BS EN 60068-2-6:2008
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ENVIRONMENTAL TESTING - PART 2-6: TESTS - TEST FC: VIBRATION (SINUSOIDAL) |
BS 6493-1.2:1984
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SEMICONDUCTOR DEVICES - DISCRETE DEVICES - RECOMMENDATIONS FOR RECTIFIER DIODES |
BS EN 60068-1:2014 (published 2014-03)
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Environmental testing General and guidance |
IEC 60270:2000+AMD1:2015 CSV
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High-voltage test techniques - Partial discharge measurements |
CECC 00109 : 1974
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CECC RULES OF PROCEDURE: RP 9: CERTIFIED TESTS RECORDS |
HD 323.2.20 : 200S3
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BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST T - SOLDERING |
IEC 60068-1:2013
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Environmental testing - Part 1: General and guidance |
BS EN 60068-2-27:2009
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ENVIRONMENTAL TESTING - PART 2-27: TESTS - TEST EA AND GUIDANCE: SHOCK |
IEC 60068-2-27:2008
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Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock |
IEC 60134:1961
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Rating systems for electronic tubes and valves and analogous semiconductor devices |
EN 60065:2014/AC:2017-01
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AUDIO, VIDEO AND SIMILAR ELECTRONIC APPARATUS - SAFETY REQUIREMENTS (IEC 60065:2014/COR2:2016) |
IEC 60068-2-20:2008
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Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads |
IEC 60794-1:1996
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Optical fibre cables - Part1: Generic specification (Revision to IEC 794-1) |
IEC 60793-2:2015
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Optical fibres - Part 2: Product specifications - General |
BS CECC 00109:1991
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RULE OF PROCEDURE 9 - CERTIFIED TEST RECORDS |
BS 6493-1.1:1984
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SEMICONDUCTOR DEVICES - DISCRETE DEVICES - GENERAL |
EN 60068-2-2:2007
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ENVIRONMENTAL TESTING - PART 2-2: TESTS - TEST B: DRY HEAT |
BS 6001-1:1991
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SAMPLING PROCEDURES FOR INSPECTION BY ATTRIBUTES - SPECIFICATION FOR SAMPLING PLANS BY ACCEPTABLE QUALITY LEVEL (AQL) FOR LOT-BY-LOT INSPECTION |
IEC 60068-2-21:2006
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Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices |
CECC 00100 : 1988
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BASIC RULES - TO BE USED IN CONNECTION WITH THE INTERNAL REGULATIONS OF THE FEN e.V |
EN 60068-1:2014
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ENVIRONMENTAL TESTING - PART 1: GENERAL AND GUIDANCE (IEC 60068-1:2013) |
IEC 60793-1:1992
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Optical fibres - Part 1: Generic specification |
BS 2754(1976) : 1976
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MEMORANDUM - CONSTRUCTION OF ELECTRICAL EQUIPMENT FOR PROTECTION AGAINST ELECTRIC SHOCK |
BS CECC00014(1988) : 1988 AMD 7195
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HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BASIC SPECIFICATION: CECC ASSESSED PROCESS AVERAGE PROCEDURE (60 % CONFIDENCE LIMIT) |
HD 323.2.14 : 200S2
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BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST N: OF TEMPERATURE |
EN 60068-2-7 : 1993
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ENVIRONMENTAL TESTING - TESTS - TEST GA AND GUIDANCE: ACCELERATION, STEADY STATE |
IEC 60693:1980
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Dimensions of optical fibres |
IEC 60747-5:1992
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Semiconductor devices - Discrete devices and integrated circuits -Part 5: Optoelectronic devices |
BS 2011-2.1Z/AD:1977
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ENVIRONMENTAL TESTING - TESTS - TEST Z/AD - COMPOSITE TEMPERATURE/HUMIDITY |
BS 2011-2.1N:1985
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ENVIRONMENTAL TESTING - TESTS - TEST N: CHANGE OF TEMPERATURE |
BS 2045:1965
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PREFERRED NUMBERS |
IEC 60306-1:1969
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Measurement of photosensitive devices - Part 1: Basic recommendations |
IEC 60068-2-38:2009
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Environmental testing - Part 2-38: Tests - Test Z/AD: Composite temperature/humidity cyclic test |
IEC 60410:1973
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Sampling plans and procedures for inspection by attributes |
HD 323.2.30 : 200S3
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BASIC ENVIRONMENTAL TESTING PROCEDURES - PART 2: TESTS - TEST DB AND GUIDANCE: DAMP HEAT, CYCLIC (12 + 12-HOUR CYCLE) |
EN 60068-2-27:2009
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ENVIRONMENTAL TESTING - PART 2-27: TESTS - TEST EA AND GUIDANCE: SHOCK |
HD 323.2.3 : 200S2
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BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST CA - DAMP HEAT, STEADY STATE |
BS EN 60068-2-7:1993
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ENVIRONMENTAL TESTING - TEST METHODS - TEST GA AND GUIDANCE - ACCELERATION, STEADY STATE |
CECC 43000 : 1982
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GENERIC SPECIFICATION: THERMISTORS |
IEC 60068-2-3:1969
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Basic environmental testing procedures - Part 2-3: Tests - Test Ca: Damp heat, steady state |
EN 60068-2-17 : 1994
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BASIC ENVIRONMENTAL TESTING - TEST Q: SEALING |
IEC 60068-2-17:1994
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Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing |
CECC 20000 : 82 AMD 3
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GENERIC SPECIFICATION: SEMICONDUCTOR OPTOELECTRONIC AND LIQUID CRYSTAL DEVICES |
IEC 60068-2-2:2007
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Environmental testing - Part 2-2: Tests - Test B: Dry heat |
IEC 60747-1:2006+AMD1:2010 CSV
|
Semiconductor devices - Part 1: General |
IEC 60148B:1979
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Supplement B - Letter symbols for semiconductor devices and integrated microcircuits |
ISO 2015:1976
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Numbering of weeks |
BS EN 60068-2-17:1995
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ENVIRONMENTAL TESTING - TEST METHODS - TEST Q - SEALING |
CECC 00200 : 2002
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REGISTER OF FIRMS, PRODUCTS AND SERVICES APPROVED UNDER CECC CERTIFICATION SYSTEM FOR ELECTRONIC COMPONENTS |
EN 60068-2-6:2008
|
ENVIRONMENTAL TESTING - PART 2-6: TESTS - TEST FC: VIBRATION (SINUSOIDAL) |
ISO 497:1973
|
Guide to the choice of series of preferred numbers and of series containing more rounded values of preferred numbers |
IEC 60148A:1974
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First supplement - Letter symbols for semiconductor devices and integrated microcircuits |
BS 3934(1965) : 1965
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SPECIFICATION FOR DIMENSIONS OF SEMICONDUCTOR DEVICES AND INTEGRATED ELECTRONIC CIRCUITS |
BS EN 60065 : 2014
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AUDIO, VIDEO AND SIMILAR ELECTRONIC APPARATUS - SAFETY REQUIREMENTS (IEC 60065:2014, MODIFIED) |
IEC 60148:1969
|
Letter symbols for semiconductor devices and integrated microcircuits |
HD 323.2.21 : 200S3
|
BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST U: ROBUSTNESS OF TERMINATIONS AND INTEGRAL MOUNTING DEVICES |
IEC 60068-2-14:2009
|
Environmental testing - Part 2-14: Tests - Test N: Change of temperature |
CECC 00007 : 1978
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BASIC SPECIFICATION: SAMPLING PLANS AND PROCEDURES FOR INSPECTION BY ATTRIBUTES |
BS EN ISO 9000:2015
|
Quality management systems. Fundamentals and vocabulary |
IEC 60747-2:2016
|
Semiconductor devices - Part 2: Discrete devices - Rectifier diodes |
HD 323.2.38 : 200S1
|
BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TESTS Z/AD: COMPOSITE TEMPERATURE/HUMIDITY CYCLIC TEST |
BS 2011-2.1T:1981
|
ENVIRONMENTAL TESTING - TESTS - TEST T - SOLDERING |
IEC 60068-2-30:2005
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Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle) |