BS 5555:1993
|
Specification for SI units and recommendations for the use of their multiples and of certain other units |
BS EN 60068-2-6:2008
|
Environmental testing Tests. Test Fc. Vibration (sinusoidal) |
BS 6493-1.2:1984
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Semiconductor devices. Discrete devices Recommendations for rectifier diodes |
BS EN 60068-1:2014
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Environmental testing General and guidance |
IEC 60270:2000+AMD1:2015 CSV
|
High-voltage test techniques - Partial discharge measurements |
CECC 00109 : 1974
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CECC RULES OF PROCEDURE: RP 9: CERTIFIED TESTS RECORDS |
HD 323.2.20 : 200S3
|
BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST T - SOLDERING |
IEC 60068-1:2013
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Environmental testing - Part 1: General and guidance |
BS EN 60068-2-27:2009
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Environmental testing Tests. Test Ea and guidance. Shock |
IEC 60068-2-27:2008
|
Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock |
IEC 60134:1961
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Rating systems for electronic tubes and valves and analogous semiconductor devices |
EN 60065:2014/AC:2017-01
|
AUDIO, VIDEO AND SIMILAR ELECTRONIC APPARATUS - SAFETY REQUIREMENTS (IEC 60065:2014/COR2:2016) |
IEC 60068-2-20:2008
|
Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads |
IEC 60794-1:1996
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Optical fibre cables - Part1: Generic specification (Revision to IEC 794-1) |
IEC 60793-2:2015
|
Optical fibres - Part 2: Product specifications - General |
BS CECC 00109:1991
|
Rule of Procedure 9. Certified test records |
BS 6493-1.1:1984
|
Semiconductor devices. Discrete devices General |
EN 60068-2-2:2007
|
Environmental testing - Part 2-2: Tests - Test B: Dry heat |
BS 6001-1:1991
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Sampling procedures for inspection by attributes Specification for sampling plans indexed by acceptable quality level (AQL) for lot-by-lot inspection |
IEC 60068-2-21:2006
|
Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices |
CECC 00100 : 1988
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BASIC RULES - TO BE USED IN CONNECTION WITH THE INTERNAL REGULATIONS OF THE FEN e.V |
EN 60068-1:2014
|
Environmental testing - Part 1: General and guidance |
IEC 60793-1:1992
|
Optical fibres - Part 1: Generic specification |
BS 2754(1976) : 1976
|
MEMORANDUM - CONSTRUCTION OF ELECTRICAL EQUIPMENT FOR PROTECTION AGAINST ELECTRIC SHOCK |
BS CECC00014(1988) : 1988 AMD 7195
|
HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BASIC SPECIFICATION: CECC ASSESSED PROCESS AVERAGE PROCEDURE (60 % CONFIDENCE LIMIT) |
HD 323.2.14 : 200S2
|
BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST N: OF TEMPERATURE |
EN 60068-2-7:1993
|
Environmental testing - Part 2: Tests - Test Ga: Acceleration, steady state |
IEC 60693:1980
|
Dimensions of optical fibres |
IEC 60747-5:1992
|
Semiconductor devices - Discrete devices and integrated circuits -Part 5: Optoelectronic devices |
BS 2011-2.1Z/AD:1977
|
Environmental testing. Tests Tests Z/AD. Composite temperature/humidity cyclic test |
BS 2011-2.1N:1985
|
Environmental testing. Tests Test N. Change of temperature |
BS 2045:1965
|
Preferred numbers |
IEC 60306-1:1969
|
Measurement of photosensitive devices - Part 1: Basic recommendations |
IEC 60068-2-38:2009
|
Environmental testing - Part 2-38: Tests - Test Z/AD: Composite temperature/humidity cyclic test |
IEC 60410:1973
|
Sampling plans and procedures for inspection by attributes |
HD 323.2.30 : 200S3
|
BASIC ENVIRONMENTAL TESTING PROCEDURES - PART 2: TESTS - TEST DB AND GUIDANCE: DAMP HEAT, CYCLIC (12 + 12-HOUR CYCLE) |
EN 60068-2-27:2009
|
Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock |
HD 323.2.3 : 200S2
|
BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST CA - DAMP HEAT, STEADY STATE |
BS EN 60068-2-7:1993
|
Environmental testing. Test methods Test Ga and guidance. Acceleration, steady state |
CECC 43000 : 1982
|
GENERIC SPECIFICATION: THERMISTORS |
IEC 60068-2-3:1969
|
Basic environmental testing procedures - Part 2-3: Tests - Test Ca: Damp heat, steady state |
EN 60068-2-17:1994
|
Environmental testing - Part 2: Tests - Test Q: Sealing |
IEC 60068-2-17:1994
|
Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing |
CECC 20000 : 82 AMD 3
|
GENERIC SPECIFICATION: SEMICONDUCTOR OPTOELECTRONIC AND LIQUID CRYSTAL DEVICES |
IEC 60068-2-2:2007
|
Environmental testing - Part 2-2: Tests - Test B: Dry heat |
IEC 60747-1:2006+AMD1:2010 CSV
|
Semiconductor devices - Part 1: General |
IEC 60148B:1979
|
Supplement B - Letter symbols for semiconductor devices and integrated microcircuits |
ISO 2015:1976
|
Numbering of weeks |
BS EN 60068-2-17:1995
|
Environmental testing. Test methods Test Q. Sealing |
CECC 00200 : 2002
|
REGISTER OF FIRMS, PRODUCTS AND SERVICES APPROVED UNDER CECC CERTIFICATION SYSTEM FOR ELECTRONIC COMPONENTS |
EN 60068-2-6:2008
|
Environmental testing - Part 2-6: Tests - Test Fc: Vibration (sinusoidal) |
ISO 497:1973
|
Guide to the choice of series of preferred numbers and of series containing more rounded values of preferred numbers |
IEC 60148A:1974
|
First supplement - Letter symbols for semiconductor devices and integrated microcircuits |
BS 3934:1965
|
Specification for dimensions of semiconductor devices and integrated electronic circuits |
BS EN 60065 : 2014
|
AUDIO, VIDEO AND SIMILAR ELECTRONIC APPARATUS - SAFETY REQUIREMENTS (IEC 60065:2014, MODIFIED) |
IEC 60148:1969
|
Letter symbols for semiconductor devices and integrated microcircuits |
HD 323.2.21 : 200S3
|
BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST U: ROBUSTNESS OF TERMINATIONS AND INTEGRAL MOUNTING DEVICES |
IEC 60068-2-14:2009
|
Environmental testing - Part 2-14: Tests - Test N: Change of temperature |
CECC 00007 : 1978
|
BASIC SPECIFICATION: SAMPLING PLANS AND PROCEDURES FOR INSPECTION BY ATTRIBUTES |
BS EN ISO 9000:2015
|
Quality management systems. Fundamentals and vocabulary |
IEC 60747-2:2016
|
Semiconductor devices - Part 2: Discrete devices - Rectifier diodes |
HD 323.2.38 : 200S1
|
BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TESTS Z/AD: COMPOSITE TEMPERATURE/HUMIDITY CYCLIC TEST |
BS 2011-2.1T:1981
|
Environmental testing. Tests Test T. Soldering |
IEC 60068-2-30:2005
|
Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle) |