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CEI EN 60749-13 : 2004

Current

Current

The latest, up-to-date edition.

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 13: SALT ATMOSPHERE

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2004

€15.88
Excluding VAT

Foreword
1 Scope
2 Normative references
3 Test apparatus
4 Procedure
5 Summary
Annex ZA (normative) - Normative
         references to international
         publications with their
         corresponding European
         publications

Describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion.

Committee
CT 309
DevelopmentNote
Classificazione CEI 47-23 (04/2004) Supersedes CEI EN 60749. (05/2008)
DocumentType
Standard
Pages
12
PublisherName
Comitato Elettrotecnico Italiano
Status
Current
Supersedes

Standards Relationship
IEC 60749-13:2002 Identical
EN 60749-13:2002 Identical

IEC 60068-2-11:1981 Basic environmental testing procedures - Part 2-11: Tests - Test Ka: Salt mist
EN 60068-2-11:1999 Environmental testing - Part 2: Tests - Test Ka: Salt mist
IEC 60749-14:2003 Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity)

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