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ECMA/TR 93 : 1ED 2007

Current

Current

The latest, up-to-date edition.

MEASURING EMISSIONS FROM MODULES

Published date

12-01-2013

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1 Scope
2 References
3 Definitions and abbreviations
  3.1 Definitions
      3.1.1 Magnetic probe
      3.1.2 Module
  3.2 Abbreviations
4 Measuring facility
  4.1 Shielded room
  4.2 Fixture for magnetic probe
  4.3 Measuring instruments
      4.3.1 Measuring receiver
      4.3.2 Spectrum analyzer
      4.3.3 Magnetic probe
  4.4 Test board
5 Measuring Method
  5.1 Temperature
  5.2 Power supply
  5.3 Positioning of MUT and magnetic probe
      5.3.1 Positioning of MUT
      5.3.2 Space and positioning of magnetic probe
  5.4 Measurement procedure
  5.5 Reporting measurement results
6 Method for calibrating the magnetic probe
  6.1 Application
  6.2 Measuring instruments used for calibrating the
      magnetic probe
      6.2.1 Preamplifier
      6.2.2 Micro-strip line
      6.2.3 Other measuring instruments
  6.3 Calibration procedures
Annex A - Conditions for measuring emissions from the Module
          Under Test
  A.1 Test board
      A.1.1 Layer placement
      A.1.2 Decoupling capacitor
      A.1.3 Other components
      A.1.4 Measuring circuit
  A.2 Integrated memory
      A.2.1 Placement of MUT
      A.2.2 Operating conditions
  A.3 Integrated disk unit
      A.3.1 Placement of MUT
      A.3.2 Operating conditions
  A.4 Interface board
      A.4.1 Placement of MUT
      A.4.2 Operating conditions
Annex B - Current measurements with a magnetic probe
Annex C - Influence of magnetic-probe placement on measured
          values

Provides guidelines for measuring electromagnetic emissions from modules, in view of assessing the impact of such modules on emissions from products, which may incorporate them.

DocumentType
Technical Report
PublisherName
European Computer Manufacturers Association
Status
Current

IEC 61967-1:2002 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions
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IEC 61967-6:2002+AMD1:2008 CSV Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method

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