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DIN EN 60749-33:2004-09

Current

Current

The latest, up-to-date edition.

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 33: ACCELERATED MOISTURE RESISTANCE - UNBIASED AUTOCLAVE

Available format(s)

Hardcopy , PDF

Language(s)

German

Published date

01-01-2004

FOREWORD
1 Scope and object
2 Normative references
3 Test apparatus
4 General requirements
5 Test conditions
6 Procedure
7 Failure criteria
8 Safety
9 Summary
Annex ZA (normative) Normative references to international
         publications with their corresponding European
         Publications

Evaluates the moisture resistance integrity of non-hermetically packaged solid-state devices using moisture condensing or moisture saturated steam environments.

DevelopmentNote
Supersedes DIN IEC 60749-33. (09/2004)
DocumentType
Standard
Pages
10
PublisherName
German Institute for Standardisation (Deutsches Institut für Normung)
Status
Current
Supersedes

Standards Relationship
EN 60749-33:2004 Identical
UNE-EN 60749-33:2005 Identical
NBN EN 60749-33 : 2005 Identical
I.S. EN 60749-33:2004 Identical
NF EN 60749-33 : 2005 Identical
BS EN 60749-33:2004 Identical
IEC 60749-33:2004 Identical

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