment level |
| BS EN 160200-1:1998 | Harmonized system of quality assessment for electronic components. Sectional specification. Microwave modular electronic units of assessed quality Capability approval procedure |
| CEI CECC 32101-805 : 2002 | DETAIL SPECIFICATION: FIXED MULTILAYER CERAMIC SURFACE MOUNTING CAPACITORS, CLASS 2, SUB-CLASSES 2C1 AND 2R1, CLIMATIC CATEGORY 55/125/56, ASSESSMENT LEVEL EZ, WITH FAILURE RATE LEVELS |
| DEFSTAN 59-44(PT8)SEC2/1(1981) : 1981 | CAPACITORS, FIXED, OF ASSESSED QUALITY - PART 8: CAPACITORS, FIXED, ELECTROLYTIC-SOLID ELECTROLYTE, ALUMINIUM - SECTION 2: LIST OF ITEMS CONFORMING TO CECC 30302-001 |
| DEFSTAN 59-30(PT1)/4(1980) : 1980 AMD 1 | RESISTORS, FIXED, OF ASSESSED QUALITY - PART 1: RESISTORS, FIXED, NON-WIREWOUND, INSULATED, MEDIUM STABILITY - MULTIPLE RATING FULL ASSESSMENT |
| EN 125000:1997 | Generic Specification: Cores made of ferrite materials |
| EN 140400:2003 | Sectional specification: Fixed low power surface mount (SMD) resistors |
| EN 160100 : 1997 | CAPABILITY APPROVAL OF MANUFACTURERS OF PRINTED BOARD ASSEMBLIES OFASSESSED QUALITY (SECTIONAL SPECIFICATION) |
| EN 196500:1993/A1:2001 | SECTIONAL SPECIFICATION: MEMBRANE SWITCHES INCLUDING BLANK DETAIL SPECIFICATION EN 196501 |
| BS CECC 90000:1991 | Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits |
| BS CECC 90202:1990 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated operational amplifiers |
| BS EN 150009:1993 | Harmonized system of quality assessment for electronic components. Blank detail specification: case-rated rectifier diodes |
| I.S. EN 160200-1:1998 | MICROWAVE MODULAR ELECTRONIC UNITS OF ASSESSED QUALITY - PART 1: CAPABILITY APPROVAL PROCEDURE (SECTIONAL SPECIFICATION) |
| BS CECC 00114-5:1993 | Rule of procedure 14. Quality assessment procedures Process approval of specialist contractors within the electronic components industry |
| BS EN 190101:1994 | Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL circuits series 54, 64, 74, 84 |
| BS EN 150008:1993 | Harmonized system of quality assessment for electronic components. Blank detail specification: ambient-rated rectifier diodes |
| DEFSTAN 59-30(PT2)/2(1978) : 1978 AMD 2 | RESISTORS, FIXED, OF ASSESSED QUALITY - PART 2: RESISTORS, FIXED, NON-WIREWOUND, INSULATED, LOAD LIFE STABILITY 0.5 PER CENT MAXIMUM FULL ASSESSMENT |
| BS EN 169000:1993 | Harmonized system of quality assessment for electronic components. Generic specification. Quartz crystal controlled oscillators |
| BS EN 196403:2000 | Harmonized systems of quality assessment for electronic components. Blank detail specification: push button switches. Assessment level Y |
| BS CECC 90201:1984 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated voltage regulators |
| BS CECC 96300:1988 | Harmonized system of quality assessment for electronic components. Sectional specification including blank detail specification: sensitive switches |
| BS EN 160100:1998 | Harmonized system of quality assessment for electronic components. Sectional specification: capability approval of manufacturers of printed board assemblies of assessed quality |
| BS CECC 30401 033:1981 | Harmonized detail specification for fixed metallized polyethylene terephthalate film dielectric d.c. capacitors (long-life grade). Rectangular insulated non-metallic case, rigid radial terminations. Full assessment level |
| BS CECC 20003(1986) : 1986 AMD 8002 | SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. BLANK DETAIL SPECIFICATION. PHOTOTRANSISTORS,PHOTODARLINGTON TRANSISTORS,PHOTOTRANSISTOR ARRAYS |
| BS CECC 96100:1988 | Harmonized system of quality assessment for electronic components. Sectional specification including blank detail specification: rotary switches |
| BS CECC 00111-0:1994 | Rule of Procedure 11. Specifications An introduction to the types of specifications applicable within the CECC system |
| DEFSTAN 59-44(PT8)SEC1/1(1981) : 1981 | CAPACITORS, FIXED, OF ASSESSED QUALITY - PART 8: CAPACITORS, FIXED, ELECTROLYTIC-SOLID ELECTROLYTE, ALUMINIUM - SECTION 1: SECTIONAL REQUIREMENTS AND INDEX TO SECTIONS |
| I.S. 1107:1991 | LEAD SCREW ACTUATED PRESET POTENTIOMETERS - SQUARE FORMS (DETAIL SPECIFICATION) |
| I.S. 1128:1991 | ELECTROMECHANICAL ALL-OR NOTHING RELAYS POLARIZED MONOSTABLE HERMETICALLY SEALED GENERAL PURPOSE RELAYS (DETAIL SPECIFICATION) |
| BS CECC 30801:1993 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Tantalum surface mounting capacitors |
| BS CECC 30501:1993 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Fixed metallized polycarbonate film dielectric capacitors for direct current |
| BS CECC 30800:1991 | Harmonized system of quality assessment for electronic components. Sectional specification: tantalum surface mounting capacitors |
| BS CECC 90201:1990 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated voltage regulators |
| BS CECC 30202:1988 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fixed tantalum capacitors with non-solid electrolyte, porous anode (sub-family 2) |
| BS CECC 30701:1993 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Fixed capacitors of ceramic dielectric, class 2. (Assessment level E) |
| BS CECC 90301:1985 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated line transmitters and receivers |
| BS CECC 200025:1998 | Harmonized system of quality assessment for electronic components. Process assessment schedule: printed board assembly facilities |
| DEFSTAN 59-30(PT0)/2(1991) : 1991 | RESISTORS OF ASSESSED QUALITY, SELECTION AND PROCUREMENT - PART 0: GENERAL GUIDANCE AND REQUIREMENTS |
| BS CECC 96200:1988 | Harmonized system of quality assessment for electronic components. Sectional specification including blank detail specification: lever switches |
| 96/205775 DC : 0 | BS CECC 210003 - TECHNOLOGY APPROVAL SCHEDULE FOR PRINTED BOARDS |
| CEI CECC 200025 : 2000 | PROCESS ASSESSMENT SCHEDULE: PRINTED BOARD ASSEMBLY FACILITIES |
| BS EN 196103:2000 | Blank detail specification: Rotary switches. Assessment level Y |
| BS EN 196500:1993 | Harmonized system of quality assessment for electronic components. Sectional specification. Membrane switches including blank detail specification EN 196501 |
| BS CECC 00111-7:1994 | Rule of Procedure 11. Specifications Regulations for component specifications and assessment specifications |
| BS EN 120000:1996 | Harmonized system of quality assessment for electronic components. General specification: semiconductor optoelectronic and liquid crystal devices |
| BS CECC 90202:1985 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated operational amplifiers |
| BS EN 125000:1998 | Harmonized system of quality assessment for electronic components. Generic specification: cores made of ferrite materials |
| BS CECC20006(1988) : 1988 AMD 8005 | SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. BLANK DETAIL SPECIFICATION. PIN PHOTODIODES FOR FIBRE OPTIC APPLICATIONS |
| BS EN 140400:2003 | Harmonized system of quality assessment for electronic components. Sectional specification. Fixed low power surface mount (SMD) resistors |
| I.S. EN 160201:1998 | MICROWAVE MODULAR ELECTRONIC UNITS OF ASSESSED QUALITY - CAPABILITY APPROVAL (BLANK DETAIL SPECIFICATION) |
| I.S. EN 140400:2004 | SECTIONAL SPECIFICATION: FIXED LOW POWER SURFACE MOUNTING (SMD) RESISTORS |
| I.S. EN 141101:1994 | LEAD-SCREW ACTUATED AND ROTARY PRESET POTENTIOMETERS (BLANK DETAIL SPECIFICATION) |
| EN 141101:1992 | Blank Detail Specification: Lead-screw actuated and rotary preset potentiometers |
| PD 3542:1991 | The role of standards in company quality management |
| BS CECC 00114-3:1993 | Rule of procedure 14. Quality assessment procedures Capability approval of an electronic component manufacturing activity |
| BS CECC 31501:1988 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fixed ceramic capacitors of dielectric class 2 for electrical shock hazard protection |
| 02/203178 DC : 0 | PREN 140101-806 - DETAIL SPECIFICATION - FIXED LOW POWER NON-WIRE WOUND RESISTORS - METAL FILM RESISTORS ON HIGH GRADE CERAMIC, CONFORMAL COATED OR MOLDED, AXIAL OR PREFORMED LEADS - ASSESSMENT LEVEL Z - VERSION A: WITH 100-%-TEST - VERSION E: WITH FAILURE RATE LEVEL AND 100-%-TEST - STABILITY CLASSES 0,05; 0,1; 0,25; 0,5; 1; 2 |
| BS EN 150015:1993 | Harmonized system of quality assessment for electronic components. Blank detail specification: unidirectional transient overvoltage suppressor diodes |
| BS CECC 96400:1988 | Harmonized system of quality assessment for electronic components. Sectional specification including blank detail specification: push-button switches |
| 96/205776 DC : DRAFT MAY 1996 | BS CECC 200021 - PROCESS ASSESSMENT SCHEDULE FOR MASS LAMINATION PANELS |
| BS EN 190103:1994 | Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL low power SCHOTTKY, circuits, series 54LS, 64LS, 74LS, 84LS |
| BS EN 123000:1992 | Harmonized system of quality assessment for electronic components. Generic specification: printed boards |
| BS CECC 42201:1988 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Surge suppression varistors |
| BS CECC 299001:1999 | Technology approval schedule. Manufacture of electrical connectors |
| DEFSTAN 59-62(PT5)/1(1983) : 1983 | MICROCIRCUITS ELECTRONIC (INTEGRATED CIRCUITS) - PART 5: ANALOGUE SWITCH/MULTIPLEXERS |
| DIN 45910-125:1992-04 | HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS; DETAIL SPECIFICATION: NON-POLAR ALUMINIUM ELECTROLYTIC CAPACITORS WITH NON-SOLID ELECTROLYTE DC 40 TO 100 V (SUITABLE TO VAC LOAD WITHOUT USING A POLARIZING POTENTIAL), GENERAL PURPOSE GRADE, CYLINDRICAL METAL CASE WITH INSULATION SLEEVE, AXIAL WIRE LEADS, CLIMATIC CATEGORY 40/085/056 |
| DEFSTAN 59-30(PT3)/2(1978) : 1978 | RESISTORS, FIXED, OF ASSESSED QUALITY - PART 3: RESISTORS, FIXED, WIREWOUND, NON-INSULATED, POWER (2.5 TO 12 WATTS) FULL ASSESSMENT |
| EN 160200-1 : 1997 | MICROWAVE MODULAR ELECTRONIC UNITS OF ASSESSED QUALITY - PART 1: CAPABILITY APPROVAL PROCEDURE (SECTIONAL SPECIFICATION) |
| EN 16602-60-12:2014 | Space product assurance - Design, selection, procurement and use of die form monolithic microwave integrated circuits (MMICs) |
| DEFSTAN 59-30(PT4)/2(1980) : 1980 | RESISTORS, FIXED, OF ASSESSED QUALITY - PART 4: RESISTORS, FIXED, NON-WIREWOUND, INSULATED, LOW POWER FULL ASSESSMENT |
| CECC 200025 : 1998 | PROCESS ASSESSMENT SCHEDULE: PRINTED BOARD ASSEMBLY FACILITIES |
| I.S. EN 16602-60-12:2014 | SPACE PRODUCT ASSURANCE - DESIGN, SELECTION, PROCUREMENT AND USE OF DIE FORM MONOLITHIC MICROWAVE INTEGRATED CIRCUITS (MMICS) |
| BS EN 111101:1996 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Display storage tubes |
| BS EN 114001:1997 | Harmonized system of quality assessment for electronic components. Blank detail specification: photomultiplier tubes |
| BS CECC 90114:1990 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: programmable logic arrays (PLA) |
| BS EN 150014:1997 | Harmonized system of quality assessment for electronic components. Blank detail specification: Thyristor diodes, transient overvoltage suppressors |
| BS CECC 30401 023:1979 | Harmonized detail specification for fixed metallized polyethylene terephthalate film dielectric d.c. capacitors. Rectangular insulated non-metallic case, rigid radial terminations. Full assessment level |
| BS EN 16602-60-12:2014 | Space product assurance. Design, selection, procurement and use of die form monolithic microwave integrated circuits (MMICs) |
| BS EN 160201:1998 | Harmonized system of quality assessment for electronic components. Blank detail specification. Microwave modular electronic units of assessed quality. Capability approval |
| DEFSTAN 59-36/4(1990) : 1990 | ELECTRONIC & ASSOCIATED ELECTRICAL COMPONENTS FOR DEFENCE PURPOSES - PROCEDURE FOR THE SELECTION & SPECIFICATION OF ELECTRONIC & ASSOCIATED ELECTRICAL COMPONENTS FOR USE IN DEFENCE EQUIPMENT |
| BS CECC 41101-007:1985 | Harmonized blank detail specification for lead screw actuated non-wirewound preset potentiometers. Square form, container sealed, actuating device insulated from resistive element, slipping clutch at each end of travel, rigid terminations. Assessment level S. |
| I.S. EN 160100:1998 | CAPABILITY APPROVAL OF MANUFACTURERS OF PRINTED BOARD ASSEMBLIES OFASSESSED QUALITY (SECTIONAL SPECIFICATION) |
| EN 160201 : 1997 | MICROWAVE MODULAR ELECTRONIC UNITS OF ASSESSED QUALITY - CAPABILITY APPROVAL (BLANK DETAIL SPECIFICATION) |
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