• BS EN 60749-33:2004

    Current The latest, up-to-date edition.

    Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased autoclave

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date:  22-06-2004

    Publisher:  British Standards Institution

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    1 Scope and object
    2 Normative references
    3 Test apparatus
    4 General requirements
    5 Test conditions
    6 Procedure
    7 Failure criteria
    8 Safety
    9 Summary
    Annex ZA (normative) Normative references to international
             publications with their corresponding European
             Publications

    Abstract - (Show below) - (Hide below)

    Evaluates the moisture resistance integrity of non-hermetically packaged solid-state devices using moisture condensing or moisture saturated steam environments.

    Scope - (Show below) - (Hide below)

    The unbiased autoclave test is performed to evaluate the moisture resistance integrity of non-hermetically packaged solid-state devices using moisture condensing or moisture saturated steam environments. It is a highly accelerated test which employs conditions of pressure, humidity and temperature under condensing conditions to accelerate moisture penetration through the external protective material or along the interface between the external protective material and the metallic conductors passing through it.

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    Committee EPL/47
    Development Note Supersedes 02/206197 DC. (10/2004)
    Document Type Standard
    Publisher British Standards Institution
    Status Current
    Supersedes

    Standards Referencing This Book - (Show below) - (Hide below)

    EN 60749-24:2004 Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST
    IEC 60749-24:2004 Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST
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