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SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 40: BOARD LEVEL DROP TEST METHOD USING A STRAIN GAUGE
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Available format(s): Hardcopy, PDF
Language(s): English
Published date: 01-01-2012
Publisher: Comitato Elettrotecnico Italiano
FOREWORD1 Scope2 Normative references3 Terms and definitions4 Test equipment5 Test procedure6 Test method7 SummaryAnnex A (normative) - Drop impact test method using test rodAnnex B (informative) - An example of strain gauge attachment procedure
Defines intended to evaluate and compare drop performance of a surface mount semiconductor device for handheld electronic product applications in an accelerated test environment, where excessive flexure of a circuit board causes product failure.
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