IEC 60749-28:2017

FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Required equipment
5 Periodic tester qualification, waveform records,
  and waveform verification requirements
6 CDM ESD testing requirements and procedures
7 CDM classification criteria
Annex A (normative) - Verification module (metal
        disc) specifications and cleaning guidelines for
        verification modules and testers
Annex B (normative) - Capacitance measurement
        of verification modules (metal discs) sitting on
        a tester field plate dielectric
Annex C (informative) - CDM test hardware and
        metrology improvements
Annex D (informative) - CDM tester electrical
        schematic
Annex E (informative) - Sample oscilloscope setup
        and waveform
Annex F (informative) - Field-induced CDM tester
        discharge procedures
Annex G (informative) - Waveform verification
        procedures
Annex H (informative) - Determining the appropriate
        charge delay for full charging of a large module
        or device
Annex I (informative) - Electrostatic discharge (ESD)
        sensitivity testing direct contact charged device
        model (DC-CDM)
Bibliography

IEC 60749-28:2017(E) establishes the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined field-induced charged device model (CDM) electrostatic discharge (ESD). All packaged semiconductor devices, thin film circuits, surface acoustic wave (SAW) devices, opto-electronic devices, hybrid integrated circuits (HICs), and multi-chip modules (MCMs) containing any of these devices are to be evaluated according to this document. To perform the tests, the devices are assembled into a package similar to that expected in the final application. This CDM document does not apply to socketed discharge model testers. This document describes the field-induced (FI) method. An alternative, the direct contact (DC) method, is described in Annex I.
The purpose of this document is to establish a test method that will replicate CDM failures and provide reliable, repeatable CDM ESD test results from tester to tester, regardless of device type. Repeatable data will allow accurate classifications and comparisons of CDM ESD sensitivity levels.