CEI EN 60512-6-2 : 2003
Current
The latest, up-to-date edition.
CONNECTORS FOR ELECTRONIC EQUIPMENT - TESTS AND MEASUREMENTS - PART 6-2: DYNAMIC STRESS TESTS TEST 6B: BUMP
Hardcopy , PDF
English - Italian
01-01-2003
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FOREWORD
1. GENERAL
2. PREPARATION OF THE SPECIMEN
3. TEST METHOD
4. MEASUREMENTS
5. DETAILS TO BE SPECIFIED
ANNEX ZA - NORMATIVE REFERENCES TO
INTERNATIONAL PUBLICATIONS WITH
THEIR CORRESPONDING EUROPEAN
PUBLICATIONS
Describes the detail specification, is used for testing electromechanical components within the scope of IEC technical committee 48.
| Committee |
CT 48
|
| DevelopmentNote |
Classificazione CEI 48-95 (07/2003)
|
| DocumentType |
Standard
|
| Pages |
12
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Current
|
| Standards | Relationship |
| EN 60512-6-2:2002 | Identical |
| IEC 60512-6-2:2002 | Identical |
| IEC 60512-7:1993 | Electromechanical components for electronic equipment; basic testing procedures and measuring methods - Part 7: Mechanical operating tests and sealing tests |
| IEC 60512-2-5:2003 | Connectors for electronic equipment - Tests and measurements - Part 2-5: Electrical continuity and contact resistance tests - Test 2e: Contact disturbance |
| IEC 60512-1-1:2002 | Connectors for electronic equipment - Tests and measurements - Part 1-1: General examination - Test 1a: Visual examination |
| IEC 60512-2-1:2002 | Connectors for electronic equipment - Tests and measurements - Part 2-1: Electrical continuity and contact resistance tests - Test 2a: Contact resistance - Millivolt level method |
| EN 60068-2-29:1993 | Environmental testing - Part 2: Tests - Test Eb and guidance: Bump |
| IEC 60068-2-29:1987 | Environmental testing. Part 2: Tests. Test Eb and guidance: Bump |
| EN 60512-1-1:2002 | Connectors for electronic equipment - Tests and measurements - Part 1-1: General examination - Test 1a: Visual examination |
| EN 60512-2-1:2002 | Connectors for electronic equipment - Tests and measurements - Part 2-1: Electrical continuity and contact resistance tests - Test 2a: Contact resistance - Millivolt level method |
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