DIN EN 60749-36:2003-12
Current
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 36: ACCELERATION, STEADY STATE
Available format(s)
Hardcopy , PDF
Language(s)
German
Published date
01-01-2003
€41.78
Excluding VAT
Foreword
1 Scope
2 Normative references
3 Test apparatus
4 Procedure
5 Summary
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications
Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices.
| DevelopmentNote |
Supersedes DIN EN 60749. (06/2005)
|
| DocumentType |
Standard
|
| Pages |
7
|
| PublisherName |
German Institute for Standardisation (Deutsches Institut für Normung)
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| NBN EN 60749-36 : 2004 | Identical |
| BS EN 60749-36:2003 | Identical |
| EN 60749-36:2003 | Identical |
| I.S. EN 60749-36:2003 | Identical |
| NF EN 60749-36 : 2003 | Identical |
| IEC 60749-36:2003 | Identical |
| UNE-EN 60749-36:2004 | Identical |
Summarise
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