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  • DIN EN 60749-28 : 2018

    Current The latest, up-to-date edition.

    SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 28: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING - CHARGED DEVICE MODEL (CDM) - DEVICE LEVEL (IEC 60749-28:2017)

    Available format(s):  Hardcopy

    Language(s):  German

    Published date:  01-02-2018

    Publisher:  Verband Deutscher Elektrotechniker

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    Document Type Standard
    Publisher Verband Deutscher Elektrotechniker
    Status Current
    Supersedes
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