Customer Support: +353 (0)1 857 6730

Corporate Website About Us
  • There are no items in your cart
Please enter a keyword to search
Advanced search
Home
AFNOR
NF EN 60749-33 : 2005

NF EN 60749-33 : 2005

Current

Current

The latest, up-to-date edition.

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 33: ACCELERATED MOISTURE RESISTANCE - UNBIASED AUTOCLAVE

Published date

12-01-2013

Publisher

Association Francaise de Normalisation

FOREWORD
1 Scope and object
2 Normative references
3 Test apparatus
4 General requirements
5 Test conditions
6 Procedure
7 Failure criteria
8 Safety
9 Summary
Annex ZA (normative) Normative references to international
         publications with their corresponding European
         Publications

Evaluates the moisture resistance integrity of non-hermetically packaged solid-state devices using moisture condensing or moisture saturated steam environments.

DevelopmentNote
Indice de classement: C96-022-33 (12/2005)
DocumentType
Standard
PublisherName
Association Francaise de Normalisation
Status
Current

Standards Relationship
DIN EN 60749-33:2004-09 Identical
BS EN 60749-33:2004 Identical
UNE-EN 60749-33:2005 Identical
IEC 60749-33:2004 Identical
EN 60749-33:2004 Identical
I.S. EN 60749-33:2004 Identical

NF EN 60749-30 : 2005 AMD 1 2011 SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 30: PRECONDITIONING OF NON-HERMETIC SURFACE MOUNT DEVICES PRIOR TO RELIABILITY TESTING

View more information
Sorry this product is not available in your region.

Access your standards online with a subscription

Features

  • Simple online access to standards, technical information and regulations.

  • Critical updates of standards and customisable alerts and notifications.

  • Multi-user online standards collection: secure, flexible and cost effective.

Get in touch with us