DIN EN 61967-6:2008-10
Current
The latest, up-to-date edition.
INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 6: MEASUREMENT OF CONDUCTED EMISSIONS - MAGNETIC PROBE METHOD
Hardcopy , PDF
01-01-2008
1 Scope
2 Normative references
3 Definitions
4 General
4.1 Measurement philosophy
4.2 Measurement principle
5 Test conditions
5.1 General
5.2 Frequency range
6 Test equipment
6.1 General
6.2 Magnetic probe
6.3 Probe spacing fixture and placement
7 Test set-up
7.1 General
7.2 Probe calibration
7.3 Modifications to standardized IC test board
7.3.1 Layer arrangement
7.3.2 Layer thickness
7.3.3 Decoupling capacitors
7.3.4 I/O pin loading
8 Test procedure
8.1 General
8.2 Test technique
9 Test report
9.1 General
9.2 Documentation
Annex A (normative) Probe calibration procedure -
Microstrip line method
Annex B (informative) Measurement principle and
calibration factor
Annex C (informative) Spatial resolution of magnetic
probe
Annex D (informative) Angle pattern of probe placement
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications
Bibliography
Dieser Teil von IEC 61967 legt ein Verfahren zur Bestimmung von Hochfrequenz-Strömen an den Anschlusspins einer integrierten Schaltung (IC) durch berührungslose Strommessung mit einer Miniaturmagnetsonde fest. Mit diesem Verfahren können von einem IC erzeugte HF-Ströme in einem Frequenzbereich von 0,15 MHz bis 1000 MHz gemessen werden.
DevelopmentNote |
Supersedes DIN IEC 61967-6. (10/2008)
|
DocumentType |
Standard
|
Pages |
49
|
PublisherName |
German Institute for Standardisation (Deutsches Institut für Normung)
|
Status |
Current
|
Standards | Relationship |
BS EN 61967-6 : 2002 | Identical |
NF EN 61967-6 : 2003 AMD 1 2008 | Identical |
IEC 61967-6:2002+AMD1:2008 CSV | Identical |
I.S. EN 61967-6:2003 | Identical |
EN 61967-6:2002/A1:2008 | Identical |
NBN EN 61967-6 : 2002 AMD 1 2008 | Identical |
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