CECC 265-001 : 1998
Current
The latest, up-to-date edition.
TECHNOLOGY APPROVAL SCHEDULE: FILM AND HYBRID INTEGRATED CIRCUITS
12-01-2013
Foreword
Introduction
1 General
1.1 Scope
1.2 Related documents
1.3 Units, symbols and terminology
1.4 Standard and preferred values
1.5 Definitions
2 Definition of the circuit technology
2.1 Scope
2.2 Description of activities and flowcharts
2.3 Technical abstract
3 Circuit design
3.1 Scope
3.2 Description of activities and flowcharts
3.3 Interfaces
4 Film substrate manufacture
4.1 Scope
4.2 Description of activities and flowcharts
4.3 Materials, inspection and handling
4.4 Equipment
4.5 Rework
4.6 Validation and control of the process(es)
4.7 Subcontractors
5 Assembly
5.1 Scope
5.2 Description of activities and flowcharts
5.3 Materials, inspection and handling
5.4 Equipment
5.5 Rework
5.6 Validation and control of the process(es)
5.7 Subcontractors
6 Testing
6.1 Scope
6.2 Description of activities and flowcharts
6.3 Equipment
6.4 Test procedures
6.5 Interfaces
7 Verification
7.1 Process boundary verification
7.2 Product verification
7.3 Initial demonstration programme
8 Process characterization
8.1 Identification of process characteristics
8.2 Description of activities
9 Packaging and shipping
9.1 Description of activities and flowcharts
9.2 Interfaces
9.3 Validity of release
10 Withdrawal of technology approval
Figures
1 Example flowchart - Administration
2 Example flowchart - Design
3 Example flowchart - Film substrate manufacture
4 Example flowchart - Screen manufacture
5 Example flowchart - Component/package assembly
6 Example flowchart - Hybrid test
7 Example flowchart - Packing and Shipping
Annexes
A Example Abstract Description of Technology Approval
B Guidance on the preparation of a manufacturer's Technology Approval
Declaration Document (TADD) for Film and Hybrid Integrated Circuits
Covers the definitions, symbols, terms, test, quality system, assessment and verification methods and other requirements relevant to the design, manufacture and supply of Film & Hybrid Integrated Circuits in compliance with the general requirements of the CECC System for electronic components of assessed quality. It should be read in conjunction with EN 165000-1 - Generic Specification, which contains details on the test methods referenced herein.
Committee |
EPL/47/1
|
DocumentType |
Standard
|
PublisherName |
Cenelec Electronic Components Committee
|
Status |
Current
|
Standards | Relationship |
BS CECC 265001:1998 | Identical |
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