DIN EN 60749-32:2011-01
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 32: FLAMMABILITY OF PLASTIC-ENCAPSULATED DEVICES (EXTERNALLY INDUCED)
Hardcopy , PDF
German
01-01-2011
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Foreword
INTRODUCTION
1 Scope and object
2 Normative references
3 Test procedure
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications
Applique aux dispositifs semiconducteurs (les dispositifs discrets et Circuits intégrés.) Il décide si le dispositif S'enflamme suite au chauffage externe.
| DevelopmentNote |
Supersedes DIN EN 60749. (06/2005)
|
| DocumentType |
Standard
|
| Pages |
8
|
| PublisherName |
German Institute for Standardisation (Deutsches Institut für Normung)
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| IEC 60749-32:2002+AMD1:2010 CSV | Identical |
| I.S. EN 60749-32:2003 | Identical |
| UNE-EN 60749-32:2004 | Identical |
| EN 60749-32:2003/A1:2010 | Identical |
| NF EN 60749-32 : 2003 AMD 1 2011 | Identical |
| BS EN 60749-32 : 2003 | Identical |
| NBN EN 60749-32 : 2004 AMD 1 2010 | Identical |
| SN EN 60749-32 : 2003 | Identical |
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