CEI EN 60512-6-3 : 2003
Current
The latest, up-to-date edition.
CONNECTORS FOR ELECTRONIC EQUIPMENT - TESTS AND MEASUREMENT - PART 6-3: DYNAMIC STRESS TESTS TEST 6C: SHOCK
Hardcopy , PDF
English - Italian
01-01-2003
FOREWORD
1. GENERAL
2. PREPARATION OF THE SPECIMEN
3. TEST METHOD
4. MEASUREMENTS
5. DETAILS TO BE SPECIFIED
ANNEX ZA - NORMATIVE REFERENCES
TO INTERNATIONAL PUBLICATIONS
WITH THEIR CORRESPONDING
EUROPEAN PUBLICATIONS
Describes the detail specification, is used for testing electromechanical components within the scope of IEC technical committee 48.
Committee |
CT 48
|
DevelopmentNote |
Classificazione CEI 48-97 (07/2003)
|
DocumentType |
Standard
|
Pages |
12
|
PublisherName |
Comitato Elettrotecnico Italiano
|
Status |
Current
|
Standards | Relationship |
IEC 60512-6-3:2002 | Identical |
EN 60512-6-3:2002 | Identical |
IEC 60068-2-27:2008 | Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock |
IEC 60512-7:1993 | Electromechanical components for electronic equipment; basic testing procedures and measuring methods - Part 7: Mechanical operating tests and sealing tests |
IEC 60512-2-5:2003 | Connectors for electronic equipment - Tests and measurements - Part 2-5: Electrical continuity and contact resistance tests - Test 2e: Contact disturbance |
EN 60068-2-27:2009 | Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock |
IEC 60512-1-1:2002 | Connectors for electronic equipment - Tests and measurements - Part 1-1: General examination - Test 1a: Visual examination |
IEC 60512-2-1:2002 | Connectors for electronic equipment - Tests and measurements - Part 2-1: Electrical continuity and contact resistance tests - Test 2a: Contact resistance - Millivolt level method |
EN 60512-1-1:2002 | Connectors for electronic equipment - Tests and measurements - Part 1-1: General examination - Test 1a: Visual examination |
EN 60512-2-1:2002 | Connectors for electronic equipment - Tests and measurements - Part 2-1: Electrical continuity and contact resistance tests - Test 2a: Contact resistance - Millivolt level method |
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