DS EN 60749-37 : 2008

Superseded

Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View superseded by

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 37: BOARD LEVEL DROP TEST METHOD USING AN ACCELEROMETER

Available format(s):

Superseded date: 30-11-2022

Language(s):

Published date: 12-01-2013

Publisher: Danish Standards

Abstract - (Show below) - (Hide below)

Specifies a test method that is intended to evaluate and compare drop performance of surface mount electronic components for handheld electronic product applications in an accelerated test environment, where excessive flexure of a circuit board causes product failure.

General Product Information - (Show below) - (Hide below)

Document Type	Standard
ISBN
Pages
Published
Publisher	Danish Standards
Status	Superseded
Superseded By	DS/EN IEC 60749-37:2022

International Equivalents – Equivalent Standard(s) & Relationship - (Show below) - (Hide below)

Equivalent Standard(s)	Relationship
IEC 60749-37:2008	Identical
EN 60749-37:2008	Identical

Categories associated with this Standard - (Show below) - (Hide below)

Sub-Categories associated with this Standard - (Show below) - (Hide below)

Sorry this product is not available in your region.

Add To Cart