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CEI EN 62433-4 : 1ED 2017

Current

Current

The latest, up-to-date edition.

EMC IC MODELLING - PART 4: MODELS OF INTEGRATED CIRCUITS FOR RF IMMUNITY BEHAVIOURAL SIMULATION - CONDUCTED IMMUNITY MODELLING (ICIM-CI)

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-03-2017

€185.00
Excluding VAT
Summarise this standard

FOREWORD
1 Scope
2 Normative references
3 Terms, definitions, abbreviations and conventions
4 Philosophy
5 ICIM-CI model description
6 CIML format
7 Extraction
8 Validation of ICIM-CI hypotheses
9 Model usage
Annex A (normative) - Preliminary definitions for XML
        representation
Annex B (informative) - ICIM-CI example with disturbance
        load
Annex C (informative) - Conversions between parameter types
Annex D (informative) - Example of ICIM-CI macro-model
        in CIML format
Annex E (normative) - CIML Valid keywords and usage
Annex F (informative) - PDN impedance measurement methods
        using vector network analyzer
Annex G (informative) - RFIP measurement method description
Annex H (informative) - Immunity simulation with ICIM model
        based on pass/fail test
Annex I (informative) - Immunity simulation with ICIM model
        based on non pass/fail test
Bibliography
Annex ZA (normative) - Normative references to international
         publications with their corresponding European
         publications

Defines a flow for deriving a macro-model to allow the simulation of the conducted immunity levels of an integrated circuit (IC).

Committee
CT 309
DevelopmentNote
Classificazione CEI 47-137. (07/2017)
DocumentType
Standard
ISBN
978-2-8322-3417-4
Pages
116
PublisherName
Comitato Elettrotecnico Italiano
Status
Current

Standards Relationship
IEC 62433-4:2016 Identical
EN 62433-4:2016 Identical

€185.00
Excluding VAT