IEC 63041-2:2017
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Piezoelectric sensors - Part 2: Chemical and biochemical sensors |
12/30258507 DC : 0
|
BS EN 62575-1 - RADIO FREQUENCY (RF) BUK ACOUSTIC WAVE (BAW) FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
09/30207175 DC : 0
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BS EN 62276 - SINGLE CRYSTAL WAFERS FOR SURFACE ACOUSTIC WAVE (SAW) DEVICE APPLICATIONS - SPECIFICATIONS AND MEASURING METHOD |
BS EN 62575-1:2016
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Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality Generic specification |
02/203601 DC : DRAFT MAR 2002
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IEC 60862-3. ED.2 - PIEZOELECTRIC AND DIELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION. SURFACE ACOUSTIC WAVE (SAW) FILTERS OF ASSESSED QUALITY - PART 3: STANDARD OUTLINES |
DD IEC/TS 61994-2:2011
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Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection. Glossary Piezoelectric and dielectric filters |
PD IEC/PAS 62276:2002
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Single crystal wafers applied for surface acoustic wave device. Specification and measuring method |
I.S. EN 61837-3:2015
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SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 3: METAL ENCLOSURES |
CEI EN 62604-2 : 2012
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SURFACE ACOUSTIC WAVE (SAW) AND BULK ACOUSTIC WAVE (BAW) DUPLEXERS OF ASSESSED QUALITY - PART 2: GUIDELINES FOR THE USE |
NF EN 62604-2 : 2013
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SURFACE ACOUSTIC WAVE (SAW) AND BULK ACOUSTIC WAVE (BAW) DUPLEXERS OF ASSESSED QUALITY - PART 2: GUIDELINES FOR THE USE |
EN IEC 62604-2:2018
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Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use |
I.S. EN IEC 63041-1:2018
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PIEZOELECTRIC SENSORS - PART 1: GENERIC SPECIFICATIONS |
EN IEC 63041-1:2018
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Piezoelectric sensors - Part 1: Generic specifications |
I.S. EN 62575-1:2016
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RADIO FREQUENCY (RF) BULK ACOUSTIC WAVE (BAW) FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
EN 61837-2:2011/A1:2014
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SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 2: CERAMIC ENCLOSURES (IEC 61837-2:2011/A1:2014) |
EN 60862-2:2012
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Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use |
EN 61837-3:2015
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Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures |
EN 62604-1:2015
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Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification |
EN 62761:2014
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Guidelines for the measurement method of nonlinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF) |
15/30318551 DC : 0
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BS EN 62276 ED. 3.0 - SINGLE CRYSTAL WAFERS FOR SURFACE ACOUSTIC WAVE (SAW) DEVICE APPLICATION - SPECIFICATIONS AND MEASURING METHODS |
BS EN 60862-2:2012
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Surface acoustic wave (SAW) filters of assessed quality Guidelines for the use |
08/30192315 DC : 0
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BS EN 62604-2 - SURFACE ACOUSTIC WAVE (SAW) AND BULK ACOUSTIC WAVE (BAW) DUPLEXERS - PART 2: GUIDE TO THE USE |
I.S. EN 62575-2:2012
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RADIO FREQUENCY (RF) BULK ACOUSTIC WAVE (BAW) FILTERS OF ASSESSED QUALITY - PART 2: GUIDELINES FOR THE USE (IEC 62575-2:2012 (EQV)) |
BS EN 62047-7:2011
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SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 7: MEMS BAW FILTER AND DUPLEXER FOR RADIO FREQUENCY CONTROL AND SELECTION |
I.S. EN 62604-2:2012
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SURFACE ACOUSTIC WAVE (SAW) AND BULK ACOUSTIC WAVE (BAW) DUPLEXERS OF ASSESSED QUALITY - PART 2: GUIDELINES FOR THE USE (IEC 62604-2:2011 (EQV)) |
IEC TS 61994-2:2011
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Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 2: Piezoelectric and dielectric filters |
IEC 62604-2:2017
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Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use |
IEC 61837-3:2015
|
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures |
IEC 62276:2016
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Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods |
IEC 62575-2:2012
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Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 2: Guidelines for the use |
03/108069 DC : DRAFT MAY 2003
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IEC 62276 ED.1 - SINGLE CRYSTAL WAFERS APPLIED FOR SURFACE ACOUSTIC WAVE DEVICE - SPECIFICATION AND MEASURING METHOD |
12/30252220 DC : DRAFT MAR 2012
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BS EN 62604-1 - SURFACE ACOUSTIC WAVE (SAW) AND BULK ACOUSTIC WAVE (BAW) DUPLEXERS - PART 1: GENERIC SPECIFICATION |
13/30278807 DC : 0
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BS EN 61837-3 - SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTI0N - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 3: METAL ENCLOSURE |
BS EN 62761:2014
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Guidelines for the measurement method of nonlinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF) |
BS EN 60862-3:2003
|
Surface acoustic wave (SAW) filters of assessed quality Standard outlines |
I.S. EN 62604-1:2015
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SURFACE ACOUSTIC WAVE (SAW) AND BULK ACOUSTIC WAVE (BAW) DUPLEXERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
I.S. EN IEC 63041-2:2018
|
PIEZOELECTRIC SENSORS - PART 2: CHEMICAL AND BIOCHEMICAL SENSORS |
IEC 63041-1:2017
|
Piezoelectric sensors - Part 1: Generic specifications |
I.S. EN 60862-3:2003
|
SURFACE ACOUSTIC WAVE (SAW) FILTERS OF ASSESSED QUALITY - PART 3: STANDARD OUTLINES |
IEC 62575-1:2015
|
Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 1: Generic specification |
I.S. EN 62047-7:2011
|
SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 7: MEMS BAW FILTER AND DUPLEXER FOR RADIO FREQUENCY CONTROL AND SELECTION |
BS EN 62604-1:2015
|
Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality Generic specification |
BS EN 62575-2:2012
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Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality Guidelines for the use |
I.S. EN 61837-2:2011
|
SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 2: CERAMIC ENCLOSURES |
IEC PAS 62276:2001
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Single crystal wafers applied for surface acoustic wave device - Specification and measuring method |
09/30200793 DC : 0
|
BS EN 61994-2 ED.2 - PIEZOELECTRIC AND DIELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - GLOSSARY - PART 2: PIEZOELECTRIC AND DIELECTRIC FILTERS |
BS EN 62276:2016
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Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods |
I.S. EN 62761:2014
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GUIDELINES FOR THE MEASUREMENT METHOD OF NONLINEARITY FOR SURFACE ACOUSTIC WAVE (SAW) AND BULK ACOUSTIC WAVE (BAW) DEVICES IN RADIO FREQUENCY (RF) |
I.S. EN IEC 62604-2:2018
|
SURFACE ACOUSTIC WAVE (SAW) AND BULK ACOUSTIC WAVE (BAW) DUPLEXERS OF ASSESSED QUALITY - PART 2: GUIDELINES FOR THE USE |
BS EN 61837-3:2015
|
Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections Metal enclosures |
EN IEC 63041-2:2018
|
Piezoelectric Sensors - Part 2: Chemical and Biochemical Sensors |
I.S. EN 62276:2016
|
SINGLE CRYSTAL WAFERS FOR SURFACE ACOUSTIC WAVE (SAW) DEVICE APPLICATIONS - SPECIFICATIONS AND MEASURING METHODS |
IEC 62604-1:2015
|
Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification |
IEC 62761:2014
|
Guidelines for the measurement method of nonlinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF) |
IEC 60862-2:2012
|
Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use |
IEC 62047-7:2011
|
Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection |
EN 60862-3:2003
|
Surface acoustic wave (SAW) filters of assessed quality - Part 3: Standard outlines |
EN 62276:2016
|
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods |
09/30200395 DC : 0
|
BS EN 61837-2 ED. 2 - SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 2: CERAMIC ENCLOSURES |
18/30366383 DC : DRAFT APR 2018
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BS EN 63155 - GUIDELINES FOR THE MEASUREMENT METHOD OF POWER DURABILITY FOR SURFACE ACOUSTIC WAVE (SAW) AND BULK ACOUSTIC WAVE (BAW) DEVICES IN RADIO FREQUENCY (RF) APPLICATIONS |
CEI EN 62575-2 : 2013
|
RADIO FREQUENCY (RF) BULK ACOUSTIC WAVE (BAW) FILTERS OF ASSESSED QUALITY - PART 2: GUIDELINES FOR THE USE |
I.S. EN 60862-2:2012
|
SURFACE ACOUSTIC WAVE (SAW) FILTERS OF ASSESSED QUALITY - PART 2: GUIDELINES FOR THE USE (IEC 60862-2:2012 (EQV)) |
BS EN 62604-2:2012
|
Surface Acoustic Wave (SAW) and Bulk Acoustic Wave (BAW) duplexers of assessed quality Guidelines for the use |
CEI EN 62047-7 : 2012
|
SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 7: MEMS BAW FILTER AND DUPLEXER FOR RADIO FREQUENCY CONTROL AND SELECTION |
BS EN 61837-2 : 2011
|
SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 2: CERAMIC ENCLOSURES |
IEC 60862-3:2003
|
Surface acoustic wave (SAW) filters of assessed quality - Part 3: Standard outlines |
EN 62575-2:2012
|
Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 2: Guidelines for the use |
EN 62047-7 : 2011
|
SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 7: MEMS BAW FILTER AND DUPLEXER FOR RADIO FREQUENCY CONTROL AND SELECTION |
EN 62575-1:2016
|
Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 1: Generic specification |