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CEI EN 62433-3 : 1ED 2017

Current

Current

The latest, up-to-date edition.

EMC IC MODELLING - PART 3: MODELS OF INTEGRATED CIRCUITS FOR EMI BEHAVIOURAL SIMULATION - RADIATED EMISSIONS MODELLING (ICEMRE)

Published date

14-11-2017

FOREWORD
1 Scope
2 Normative references
3 Terms, definitions, abbreviations and conventions
4 Philosophy
5 ICEM-RE macro-model description
6 REML format
7 Extraction
8 Validation
Annex A (normative) - Preliminary definitions for XML
        representation
Annex B (informative) - Electromagnetic fields radiated by
        an elementary electric and magnetic dipole
Annex C (informative) - Example files
Annex D (normative) - REML valid keywords and usage
Annex E (informative) - ICEM-RE extraction methods
Annex F (informative) - ICEM-RE model validation examples
Annex G (informative) - ICEM-RE macro-model usage
        examples
Bibliography
Annex ZA (normative) - Normative references to international
         publications with their corresponding European
         publications

Specifies a method for deriving a macro-model to allow the simulation of the radiated emission levels of an Integrated Circuit (IC).

Committee
CT 309
DevelopmentNote
Classificazione CEI 47-144. (11/2017)
DocumentType
Standard
PublisherName
Comitato Elettrotecnico Italiano
Status
Current

Standards Relationship
EN 62433-3:2017 Identical
IEC 62433-3:2017 Identical

IEC 61967-1:2002 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions
IEC TS 61967-3:2014 Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method
IEC 62433-2:2017 EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)
EN 61967-1:2002 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions
IEC TS 62433-1:2011 EMC IC modelling - Part 1: General modelling framework

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