Skip to content
Please enter a keyword to search

  • EN 61967-6:2002/A1:2008

    Current The latest, up-to-date edition.

    INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 6: MEASUREMENT OF CONDUCTED EMISSIONS - MAGNETIC PROBE METHOD

    Available format(s): 

    Language(s): 

    Published date:  14-05-2008

    Publisher:  European Committee for Standards - Electrical

    Pure ENs are not available for sale, please purchase a suitable national adoption

    Sorry this product is not available in your region.

    Add To Cart

    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    1 Scope
    2 Normative references
    3 Definitions
    4 General
      4.1 Measurement philosophy
      4.2 Measurement principle
    5 Test conditions
      5.1 General
      5.2 Frequency range
    6 Test equipment
      6.1 General
      6.2 Magnetic probe
      6.3 Probe spacing fixture and placement
    7 Test set-up
      7.1 General
      7.2 Probe calibration
      7.3 Modifications to standardized IC test board
          7.3.1 Layer arrangement
          7.3.2 Layer thickness
          7.3.3 Decoupling capacitors
          7.3.4 I/O pin loading
    8 Test procedure
      8.1 General
      8.2 Test technique
    9 Test report
      9.1 General
      9.2 Documentation
    Annex A (normative) Probe calibration procedure -
            Microstrip line method
    Annex B (informative) Measurement principle and
            calibration factor
    Annex C (informative) Spatial resolution of magnetic
            probe
    Annex D (informative) Angle pattern of probe placement
    Annex E (informative) Advanced magnetic probe
    Annex ZA (normative) Normative references to international
             publications with their corresponding European
             publications
    Bibliography

    Abstract - (Show below) - (Hide below)

    Gives a method for evaluating RF currents on the pins of an integrated circuit (IC) by means on non-contact current measurement using a miniature magnetic probe.

    General Product Information - (Show below) - (Hide below)

    Committee SR 47A
    Development Note To be read in conjunction with EN 61967-1 (05/2003)
    Document Type Standard
    Publisher European Committee for Standards - Electrical
    Status Current
    Supersedes

    Standards Referenced By This Book - (Show below) - (Hide below)

    EN IEC 62969-1:2018 Semiconductor devices - Semiconductor interface for automotive vehicles - Part 1: General requirements of power interface for automotive vehicle sensors

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 61967-1:2002 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions
    EN 61967-1:2002 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions
    EN 61967-4 : 2002 COR 2017 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 4: MEASUREMENT OF CONDUCTED EMISSIONS - 1 OHM/150 OHM DIRECT COUPLING METHOD (IEC 61967-4:2002/COR1:2017)
    IEC 61967-4:2002+AMD1:2006 CSV Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method
    View more information

    • Access your standards online with a subscription

      Features

      • Simple online access to standards, technical information and regulations
      • Critical updates of standards and customisable alerts and notifications
      • Multi - user online standards collection: secure, flexibile and cost effective