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DIN EN 62047-10:2012-03

Current

Current

The latest, up-to-date edition.

SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 10: MICRO-PILLAR COMPRESSION TEST FOR MEMS MATERIALS (IEC 62047-10:2011)

Available format(s)

Hardcopy , PDF

Language(s)

German

Published date

01-01-2012

DevelopmentNote
Supersedes DIN IEC 62047-10. (03/2012)
DocumentType
Standard
Pages
13
PublisherName
German Institute for Standardisation (Deutsches Institut für Normung)
Status
Current
Supersedes

Standards Relationship
EN 62047-10 : 2011 Identical
IEC 62047-10:2011 Identical

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