CECC 50000 : 86 AMD 3
Withdrawn
Withdrawn
A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: GENERIC SPECIFICATION FOR DISCRETE SEMICONDUCTOR DEVICES
Withdrawn date
02-06-2016
Published date
12-01-2013
Publisher
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| Committee |
SR 47E
|
| DevelopmentNote |
Also numbered as I.S. 543 (01/2002)
|
| DocumentType |
Standard
|
| PublisherName |
Cenelec Electronic Components Committee
|
| Status |
Withdrawn
|
| Standards | Relationship |
| DIN 45930-1;CECC 50000:1987-06 | Identical |
| PN T-01106 : 2003 | Identical |
| BS CECC 50000:Supplement No. 1:1983 | Identical |
| BS CECC 50000:1987 | Identical |
| DIN 45930-1;CECC 50000:1987-06 | Corresponds |
| NFC 86 010 : 86 AMD 2 89 | Identical |
| BS E9376(1976) : 1976 AMD 7597 | SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. BLANK DETAIL SPECIFICATION. VARIABLE CAPACITANCE DIODE(S) |
| BS CECC 50010(1983) : 1983 AMD 7591 | SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPEC - AMBIENT RATED THYRISTORS |
| DEFSTAN 59-61(PT4)/1(1981) : 1981 | SEMICONDUCTOR DEVICES - PART 4: TRANSISTORS, NPN TYPE |
| DEFSTAN 59-61(PT7)/1(1981) : 1981 | SEMICONDUCTOR DEVICES - PART 7: OPTOELECTRONIC DEVICES |
| BS EN 150009:1993 | Harmonized system of quality assessment for electronic components. Blank detail specification: case-rated rectifier diodes |
| BS CECC 50013(1984) : 1984 AMD 7594 | SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS BLANK DETAIL SPEC - CURRENT REGULATOR & CURRENT REFERENCE DIODES |
| BS EN 150008:1993 | Harmonized system of quality assessment for electronic components. Blank detail specification: ambient-rated rectifier diodes |
| BS EN 150012:1993 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: single gate field-effect transistors |
| BS CECC 50012(1978) : 1978 AMD 7593 | SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPEC - SINGLE GATE FIELD EFFECT TRANSISTORS |
| BS CECC50008(1992) : 1992 AMD 7698 | HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: BLANK DETAIL SPECIFICATION: AMBIENT RATED RECTIFIER DIODES |
| BS CECC50009(1992) : 1992 AMD 7699 | HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION: CASE RATED RECTIFIER DIODES |
| BS CECC17000(1992) : 1992 AMD 9626 | HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - GENERIC SPECIFICATION - SOLID STATE ALL OR NOTHING RELAYS - GENERIC DATA AND METHODS OF TEST |
| BS CECC50001(1981) : 1981 AMD 7590 | SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. BLANK DETAIL SPECIFICATION: GENERAL PURPOSE SEMICONDUCTOR DIODES |
| BS E9374(1976) : 1976 AMD 7596 | SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. BLANK DETAIL SPECIFICATION: BIPOLAR TRANSISTORS FOR SWITCHING APPLICATIONS |
| DEFSTAN 59-61(PT5)/1(1981) : 1981 | SEMICONDUCTOR DEVICES - PART 5: TRANSISTORS, PNP TYPE |
| DEFSTAN 59-61(PT1)/3(1981) : 1981 | SEMICONDUCTOR DEVICES - PART 1: GENERAL REQUIREMENTS |
| DIN EN 150010:1997-02 | BLANK DETAIL SPECIFICATION - AMBIENT-RATED THYRISTORS |
| BS EN 150015:1993 | Harmonized system of quality assessment for electronic components. Blank detail specification: unidirectional transient overvoltage suppressor diodes |
| BS CECC 50011(1983) : 1983 AMD 7592 | SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPEC - CASE RATED THYRISTORS |
| 04/30114936 DC : DRAFT JUN 2004 | EN 50439 - RAILWAY APPLICATIONS - RELIABILITY TESTS FOR HIGH POWER SEMICONDUCTORS DEVICES - PART 1: STANDARD BASE-PLATE MODULES |
| DEFSTAN 59-61(PT6)/1(1981) : 1981 | SEMICONDUCTOR DEVICES - PART 6: FIELD EFFECT TRANSISTORS |
| BS E9377(1976) : 1976 AMD 7598 | SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. BLANK DETAIL SPECIFICATION: CASE RATED BIPOLAR TRANSISTORS FOR HIGH FREQUENCY AMPLIFICATION |
| DIN EN 150008:1993-10 | BLANK DETAIL SPECIFICATION: AMBIENT-RATED RECTIFIER DIODES |
| DEFSTAN 59-61(PT3)/2(1981) : 1981 | SEMICONDUCTOR DEVICES - PART 3: THYRISTORS |
| EN 150012 : 1991 | Blank Detail Specification: Single gate field-effect transistors |
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