CEI EN IEC 63041-1:2022
Current
Current
The latest, up-to-date edition.
Piezoelectric sensors Part 1: Generic specifications
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
01-07-2022
Publisher
€86.00
Excluding VAT
This part of IEC 63041 applies to piezoelectric sensors of resonator, delay-line and nonacoustic types, which are used in physical and engineering sciences, chemistry and biochemistry, medical and environmental sciences, etc.
| Committee |
CT 309
|
| DocumentType |
Standard
|
| ISBN |
978-2-8322-1023-7
|
| Pages |
40
|
| ProductNote |
This standard also refers to IEC 61760, IEC 61837, ISO 80000,
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| IEC 63041-1:2021 | Identical |
| EN IEC 63041-1:2021 | Identical |
| IEC 63041-2:2017 | Piezoelectric sensors - Part 2: Chemical and biochemical sensors |
| IEC 60679-1:1980 | Quartz crystal controlled oscillators. Part 1: General information, test conditions and methods |
| IEC 60444-5:1995 | Measurement of quartz crystal units parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction |
| IEC 60444-11:2010 | Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency f<sub>L</sub> and the effective load capacitance C<sub>Leff</sub> using automatic network analyzer techniques and error correction |
| IEC 62276:2016 | Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods |
| IEC 61019-1:2004 | Surface acoustic wave (SAW) resonators - Part 1: Generic specification |
| IEC 61760-1:1998 | Surface mounting technology - Part 1: Standard method for the specification of surface mounting components (SMDs) |
| IEC 60862-1:2015 | Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification |
| IEC 61240:2016 | Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules |
| IEC 60758:2016 | Synthetic quartz crystal - Specifications and guidelines for use |
| IEC 60122-1:1962 | Quartz crystal units for oscillators - Section 1: Standard values and conditions - Section 2: Test conditions |
| IEC 60068:1954 | Basic climatic and mechanical robustness testing procedure for components |
| IEC 60689:2008 | Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values |
| IEC 60642:1979 | Piezoelectric ceramic resonators and resonator units for frequency control and selection - Chapter I: Standard values and conditions - Chapter II: Measuring and test conditions |
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