CEI EN 62433-3 : 1ED 2017
Current
The latest, up-to-date edition.
EMC IC MODELLING - PART 3: MODELS OF INTEGRATED CIRCUITS FOR EMI BEHAVIOURAL SIMULATION - RADIATED EMISSIONS MODELLING (ICEMRE)
14-11-2017
FOREWORD
1 Scope
2 Normative references
3 Terms, definitions, abbreviations and conventions
4 Philosophy
5 ICEM-RE macro-model description
6 REML format
7 Extraction
8 Validation
Annex A (normative) - Preliminary definitions for XML
representation
Annex B (informative) - Electromagnetic fields radiated by
an elementary electric and magnetic dipole
Annex C (informative) - Example files
Annex D (normative) - REML valid keywords and usage
Annex E (informative) - ICEM-RE extraction methods
Annex F (informative) - ICEM-RE model validation examples
Annex G (informative) - ICEM-RE macro-model usage
examples
Bibliography
Annex ZA (normative) - Normative references to international
publications with their corresponding European
publications
Specifies a method for deriving a macro-model to allow the simulation of the radiated emission levels of an Integrated Circuit (IC).
| Committee |
CT 309
|
| DevelopmentNote |
Classificazione CEI 47-144. (11/2017)
|
| DocumentType |
Standard
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Current
|
| Standards | Relationship |
| EN 62433-3:2017 | Identical |
| IEC 62433-3:2017 | Identical |
| IEC 61967-1:2002 | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions |
| IEC TS 61967-3:2014 | Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method |
| IEC 62433-2:2017 | EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE) |
| EN 61967-1:2002 | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions |
| IEC TS 62433-1:2011 | EMC IC modelling - Part 1: General modelling framework |
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