• There are no items in your cart

DSCC V62/22614:2022

Current

Current

The latest, up-to-date edition.

MICROCIRCUIT, DIGITAL-LINEAR, 12-BIT ANALOG MONITORING AND CONTROL SOLUTION WITH MULTICHANNEL ADC, DACs. AND TEMPERATURE SENSORS, MONOLITHIC SILICON

Published date

21-12-2022

Sorry this product is not available in your region.

This drawing documents the general requirements of a high performance 12 bit analog monitoring and control solution with multichannel analog to digital converter (ADC), digital to analog converters (DACs), and temperature sensor microcircuit, with an operating temperature range of -55°C to +125°C.

DocumentType
Standard
ProductNote
This standard also refers to JEDEC PUB 95.
PublisherName
Defense Supply Centre Columbus
Status
Current

JEDEC JEP157A:2022 RECOMMENDED ESD-CDM TARGET LEVELS
JEDEC JESD 22-C101F : 2013 Field-Induced Charged-Device Model Test Method for Electrostatic-Discharge-Withstand Thresholds of Microelectronic Components
ASTM F 1192 : 2011 Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
ANSI/ESDA/JEDEC JS-001:2017 ESDA/JEDEC Joint Standard for Electrostatic Discharge Sensitivity Testing - Human Body Model (HBM) - Component Level<br>
JEDEC JEP 155B:2018 RECOMMENDED ESD TARGET LEVELS FOR HBM/MM QUALIFICATION
JEDEC JESD 57A:2017 TEST PROCEDURE FOR THE MANAGEMENT OF SINGLE-EVENT EFFECTS IN SEMICONDUCTOR DEVICES FROM HEAVY ION IRRADIATION:

Access your standards online with a subscription

Features

  • Simple online access to standards, technical information and regulations.

  • Critical updates of standards and customisable alerts and notifications.

  • Multi-user online standards collection: secure, flexible and cost effective.