DIN EN 60749-36:2003-12
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 36: ACCELERATION, STEADY STATE
Hardcopy , PDF
German
01-01-2003
Important note : Users cannot be edited or removed once added to your Multi user PDF.
Foreword
1 Scope
2 Normative references
3 Test apparatus
4 Procedure
5 Summary
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications
Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices.
| DevelopmentNote |
Supersedes DIN EN 60749. (06/2005)
|
| DocumentType |
Standard
|
| Pages |
7
|
| PublisherName |
German Institute for Standardisation (Deutsches Institut für Normung)
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| NBN EN 60749-36 : 2004 | Identical |
| BS EN 60749-36:2003 | Identical |
| EN 60749-36:2003 | Identical |
| UNE-EN 60749-36:2004 | Identical |
| SN EN 60749-36 : 2003 | Identical |
| I.S. EN 60749-36:2003 | Identical |
| NF EN 60749-36 : 2003 | Identical |
| IEC 60749-36:2003 | Identical |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.