• EN 60749-28 : 2017

    Current The latest, up-to-date edition.

    SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 28: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING - CHARGED DEVICE MODEL (CDM) - DEVICE LEVEL

    Available format(s): 

    Language(s): 

    Published date:  30-06-2017

    Publisher:  European Committee for Standards - Electrical

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    INTRODUCTION
    1 Scope
    2 Normative references
    3 Terms and definitions
    4 Required equipment
    5 Periodic tester qualification, waveform records, and
      waveform verification requirements
    6 CDM ESD testing requirements and procedures
    7 CDM classification criteria
    Annex A (normative) - Verification module (metal disc)
            specifications and cleaning guidelines for verification
            modules and testers
    Annex B (normative) - Capacitance measurement of verification
            modules (metal discs) sitting on a tester field plate
            dielectric
    Annex C (informative) - CDM test hardware and metrology
            improvements
    Annex D (informative) - CDM tester electrical schematic
    Annex E (informative) - Sample oscilloscope setup and waveform
    Annex F (informative) - Field-induced CDM tester discharge
            procedures
    Annex G (informative) - Waveform verification procedures
    Annex H (informative) - Determining the appropriate charge delay
            for full charging of a large module or device
    Annex I (informative) - Electrostatic discharge (ESD) sensitivity
            testing direct contact charged device model (DC-CDM)
    Bibliography

    Abstract - (Show below) - (Hide below)

    IEC 60749-28:2017(E) establishes the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined field-induced charged device model (CDM) electrostatic discharge (ESD).

    General Product Information - (Show below) - (Hide below)

    Committee SR 47
    Document Type Test Method
    Publisher European Committee for Standards - Electrical
    Status Current

    Standards Referenced By This Book - (Show below) - (Hide below)

    BS EN 62575-1:2016 Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality Generic specification
    BS EN 60749-43:2017 Semiconductor devices - Mechanical and climatic test methods Guidelines for IC reliability qualification plans
    I.S. EN 60749-43:2017 SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 43: GUIDELINES FOR IC RELIABILITY QUALIFICATION PLANS
    CEI EN 60749-43 : 1ED 2018 SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 43: GUIDELINES FOR IC RELIABILITY QUALIFICATION PLANS
    EN 60749-43 : 2017 SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 43: GUIDELINES FOR IC RELIABILITY QUALIFICATION PLANS (IEC 60749-43:2017)
    I.S. EN 62575-1:2016 RADIO FREQUENCY (RF) BULK ACOUSTIC WAVE (BAW) FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
    EN 62575-1 : 2016 RADIO FREQUENCY (RF) BULK ACOUSTIC WAVE (BAW) FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION (IEC 62575-1:2015)

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60749-26:2013 Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
    EN 60749-26:2014 SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 26: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING - HUMAN BODY MODEL (HBM) (IEC 60749-26:2013)
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