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  • 04/30114936 DC : DRAFT JUN 2004

    Withdrawn A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

    EN 50439 - RAILWAY APPLICATIONS - RELIABILITY TESTS FOR HIGH POWER SEMICONDUCTORS DEVICES - PART 1: STANDARD BASE-PLATE MODULES

    Available format(s): 

    Withdrawn date:  22-07-2013

    Language(s): 

    Published date:  23-11-2012

    Publisher:  British Standards Institution

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    Comment Closes On
    Committee GEL/9/2
    Document Type Draft
    Publisher British Standards Institution
    Status Withdrawn

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60747-7:2010 Semiconductor devices - Discrete devices - Part 7: Bipolar transistors
    IEC 61287-1:2014 Railway applications - Power converters installed on board rolling stock - Part 1: Characteristics and test methods
    IEC TS 61287-2:2001 Power convertors installed on board railway rolling stock - Part 2: Additional technical information
    IEC 61373:2010 Railway applications - Rolling stock equipment - Shock and vibration tests
    EN 50207:2000 Railway applications - Electronic power converters for rolling stock
    EN 61373:2010/AC:2017-09 RAILWAY APPLICATIONS - ROLLING STOCK EQUIPMENT - SHOCK AND VIBRATION TESTS (IEC 61373:2010)
    EN 45545-1 : 2013 COR 2013 RAILWAY APPLICATIONS - FIRE PROTECTION ON RAILWAY VEHICLES - PART 1: GENERAL
    EN 60749-34:2010 Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
    IEC 60747-9:2007 Semiconductor devices - Discrete devices - Part 9: Insulated-gate bipolar transistors (IGBTs)
    HD 323.2.3 : 200S2 BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST CA - DAMP HEAT, STEADY STATE
    EN 50125-1:2014 Railway applications - Environmental conditions for equipment - Part 1: Rolling stock and on-board equipment
    IEC 60068-2-3:1969 Basic environmental testing procedures - Part 2-3: Tests - Test Ca: Damp heat, steady state
    IEC 60747-8:2010 Semiconductor devices - Discrete devices - Part 8: Field-effect transistors
    CECC 50000 : 86 AMD 3 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: GENERIC SPECIFICATION FOR DISCRETE SEMICONDUCTOR DEVICES
    IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General
    IEC 60749-34:2010 Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
    EN 60068-2-6:2008 Environmental testing - Part 2-6: Tests - Test Fc: Vibration (sinusoidal)
    IEC 60747-6:2016 Semiconductor devices - Part 6: Discrete devices - Thyristors
    EN 60747-15:2012 Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices
    IEC 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature
    EN 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature
    EN 50126 : 1999 RAILWAY APPLICATIONS - THE SPECIFICATION AND DEMONSTRATION OF RELIABILITY, AVAILABILITY, MAINTAINABILITY AND SAFETY (RAMS)
    IEC 60747-2:2016 Semiconductor devices - Part 2: Discrete devices - Rectifier diodes
    IEC 60747-15:2010 Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices
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