BS CECC 20005(1986) : 1986 AMD 8004
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SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. BLANK DETAIL SPECIFICATION. PHOTODIODES, PHOTODIODE ARRAYS (NOT INTENDED FOR FIBRE OPTIC APPLICATIONS) |
BS CECC 31401:1988
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SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION: FIXED CERAMIC DIELECTRIC CAPACITORS, DIELECTRIC CLASS 1, FOR ELECTRICAL SHOCK HAZARD PROTECTION |
BS CECC 90203:1985
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SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION: INTEGRATED ANALOGUE SWITCHING CIRCUITS |
BS CECC 265001:1998
|
HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - TECHNOLOGY APPROVAL SCHEDULE - FILM AND HYBRID INTEGRATED CIRCUITS |
CEI CECC 32101-804 : 2002
|
SPECIFICA DI DETTAGLIO: CONDENSATORI FISSI CERAMICI MULTISTRATO A MONTAGGIO SUPERFICIALE, CLASSE 1, SOTTOCLASSE 1B, TIPO CG, CATEGORIA CLIMATICA 55/125/56, LIVELLO EZ |
BS CECC 30702:1993
|
|
I.S. EN 125000:1999
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CORES MADE FROM FERRITE MATERIALS (GENERIC SPECIFICATION) |
BS CECC 30301 024:1981
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HARMONIZED DETAIL SPECIFICATION FOR FIXED ALUMINIUM ELECTROLYTIC CAPACITORS (LONG-LIFE GRADE) - NON-SOLID ELECTROLYTE - CYLINDRICAL, POLAR INSULATED METALLIC CASE, CLAMP OR STUD MOUNTING SCREW TERMINATIONS - FULL PLUS ADDITIONAL ASSESSMENT LEVEL |
BS EN 160200-1:1998
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HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - SECTIONAL SPECIFICATION - MICROWAVE MODULAR ELECTRONIC UNITS OF ASSESSED QUALITY - PART 1: CAPABILITY APPROVAL PROCEDURE |
CEI CECC 32101-805 : 2002
|
DETAIL SPECIFICATION: FIXED MULTILAYER CERAMIC SURFACE MOUNTING CAPACITORS, CLASS 2, SUB-CLASSES 2C1 AND 2R1, CLIMATIC CATEGORY 55/125/56, ASSESSMENT LEVEL EZ, WITH FAILURE RATE LEVELS |
DEFSTAN 59-44(PT8)SEC2/1(1981) : 1981
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CAPACITORS, FIXED, OF ASSESSED QUALITY - PART 8: CAPACITORS, FIXED, ELECTROLYTIC-SOLID ELECTROLYTE, ALUMINIUM - SECTION 2: LIST OF ITEMS CONFORMING TO CECC 30302-001 |
DEFSTAN 59-30(PT1)/4(1980) : 1980 AMD 1
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RESISTORS, FIXED, OF ASSESSED QUALITY - PART 1: RESISTORS, FIXED, NON-WIREWOUND, INSULATED, MEDIUM STABILITY - MULTIPLE RATING FULL ASSESSMENT |
EN 125000:1997
|
Generic Specification: Cores made of ferrite materials |
EN 140400:2003
|
Sectional specification: Fixed low power surface mount (SMD) resistors |
EN 160100 : 1997
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CAPABILITY APPROVAL OF MANUFACTURERS OF PRINTED BOARD ASSEMBLIES OFASSESSED QUALITY (SECTIONAL SPECIFICATION) |
EN 196500:1993/A1:2001
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SECTIONAL SPECIFICATION: MEMBRANE SWITCHES INCLUDING BLANK DETAIL SPECIFICATION EN 196501 |
BS CECC 90000:1991
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HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: GENERIC SPECIFICATION: MONOLITHIC INTEGRATED CIRCUITS |
BS CECC 90202:1990
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SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION: INTEGRATED OPERATIONAL AMPLIFIERS |
BS EN 150009:1993
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HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION: CASE-RATED RECTIFIER DIODES |
I.S. EN 160200-1:1998
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MICROWAVE MODULAR ELECTRONIC UNITS OF ASSESSED QUALITY - PART 1: CAPABILITY APPROVAL PROCEDURE (SECTIONAL SPECIFICATION) |
BS CECC 00114-5:1993
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RULE OF PROCEDURE 14 - QUALITY ASSESSMENT PROCEDURES - PROCESS APPROVAL OF SPECIALIST CONTRACTORS WITHIN THE ELECTRONIC COMPONENTS INDUSTRY |
BS EN 190101:1994
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SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - FAMILY SPECIFICATION: DIGITAL INTEGRATED TTL CIRCUITS SERIES 54, 64, 74, 84 |
BS EN 150008:1993
|
HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION: AMBIENT-RATED RECTIFIER DIODES |
DEFSTAN 59-30(PT2)/2(1978) : 1978 AMD 2
|
RESISTORS, FIXED, OF ASSESSED QUALITY - PART 2: RESISTORS, FIXED, NON-WIREWOUND, INSULATED, LOAD LIFE STABILITY 0.5 PER CENT MAXIMUM FULL ASSESSMENT |
BS EN 169000:1993
|
Harmonized system of quality assessment for electronic components. Generic specification. Quartz crystal controlled oscillators |
BS EN 196403:2000
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HARMONIZED SYSTEMS OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION: PUSH BUTTON SWITCHES - ASSESSMENT LEVEL Y |
BS CECC 90201:1984
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SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION: INTEGRATED VOLTAGE REGULATORS |
BS CECC 96300:1988
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HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: SECTIONAL SPECIFICATION INCLUDING BLANK DETAIL SPECIFICATION: SENSITIVE SWITCHES |
BS EN 160100:1998
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HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - SECTIONAL SPECIFICATION: CAPABILITY APPROVAL OF MANUFACTURERS OF PRINTED BOARD ASSEMBLIES OF ASSESSED QUALITY |
BS CECC 30401 033:1981
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HARMONIZED DETAIL SPECIFICATION FOR FIXED METALLIZED POLYETHYLENE TEREPHTHALATE FILM DIELECTRIC D.C. CAPACITORS (LONG-LIFE GRADE) - RECTANGULAR INSULATED NON-METALLIC CASE, RIGID RADIAL TERMINATIONS - FULL ASSESSMENT LEVEL |
BS CECC 20003(1986) : 1986 AMD 8002
|
SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. BLANK DETAIL SPECIFICATION. PHOTOTRANSISTORS,PHOTODARLINGTON TRANSISTORS,PHOTOTRANSISTOR ARRAYS |
BS CECC 96100:1988
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HARMONIZED SYSTEM OF QUALITY ASSESSMENT OF ELECTRONIC COMPONENTS: SECTIONAL SPECIFICATION INCLUDING BLANK DETAIL SPECIFICATION: ROTARY SWITCHES |
BS CECC 00111-0:1994
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RULE OF PROCEDURE 11 - SPECIFICATIONS - AN INTRODUCTION TO THE TYPES OF SPECIFICATIONS APPLICABLE WITHIN THE CECC SYSTEM |
DEFSTAN 59-44(PT8)SEC1/1(1981) : 1981
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CAPACITORS, FIXED, OF ASSESSED QUALITY - PART 8: CAPACITORS, FIXED, ELECTROLYTIC-SOLID ELECTROLYTE, ALUMINIUM - SECTION 1: SECTIONAL REQUIREMENTS AND INDEX TO SECTIONS |
I.S. 1107:1991
|
LEAD SCREW ACTUATED PRESET POTENTIOMETERS - SQUARE FORMS (DETAIL SPECIFICATION) |
I.S. 1128:1991
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ELECTROMECHANICAL ALL-OR NOTHING RELAYS POLARIZED MONOSTABLE HERMETICALLY SEALED GENERAL PURPOSE RELAYS (DETAIL SPECIFICATION) |
BS CECC 30801:1993
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SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION - TANTALUM SURFACE MOUNTING CAPACITORS |
BS CECC 30501:1993
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SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION - FIXED METALLIZED POLYCARBONATE FILM DIELECTRIC CAPACITORS FOR DIRECT CURRENT |
BS CECC 30800:1991
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HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - SECTIONAL SPECIFICATION: TANTALUM SURFACE MOUNTING CAPACITORS |
BS CECC 90201:1990
|
SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION: INTEGRATED VOLTAGE REGULATORS |
BS CECC 30202:1988
|
SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION: FIXED TANTALUM CAPACITORS WITH NO N-SOLID ELECTROLYTE, POROUS ANODE (SUB-FAMILY 2) |
BS CECC 30701:1993
|
SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION - FIXED CAPACITORS OF CERAMIC DIELECTRIC, CLASS 2 - (ASSESSMENT LEVEL E) |
BS CECC 90301:1985
|
SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION: INTEGRATED LINE TRANSMITTERS AND RECEIVERS |
BS CECC 200025:1998
|
HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - PROCESS ASSESSMENT SCHEDULE - PRINTED BOARD ASSEMBLY FACILITIES |
DEFSTAN 59-30(PT0)/2(1991) : 1991
|
RESISTORS OF ASSESSED QUALITY, SELECTION AND PROCUREMENT - PART 0: GENERAL GUIDANCE AND REQUIREMENTS |
BS CECC 96200:1988
|
HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: SECTIONAL SPECIFICATION INCLUDING BLANK DETAIL SPECIFICATION: LEVER SWITCHES |
96/205775 DC : 0
|
BS CECC 210003 - TECHNOLOGY APPROVAL SCHEDULE FOR PRINTED BOARDS |
CEI CECC 200025 : 2000
|
PROCESS ASSESSMENT SCHEDULE: PRINTED BOARD ASSEMBLY FACILITIES |
BS EN 196103:2000
|
BLANK DETAIL SPECIFICATION: ROTARY SWITCHES - ASSESSMENT LEVEL Y |
BS EN 196500:1993
|
HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - SECTIONAL SPECIFICATION: MEMBRANE SWITCHES INCLUDING BLANK DETAIL SPECIFICATION EN 196501 |
BS CECC 00111-7:1994
|
RULE OF PROCEDURE 11 - SPECIFICATIONS - REGULATIONS FOR COMPONENT SPECIFICATIONS AND ASSESSMENT SPECIFICATIONS |
BS EN 120000:1996
|
HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - GENERAL SPECIFICATION: SEMICONDUCTOR OPTOELECTRONIC AND LIQUID CRYSTAL DEVICES |
BS CECC 90202:1985
|
SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION: INTEGRATED OPERATIONAL AMPLIFIERS |
BS EN 125000:1998
|
HARMONIZED SYSTEM OF QUALITY ASSESSMENT OF ELECTRONIC COMPONENTS - GENERIC SPECIFICATION: CORES MADE OF FERRITE MATERIALS |
BS CECC20006(1988) : 1988 AMD 8005
|
SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. BLANK DETAIL SPECIFICATION. PIN PHOTODIODES FOR FIBRE OPTIC APPLICATIONS |
BS EN 140400:2003
|
HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - SECTIONAL SPECIFICATION - FIXED LOW POWER SURFACE MOUNT (SMD) RESISTORS |
I.S. EN 160201:1998
|
MICROWAVE MODULAR ELECTRONIC UNITS OF ASSESSED QUALITY - CAPABILITY APPROVAL (BLANK DETAIL SPECIFICATION) |
I.S. EN 140400:2004
|
SECTIONAL SPECIFICATION: FIXED LOW POWER SURFACE MOUNTING (SMD) RESISTORS |
I.S. EN 141101:1994
|
LEAD-SCREW ACTUATED AND ROTARY PRESET POTENTIOMETERS (BLANK DETAIL SPECIFICATION) |
EN 141101:1992
|
Blank Detail Specification: Lead-screw actuated and rotary preset potentiometers |
PD 3542:1991
|
THE ROLE OF STANDARDS IN COMPANY QUALITY MANAGEMENT |
BS CECC 00114-3:1993
|
RULE OF PROCEDURE 14 - QUALITY ASSESSMENT PROCEDURES - CAPABILITY APPROVAL OF AN ELECTRONIC COMPONENT MANUFACTURING ACTIVITY |
BS CECC 31501:1988
|
SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION: FIXED CERAMIC CAPACITORS OF DIELECTRIC CLASS 2 FOR ELECTRICAL SHOCK HAZARD PROTECTION |
02/203178 DC : 0
|
PREN 140101-806 - DETAIL SPECIFICATION - FIXED LOW POWER NON-WIRE WOUND RESISTORS - METAL FILM RESISTORS ON HIGH GRADE CERAMIC, CONFORMAL COATED OR MOLDED, AXIAL OR PREFORMED LEADS - ASSESSMENT LEVEL Z - VERSION A: WITH 100-%-TEST - VERSION E: WITH FAILURE RATE LEVEL AND 100-%-TEST - STABILITY CLASSES 0,05; 0,1; 0,25; 0,5; 1; 2 |
BS EN 150015:1993
|
HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION: UNIDIRECTIONAL TRANSIENT OVERVOLTAGE SUPPRESSOR DIODES |
BS CECC 96400:1988
|
HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: SECTIONAL SPECIFICATION INCLUDING BLANK DETAIL SPECIFICATION: PUSH-BUTTON SWITCHES |
96/205776 DC : DRAFT MAY 1996
|
BS CECC 200021 - PROCESS ASSESSMENT SCHEDULE FOR MASS LAMINATION PANELS |
BS EN 190103:1994
|
SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - FAMILY SPECIFICATION: DIGITAL INTEGRATED TTL LOW POWER SCHOTTKY, CIRCUITS, SERIES 54LS, 64LS, 74LS, 84LS |
BS EN 123000:1992
|
HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - GENERIC SPECIFICATION: PRINTED BOARDS |
BS CECC 42201:1988
|
SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION - SURGE SUPPRESSION VARISTORS |
BS CECC 299001:1999
|
TECHNOLOGY APPROVAL SCHEDULE - MANUFACTURE OF ELECTRICAL CONNECTORS |
DEFSTAN 59-62(PT5)/1(1983) : 1983
|
MICROCIRCUITS ELECTRONIC (INTEGRATED CIRCUITS) - PART 5: ANALOGUE SWITCH/MULTIPLEXERS |
DIN 45910-125:1992-04
|
HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS; DETAIL SPECIFICATION: NON-POLAR ALUMINIUM ELECTROLYTIC CAPACITORS WITH NON-SOLID ELECTROLYTE DC 40 TO 100 V (SUITABLE TO VAC LOAD WITHOUT USING A POLARIZING POTENTIAL), GENERAL PURPOSE GRADE, CYLINDRICAL METAL CASE WITH INSULATION SLEEVE, AXIAL WIRE LEADS, CLIMATIC CATEGORY 40/085/056 |
DEFSTAN 59-30(PT3)/2(1978) : 1978
|
RESISTORS, FIXED, OF ASSESSED QUALITY - PART 3: RESISTORS, FIXED, WIREWOUND, NON-INSULATED, POWER (2.5 TO 12 WATTS) FULL ASSESSMENT |
EN 160200-1 : 1997
|
MICROWAVE MODULAR ELECTRONIC UNITS OF ASSESSED QUALITY - PART 1: CAPABILITY APPROVAL PROCEDURE (SECTIONAL SPECIFICATION) |
EN 16602-60-12:2014
|
Space product assurance - Design, selection, procurement and use of die form monolithic microwave integrated circuits (MMICs) |
DEFSTAN 59-30(PT4)/2(1980) : 1980
|
RESISTORS, FIXED, OF ASSESSED QUALITY - PART 4: RESISTORS, FIXED, NON-WIREWOUND, INSULATED, LOW POWER FULL ASSESSMENT |
CECC 200025 : 1998
|
PROCESS ASSESSMENT SCHEDULE: PRINTED BOARD ASSEMBLY FACILITIES |
I.S. EN 16602-60-12:2014
|
SPACE PRODUCT ASSURANCE - DESIGN, SELECTION, PROCUREMENT AND USE OF DIE FORM MONOLITHIC MICROWAVE INTEGRATED CIRCUITS (MMICS) |
BS EN 111101:1996
|
SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION - DISPLAY STORAGE TUBES |
BS EN 114001:1997
|
HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION: PHOTOMULTIPLIER TUBES |
BS CECC 90114:1990
|
SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION: PROGRAMMABLE LOGIC ARRAYS (PLA) |
BS EN 150014:1997
|
HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION: THYRISTOR DIODES, TRANSIENT OVERVOLTAGE SUPPRESSORS |
BS CECC 30401 023:1979
|
HARMONIZED DETAIL SPECIFICATION FOR FIXED METALLIZED POLYETHYLENE TEREPHTHALATE FILM DIELECTRIC D.C. CAPACITORS - RECTANGULAR INSULATED NON-METALLIC CASE, RIGID RADIAL TERMINATIONS - FULL ASSESSMENT LEVEL |
BS EN 16602-60-12:2014
|
SPACE PRODUCT ASSURANCE - DESIGN, SELECTION, PROCUREMENT AND USE OF DIE FORM MONOLITHIC MICROWAVE INTEGRATED CIRCUITS (MMICS) |
BS EN 160201:1998
|
HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION - MICROWAVE MODULAR ELECTRONIC UNITS OF ASSESSED QUALITY - CAPABILITY APPROVAL |
DEFSTAN 59-36/4(1990) : 1990
|
ELECTRONIC & ASSOCIATED ELECTRICAL COMPONENTS FOR DEFENCE PURPOSES - PROCEDURE FOR THE SELECTION & SPECIFICATION OF ELECTRONIC & ASSOCIATED ELECTRICAL COMPONENTS FOR USE IN DEFENCE EQUIPMENT |
BS CECC 41101-007:1985
|
|
I.S. EN 160100:1998
|
CAPABILITY APPROVAL OF MANUFACTURERS OF PRINTED BOARD ASSEMBLIES OFASSESSED QUALITY (SECTIONAL SPECIFICATION) |
EN 160201 : 1997
|
MICROWAVE MODULAR ELECTRONIC UNITS OF ASSESSED QUALITY - CAPABILITY APPROVAL (BLANK DETAIL SPECIFICATION) |