CEI EN 60444-8 : 2004
Current
The latest, up-to-date edition.
MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 8: TEST FIXTURE FOR SURFACE MOUNTED QUARTZ CRYSTAL UNITS
Hardcopy , PDF
English
01-01-2004
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FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Specifications
4 Leadless surface mounted quartz crystal units
5 Specifications of measurement method, test fixture
6 Calibration
Bibliography
Annex ZA (normative) - Normative references
to international publications with their
corresponding European publications
Defines test fixtures suitable for leadless surface mounted quartz crystal units in enclosures as defined in IEC 61837 (all parts).
| Committee |
CT 309
|
| DevelopmentNote |
Classificazione CEI 309-1011. (08/2015) 1ED 2004 Edition is valid until 19-01-2020. (01/2018)
|
| DocumentType |
Standard
|
| Pages |
18
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Current
|
| Standards | Relationship |
| EN 60444-8:2017 | Identical |
| IEC 60444-8:2016 | Identical |
| IEC 60444-5:1995 | Measurement of quartz crystal units parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction |
| EN 60444-5:1997 | Measurement of quartz crystal unit parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction |
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