EN 170000:1999
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
Generic Specification: Waveguide type dielectric resonators
01-01-2005
13-09-1999
1 General
1.1 Scope
1.2 Normative references
1.3 Units, symbols and terminology
1.4 Preferred ratings and characteristics
1.5 Marking
1.6 Order of precedence
2 Quality assessment procedures
2.1 General
2.2 Primary stage of manufacture
2.3 Structurally similar components
2.4 Sub-contracting
2.5 Manufacturer's approval
2.6 Approval procedures
2.7 Procedures for capability approval
2.8 Procedures for qualification approval
2.9 Test procedures
2.10 Screening requirements
2.11 Repair work
2.12 Certified test records
2.13 Validity of release
2.14 Release for delivery
2.15 Unchecked parameters
3 Test and measurement procedures
3.1 General
3.2 Test and measurement conditions
3.3 Visual inspection
3.4 Dimension and gauging procedure
3.5 Electrical test procedures
3.5.1 General
3.5.2 Transmission characteristics of
TE01delta and TEM mode band-pass
type resonators
3.5.3 Transmission characteristics of
TE01delta mode band-stop resonator
3.5.4 Dielectric characteristics measurement
3.6 Mechanical and environmental test procedures
3.6.1 Storage
3.6.2 High temperature ageing
3.6.3 Robustness of terminations
3.6.4 Soldering
3.6.5 Rapid change of temperature
3.6.6 Bump
3.6.7 Vibration
3.6.8 Shock
3.6.9 Acceleration, steady rate
3.6.10 Climatic test
3.6.11 Dry heat
3.6.12 Damp heat, cyclic
3.6.13 Cold
3.6.14 Damp heat, steady state
3.6.15 Low air pressure
Applicable to waveguide type dielectric resonators of assessed quality using capability approval or qualification approval methods. Supplies the test and measurement methods which may be selected for use in detail specification for such resonators.
Committee |
CLC/SR 49
|
DocumentType |
Standard
|
PublisherName |
European Committee for Standards - Electrical
|
Status |
Superseded
|
SupersededBy |
Standards | Relationship |
NEN EN 170000 : 1999 | Identical |
BS EN 170000:1999 | Identical |
DIN EN 170000:2000-04 | Identical |
SN EN 170000 : 1999 | Identical |
PNE-prEN 170000 | Identical |
UNE-EN 170000:1999 | Identical |
BS EN 170100:2001 | Harmonized system of quality assessment for electronic components. Sectional specification: Waveguide type dielectric resonators |
UNE-EN 62625-2:2017 | Electronic railway equipment - On board driving data recording system - Part 2: Conformity testing |
EN 170100:2001 | Sectional Specification: Waveguide type dielectric resonators |
CECC 00114-3 : 94 AMD 2 | CAPABILITY APPROVAL OF AN ELECTRONIC COMPONENT MANUFACTURING ACTIVITY |
CECC 00109 : 1974 | CECC RULES OF PROCEDURE: RP 9: CERTIFIED TESTS RECORDS |
HD 323.2.20 : 200S3 | BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST T - SOLDERING |
CECC 00111 PT3 : 1991 AMD 4 | CENELEC ELECTRONIC COMPONENTS COMMITTEE - RULE OF PROCEDURE 11 - SPECIFICATIONS - PART 3: REGULATIONS CECC SPECIFICATIONS FOR COMPONENTS GENERAL AND PROFESSIONAL (CIVIL AND MILITARY) USAGE (EXCLUDING DETAIL SPECIFICATIONS) |
HD 323.2.13 : 200S1 | BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST M: LOW AIR PRESSURE |
EN 60068-2-1:2007 | Environmental testing - Part 2-1: Tests - Test A: Cold |
EN 60068-2-2:2007 | Environmental testing - Part 2-2: Tests - Test B: Dry heat |
EN 60068-1:2014 | Environmental testing - Part 1: General and guidance |
HD 323.2.14 : 200S2 | BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST N: OF TEMPERATURE |
EN 60068-2-7:1993 | Environmental testing - Part 2: Tests - Test Ga: Acceleration, steady state |
IEC 60027-1:1992 | Letters symbols to be used in electrical technology - Part 1: General |
HD 323.2.30 : 200S3 | BASIC ENVIRONMENTAL TESTING PROCEDURES - PART 2: TESTS - TEST DB AND GUIDANCE: DAMP HEAT, CYCLIC (12 + 12-HOUR CYCLE) |
EN 60068-2-27:2009 | Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock |
HD 323.2.3 : 200S2 | BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST CA - DAMP HEAT, STEADY STATE |
EN 100114-1 : 1996 | RULE OF PROCEDURE - QUALITY ASSESSMENT PROCEDURES - PART 1: CECC REQUIREMENTS FOR THE APPROVAL OF AN ORGANIZATION |
CECC 00114-2 : 1994 | RULE OF PROCEDURE 14 - QUALITY ASSESSMENT PROCEDURES - PART 2: QUALIFICATION APPROVAL OF ELECTRONIC COMPONENTS |
EN 60068-2-21:2006 | Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices |
EN 60068-2-29:1993 | Environmental testing - Part 2: Tests - Test Eb and guidance: Bump |
EN 60068-2-6:2008 | Environmental testing - Part 2-6: Tests - Test Fc: Vibration (sinusoidal) |
HD 323.2.58 : 200S1 | TEST TD: SOLDERABILITY, RESISTANCE TO DISSOLUTION OF METALIZATION AND TO SOLDERING HEAT OF SURFACE MOUNTING DEVICES (SMD) |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.