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  • BS EN 120000:1996

    Current The latest, up-to-date edition.

    HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - GENERAL SPECIFICATION: SEMICONDUCTOR OPTOELECTRONIC AND LIQUID CRYSTAL DEVICES

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date:  01-01-1996

    Publisher:  British Standards Institution

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    Table of Contents - (Show below) - (Hide below)

    Committees responsible
    National foreword
    Foreword
    PART 1: Semiconductor optoelectronic and liquid devices
    1 SCOPE
    2 GENERAL
    3 QUALITY ASSESSMENT PROCEDURES
    4 TEST AND MEASUREMENT CONDITIONS
    5 LASER MODULE RELIABILITY
    PART 2: Visual inspection of LCD and rejection criteria
    1 General
    2 Visual inspection of viewing area
    3 Seal inspection
    4 Visual inspection of contact surface
    5 Visual inspection for chipped material at the corners
       and edges of the glass plates
    6 Visual inspection of the display
    PART 3: Visual inspection requirements for opto-electronic
            semiconductor devices
    1 General
    2 Visual inspection requirements for dies
    3 Visual inspection requirements for bonded die
    4 Visual inspection requirements for packaged
       devices
    PART 4: Capability approval
    1 Introduction
    2 Terminology
    3 Procedure for granting the capability approval
    4 Capability approval maintenance procedure
    5 Procedure for reduction, extension or change of
       capability
    6 Procedure in case of deficiency in maintenance of the
       capability approval
    7 Capability manual
    8 Capability test programme
    9 Verification of capability (audit)
    10 Quality assurance of products delivered under
       capability approval
    11 Marking and ordering information
    12 Capability abstract for publication purposes
    13 Customer detail specifications
    14 Standard catalogue items detail specifications
    15 Detail specification register
    16 Handling
    17 Product safety
    PART 5: Semiconductor laser diodes, laser diode modules
            and laser diode assemblies of assessed quality -
            Capability approval
    1 General
    2 Quality assessment procedures
    3 Test and measurement procedures

    Abstract - (Show below) - (Hide below)

    Describes the terms, definitions, symbols, quality assessment procedures and test methods necessary to prepare detail specifications (DS) for semiconductor optoelectronic and liquid crystal devices in the CECC System.

    General Product Information - (Show below) - (Hide below)

    Committee EPL/47/3
    Development Note Supersedes BS CECC20000(1983) which remains current. Supersedes 93/203878 DC and 91/03056 DC. (08/2005)
    Document Type Standard
    Publisher British Standards Institution
    Status Current
    Supersedes

    Standards Referencing This Book - (Show below) - (Hide below)

    BS EN 60068-2-6:2008 ENVIRONMENTAL TESTING - PART 2-6: TESTS - TEST FC: VIBRATION (SINUSOIDAL)
    BS 6493-1.2:1984 SEMICONDUCTOR DEVICES - DISCRETE DEVICES - RECOMMENDATIONS FOR RECTIFIER DIODES
    BS EN 60068-1:2014 (published 2014-03) Environmental testing General and guidance
    IEC 60270:2000+AMD1:2015 CSV High-voltage test techniques - Partial discharge measurements
    CECC 00109 : 1974 CECC RULES OF PROCEDURE: RP 9: CERTIFIED TESTS RECORDS
    HD 323.2.20 : 200S3 BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST T - SOLDERING
    IEC 60068-1:2013 Environmental testing - Part 1: General and guidance
    BS EN 60068-2-27:2009 ENVIRONMENTAL TESTING - PART 2-27: TESTS - TEST EA AND GUIDANCE: SHOCK
    IEC 60068-2-27:2008 Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock
    IEC 60134:1961 Rating systems for electronic tubes and valves and analogous semiconductor devices
    EN 60065:2014/AC:2017-01 AUDIO, VIDEO AND SIMILAR ELECTRONIC APPARATUS - SAFETY REQUIREMENTS (IEC 60065:2014/COR2:2016)
    IEC 60068-2-20:2008 Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads
    IEC 60794-1:1996 Optical fibre cables - Part1: Generic specification (Revision to IEC 794-1)
    IEC 60793-2:2015 Optical fibres - Part 2: Product specifications - General
    BS CECC 00109:1991 RULE OF PROCEDURE 9 - CERTIFIED TEST RECORDS
    BS 6493-1.1:1984 SEMICONDUCTOR DEVICES - DISCRETE DEVICES - GENERAL
    EN 60068-2-2:2007 ENVIRONMENTAL TESTING - PART 2-2: TESTS - TEST B: DRY HEAT
    BS 6001-1:1991 SAMPLING PROCEDURES FOR INSPECTION BY ATTRIBUTES - SPECIFICATION FOR SAMPLING PLANS BY ACCEPTABLE QUALITY LEVEL (AQL) FOR LOT-BY-LOT INSPECTION
    IEC 60068-2-21:2006 Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices
    CECC 00100 : 1988 BASIC RULES - TO BE USED IN CONNECTION WITH THE INTERNAL REGULATIONS OF THE FEN e.V
    EN 60068-1:2014 ENVIRONMENTAL TESTING - PART 1: GENERAL AND GUIDANCE (IEC 60068-1:2013)
    IEC 60793-1:1992 Optical fibres - Part 1: Generic specification
    BS 2754(1976) : 1976 MEMORANDUM - CONSTRUCTION OF ELECTRICAL EQUIPMENT FOR PROTECTION AGAINST ELECTRIC SHOCK
    BS CECC00014(1988) : 1988 AMD 7195 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BASIC SPECIFICATION: CECC ASSESSED PROCESS AVERAGE PROCEDURE (60 % CONFIDENCE LIMIT)
    HD 323.2.14 : 200S2 BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST N: OF TEMPERATURE
    EN 60068-2-7 : 1993 ENVIRONMENTAL TESTING - TESTS - TEST GA AND GUIDANCE: ACCELERATION, STEADY STATE
    IEC 60693:1980 Dimensions of optical fibres
    IEC 60747-5:1992 Semiconductor devices - Discrete devices and integrated circuits -Part 5: Optoelectronic devices
    BS 2011-2.1Z/AD:1977 ENVIRONMENTAL TESTING - TESTS - TEST Z/AD - COMPOSITE TEMPERATURE/HUMIDITY
    BS 2011-2.1N:1985 ENVIRONMENTAL TESTING - TESTS - TEST N: CHANGE OF TEMPERATURE
    BS 2045:1965 PREFERRED NUMBERS
    IEC 60306-1:1969 Measurement of photosensitive devices - Part 1: Basic recommendations
    IEC 60068-2-38:2009 Environmental testing - Part 2-38: Tests - Test Z/AD: Composite temperature/humidity cyclic test
    IEC 60410:1973 Sampling plans and procedures for inspection by attributes
    HD 323.2.30 : 200S3 BASIC ENVIRONMENTAL TESTING PROCEDURES - PART 2: TESTS - TEST DB AND GUIDANCE: DAMP HEAT, CYCLIC (12 + 12-HOUR CYCLE)
    EN 60068-2-27:2009 ENVIRONMENTAL TESTING - PART 2-27: TESTS - TEST EA AND GUIDANCE: SHOCK
    HD 323.2.3 : 200S2 BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST CA - DAMP HEAT, STEADY STATE
    BS EN 60068-2-7:1993 ENVIRONMENTAL TESTING - TEST METHODS - TEST GA AND GUIDANCE - ACCELERATION, STEADY STATE
    CECC 43000 : 1982 GENERIC SPECIFICATION: THERMISTORS
    IEC 60068-2-3:1969 Basic environmental testing procedures - Part 2-3: Tests - Test Ca: Damp heat, steady state
    EN 60068-2-17 : 1994 BASIC ENVIRONMENTAL TESTING - TEST Q: SEALING
    IEC 60068-2-17:1994 Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing
    CECC 20000 : 82 AMD 3 GENERIC SPECIFICATION: SEMICONDUCTOR OPTOELECTRONIC AND LIQUID CRYSTAL DEVICES
    IEC 60068-2-2:2007 Environmental testing - Part 2-2: Tests - Test B: Dry heat
    IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General
    IEC 60148B:1979 Supplement B - Letter symbols for semiconductor devices and integrated microcircuits
    ISO 2015:1976 Numbering of weeks
    BS EN 60068-2-17:1995 ENVIRONMENTAL TESTING - TEST METHODS - TEST Q - SEALING
    CECC 00200 : 2002 REGISTER OF FIRMS, PRODUCTS AND SERVICES APPROVED UNDER CECC CERTIFICATION SYSTEM FOR ELECTRONIC COMPONENTS
    EN 60068-2-6:2008 ENVIRONMENTAL TESTING - PART 2-6: TESTS - TEST FC: VIBRATION (SINUSOIDAL)
    ISO 497:1973 Guide to the choice of series of preferred numbers and of series containing more rounded values of preferred numbers
    IEC 60148A:1974 First supplement - Letter symbols for semiconductor devices and integrated microcircuits
    BS 3934(1965) : 1965 SPECIFICATION FOR DIMENSIONS OF SEMICONDUCTOR DEVICES AND INTEGRATED ELECTRONIC CIRCUITS
    BS EN 60065 : 2014 AUDIO, VIDEO AND SIMILAR ELECTRONIC APPARATUS - SAFETY REQUIREMENTS (IEC 60065:2014, MODIFIED)
    IEC 60148:1969 Letter symbols for semiconductor devices and integrated microcircuits
    HD 323.2.21 : 200S3 BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST U: ROBUSTNESS OF TERMINATIONS AND INTEGRAL MOUNTING DEVICES
    IEC 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature
    CECC 00007 : 1978 BASIC SPECIFICATION: SAMPLING PLANS AND PROCEDURES FOR INSPECTION BY ATTRIBUTES
    BS EN ISO 9000:2015 Quality management systems. Fundamentals and vocabulary
    IEC 60747-2:2016 Semiconductor devices - Part 2: Discrete devices - Rectifier diodes
    HD 323.2.38 : 200S1 BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TESTS Z/AD: COMPOSITE TEMPERATURE/HUMIDITY CYCLIC TEST
    BS 2011-2.1T:1981 ENVIRONMENTAL TESTING - TESTS - TEST T - SOLDERING
    IEC 60068-2-30:2005 Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle)
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