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DIN EN 61967-6:2008-10

Current

Current

The latest, up-to-date edition.

INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 6: MEASUREMENT OF CONDUCTED EMISSIONS - MAGNETIC PROBE METHOD

Available format(s)

Hardcopy , PDF

Published date

01-01-2008

€115.33
Excluding VAT

1 Scope
2 Normative references
3 Definitions
4 General
  4.1 Measurement philosophy
  4.2 Measurement principle
5 Test conditions
  5.1 General
  5.2 Frequency range
6 Test equipment
  6.1 General
  6.2 Magnetic probe
  6.3 Probe spacing fixture and placement
7 Test set-up
  7.1 General
  7.2 Probe calibration
  7.3 Modifications to standardized IC test board
      7.3.1 Layer arrangement
      7.3.2 Layer thickness
      7.3.3 Decoupling capacitors
      7.3.4 I/O pin loading
8 Test procedure
  8.1 General
  8.2 Test technique
9 Test report
  9.1 General
  9.2 Documentation
Annex A (normative) Probe calibration procedure -
        Microstrip line method
Annex B (informative) Measurement principle and
        calibration factor
Annex C (informative) Spatial resolution of magnetic
        probe
Annex D (informative) Angle pattern of probe placement
Annex ZA (normative) Normative references to international
         publications with their corresponding European
         publications
Bibliography

Dieser Teil von IEC 61967 legt ein Verfahren zur Bestimmung von Hochfrequenz-Strömen an den Anschlusspins einer integrierten Schaltung (IC) durch berührungslose Strommessung mit einer Miniaturmagnetsonde fest. Mit diesem Verfahren können von einem IC erzeugte HF-Ströme in einem Frequenzbereich von 0,15 MHz bis 1000 MHz gemessen werden.

DevelopmentNote
Supersedes DIN IEC 61967-6. (10/2008)
DocumentType
Standard
Pages
49
PublisherName
German Institute for Standardisation (Deutsches Institut für Normung)
Status
Current

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